171837 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Input or output aspects Testing of input or output with loop-back
PROBE CARD FOR LOOPBACK TEST, PROBE HEAD THEREOF, PROBE SYSTEM, TESTING METHOD AND TESTED DEVICE
#2EXPERIMENT-IN-THE-LOOP SYSTEM FOR FAST AND EFFECTIVE TUNING OF ACTIVE VIBRATION CONTROLLERS
#3COMPONENT DIE VALIDATION BUILT-IN SELF-TEST (VBIST) ENGINE
#4Systems, methods, and storage media for detecting a security intrusion of a network device
#5Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback
#6Component die validation built-in self-test (VBIST) engine
#7Built-in self-test for die-to-die physical interfaces
#8LOW OVERHEAD LOOP BACK TEST FOR HIGH SPEED TRANSMITTER
#9Systems, methods, and storage media for detecting a security intrusion of a network device
#10Stacked Integrated Circuit Device
#11FUNCTIONAL SAFETY MECHANISMS FOR INPUT/OUTPUT (IO) CELLS
#12Spectral leakage-based loopback method for predicting performance of mixed-signal circuit, and system therefor
#13Built-in self-test for die-to-die physical interfaces
#14Automated test equipment comprising a device under test loopback and an automated test system with an automated test equipment comprising a device under test loopback
#15Systems, methods, and storage media for detecting a security intrusion of a network device
#16Test system, electronic device and loopback testing method
#17Flexible test systems and methods
#18Asynchronous circuits and test methods
#19Enhanced loopback diagnostic systems and methods
#20Testing device and testing method
#21Apparatus having on-chip fail safe logic for I/O signal in high integrity functional safety applications
#22Device, method and system of error detection and correction in multiple devices
#23Circuit testing system and circuit testing method
#24Asynchronous circuits and test methods
#25Systems, methods, and storage media for detecting a security intrusion of a network device
#26Method and apparatus for testing a multi-die integrated circuit device
#27PHYSICAL LAYER DEVICE AND METHOD FOR PERFORMING PHYSICAL LAYER OPERATIONS IN A COMMUNICATIONS NETWORK
#28Memory loopback systems and methods
#29Semiconductor memory device
#30Semiconductor memory device including a shift register
#31Method for identifying a fault at a device output and system therefor
#32Method for identifying a fault at a device output and system therefor
#33Semiconductor memory device
#34Memory loopback systems and methods
#35Non-destructive recirculation test support for integrated circuits
#36Systems and methods for wafer-level loopback test
#37Apparatus having on-chip fail safe logic for I/O signal in high integrity functional safety applications
#38Transmitter, integrated circuit, detection section and method for testing integrated circuit
#39Backplane testing system
#40Probe module supporting loopback test
#41Method and apparatus for evaluating and optimizing a signaling system
#42Parallel test device and method
#43Interface chip and built-in self-test method therefor
#44Backplane testing system
#45Integrated circuit and storage device including integrated circuit
#46RF testing system using integrated circuit
#47Integrated circuit and method of operating an integrated circuit
#48Testing device comprising circuitry to calculate a correction value for calibrating channel loss
#49Systems and methods for wafer-level loopback test
#50On-chip stimulus generation for test and calibration of NFC reader receivers
#51Waveform calibration using built in self test mechanism
#52Method and apparatus for evaluating and optimizing a signaling system
#53Parallel test device and method
#54Analog block and test blocks for testing thereof
#55Test circuit providing different levels of concurrency among radio cores
#56Input/output delay testing for devices utilizing on-chip delay generation
#57Method, system and apparatus for evaluation of input/output buffer circuitry
#58Circuit test system electric element memory control chip under different test modes
#59Noise rejection for built-in self-test with loopback
#60Current tests for I/O interface connectors
#61Layer 2 and 3 latching loopbacks on a pluggable transceiver
#62Physical layer loopback
#63Loopback testing with phase alignment of a sampling clock at a test receiver apparatus
#64Built-in self-test methods, circuits and apparatus for concurrent test of RF modules with a dynamically configurable test structure
#65Systems and methods for precise timing measurements using high-speed deserializers
#66Built in self test for transceiver
#67Method and apparatus for evaluating and optimizing a signaling system
#68Testing of high-speed input-output devices
#69Memory controller with loopback test interface
#70Test circuit of an integrated circuit on a wafer
#71Data recirculation in configured scan paths
#72INTEGRATED CIRCUIT AND TEST METHOD THEREFOR
#73Physical layer loopback
#74Blanking primitives masking circuit
#75Measuring apparatus, parallel measuring apparatus, testing apparatus and electronic device
#76Integrated systems testing
#77Method and system for testing chips
#78Voltage margin test device
#79Memory controller with loopback test interface
