171827 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits
On-chip samplers for asynchronously triggered events
#302Dynamically tracking data values in a configurable IC
#303DEBUG CIRCUIT
#304Device and method for testing motherboard
#305DEBUG CIRCUIT
#306Method and system for debug and test using replicated logic
#307Methods and apparatus for monitoring internal signals in an integrated circuit
#308Debug circuit and a method of debugging
#309Wireless-interface module and electronic apparatus
#310On-chip service processor
#311Communication of a diagnostic signal and a functional signal by an integrated circuit
#312FPGA and method and system for configuring and debugging a FPGA
#313Wireless remote firmware debugging for embedded wireless device
#314Second state machine active in first state machine SHIFT-DR state
#315On-chip storage of hardware events for debugging
#316JTAG circuit transferring data between devices on TCK terminals
#317Integrated Circuit with Debug Support Interface
#318Method for managing operability of on-chip debug capability
#319Test access control for plural processors of an integrated circuit
#320Split clock scan flip-flop
#321Method for detecting a malfunction in a state machine
#322Method and system for debugging using replicated logic and trigger logic
#323Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
#324Emulation export sequence with distributed control
#325Address range comparator for detection of multi-size memory accesses with data matching qualification and full or partial overlap
#326System and method for testing and debugging analog circuits in a memory controller
#327Product framework for manufacturing testing environment
#328Framework that maximizes the usage of testhead resources in in-circuit test system
#329Debug system for data tracking
#330System and method for evaluating an expression in a debugger
#331Method and apparatus for processor emulation
#332Receiving control, data, and control segments of communication scan packets
#333Real-time monitoring, alignment, and translation of CPU stalls or events
#334Method and system for debug and test using replicated logic
#335Data processing condition detector with table lookup
#336Encrypted JTAG interface
#337Memory self-test via a ring bus in a data processing apparatus
#338Provision of debug via a separate ring bus in a data processing apparatus
#339Debug and test system with format select register circuitry
#340Method and system for debugging an electronic system
#341Multiple device scan chain emulation/debugging
#342Synchronizing on-chip data processor trace and timing information for export
#343Method and system for debugging using replicated logic and trigger logic
#344Target system, debugging system, integrated circuit device, microcomputer and electronic apparatus
#345On-chip electronic hardware debug support units having execution halting capabilities
#346Sequential signals selecting mode and stopping transfers of interface adaptor
#347Addressable tap domain selection circuit with TDI/TDO external terminal
#348Method and system of using a single EJTAG interface for multiple tap controllers
#349Accepting link ID upon supplied and sampled bits matching
#350Adapter implemented background data transfers while tap in non-scan state
#351Entering command based on number of states in advanced mode
#352Zero-bit scans defining command window and control level
#353Debugging apparatus
#354JTAG interface device of mobile terminal and method thereof
#355On-chip service processor
#356Wireless remote firmware debugging for embedded wireless device
#357Method for document page delivery to a mobile communication device
#358Methods and apparatus for monitoring internal signals in an integrated circuit
#359Repeatability over communication links
#360Customizable event creation logic for hardware monitoring
#361Methods for debugging scan testing failures of integrated circuits
#362Design instrumentation circuitry
#363JTAG circuit transferring data between devices on TMS terminals
#364Microcomputer And Method For Debugging Microcomputer
#365System and method for debugging system-on-chips using single or n-cycle stepping
#366Microcomputer, a method for protecting memory and a method for performing debugging
#367Apparatus and method for performing poll commands using JTAG scans
#368Testing of reconfigurable logic and interconnect sources
#369Debug circuit
#370Functional failure analysis techniques for programmable integrated circuits
#371Method and user interface for debugging an electronic system
#372Debug and trace circuit in lockstep architectures, associated method, processing system, and apparatus
#373System-on-chip having secure debug mode
#374Debug mechanisms for a processor circuit
#375Dynamic debugging of circuits
#376Electronic device including integrated circuit with debug capabilities
#377Detection of runtime failures in a system on chip using debug circuitry
#378Circuit for and method of providing a programmable connector of an integrated circuit device
#379Multiple reset types in a system
#380Sharing a JTAG interface among multiple partitions
#381Sharing a JTAG interface among multiple partitions
#382Boundary scan receiver
#383Processing of a circuit design for debugging
#384Circuits for and methods of implementing a design for testing and debugging with dual-edge clocking
#385Serializer/deserializer and method for transferring data between an integrated circuit and a test interface
#386System and method for providing a test result from an integrated to an analyzer
#387Partial reconfiguration and in-system debugging
#388System and methods for debug connectivity discovery