#80Test system and test method of semiconductor integrated circuit
#81Double data rate memory physical interface high speed testing using self checking loopback
#82Method and apparatus for evaluating and optimizing a signaling system
#83Cancellation of crosstalk energy in communication loops
#84Fault injection
#85Method and apparatus of testing die to die interconnection for system in package
#86Test apparatus and recording medium
#87Semiconductor device and method of testing the same
#88Redundant acknowledgment in loopback entry
#89ELECTRONIC DEVICE AND TEST METHOD OF ELECTRONIC DEVICE
#90Integrated circuit with inter-symbol interference self-testing
#91TEST PATTERN CUSTOMIZATION OF HIGH SPEED SAS NETWORKS IN A MANUFACTURING TEST SYSTEM
#92Semiconductor device and method for testing the same
#93Self-test method for interface circuit
#94Method and system for yield enhancement
#95Loop-back testing method and apparatus for IC
#96Method and system for testing devices using loop-back pseudo random data
#97Loopback configuration for bi-directional interfaces
#98System for terminating high speed input/output buffers in an automatic test equipment environment to enable external loopback testing
#99Memory controller with loopback test interface
#100Phase lock loop semiconductor device
#101Method for performing a logic built-in-self-test in an electronic circuit
#102Transmitter/receiver device that converts serial and parallel signals and method of testing thereof
#103Semiconductor device
#104Parameterized Signal Conditioning
#105SELF-TEST STRUCTURE AND METHOD OF TESTING A DIGITAL INTERFACE
#106System and related method for chip I/O test
#107Method and system for testing chips
#108Chip testing device and system
#109Semiconductor integrated circuit and testing method
#110Physical layer loopback
#111Integrated systems testing
#112Redundant acknowledgment in loopback entry
#113AMPLIFIER SYSTEM WITH CURRENT-MODE SERVO FEEDBACK
#114Circuit for testing the AC timing of an external input/output terminal of a semiconductor integrated circuit
#115Interface test circuit
#116Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test
#117Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit
#118Providing precise timing control between multiple standardized test instrumentation chassis
#119METHOD AND APPARATUS FOR EVALUATING AND OPTIMIZING A SIGNALING SYSTEM
#120Systems and methods for measuring signal propagation delay between circuits
#121Internal analog loopback for a high-speed interface test
#122Semiconductor integrated circuit apparatus and interface test method
#123Method and apparatus for evaluating and optimizing a signaling system
#124Integrated systems testing
#125Testing circuit and related method of injecting a time jitter
#126High speed transmission system
#127Techniques for generating test patterns in high speed memory devices
#128Providing precise timing control within a standardized test instrumentation chassis
#129Electronic circuit, system with an electronic circuit and method for testing an electronic circuit
#130Integrated systems testing
#131Integrated systems testing
#132Integrated systems testing
#133Integrated systems testing
#134Cancellation of crosstalk energy in communication loops
#135Selective test point for high speed SERDES cores in semiconductor design
#136Semiconductor device with test circuit and test method of the same
#137Semiconductor integrated circuit and test method for the same
#138Test apparatus and test method for testing a device under test
#139Serializer deserializer (SERDES) testing
#140Method for testing the sensitive input range of Byzantine filters
#141Enhanced loopback testing of serial devices
#142Through-core self-test with multiple loopbacks
#143Method and an apparatus for testing transmitter and receiver
#144Self verifying communications testing
#145Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
#146Method, system, and apparatus for loopback entry and exit
#147Leakage testing for differential signal transceiver
#148Apparatus and method for testing motherboard having PCI express devices
#149Digital frequency synthesis clocked circuits
#150Apparatus for providing a high frequency loop back with a DC path for a parametric test
#151Determination of worst case voltage in a power supply loop
#152Semiconductor integrated circuit and method for testing the same
#153Test switching circuit for a high speed data interface
#154Electromagnetic interface module for balanced data communication
#155Programmable measurement mode for a serial point to point link
#156Method and an apparatus for testing transmitter and receiver
#157Test apparatus and testing method
#158Amplifier system with current-mode servo feedback
#159Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits
#160Method of testing phase lock loop status during a Serializer/Deserializer internal loopback built-in self-test
#161Automated test of receiver sensitivity and receiver jitter tolerance of an integrated circuit
#162Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element
#163Programmable built-in self-test circuit for serializer/deserializer circuits and method
#164Semiconductor integrated circuit device and method of testing the same