171838 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Input or output aspects Interconnect testing
APPARATUS, SYSTEM, AND METHOD OF SYSTEM ON CHIP (SOC) FUNCTIONAL SAFETY (FUSA)
#2CHIPLET, CHIP, AND CHIP DEBUGGING METHOD
#3CIRCUIT AND METHOD FOR INTERCONNECT TEST
#4Monitoring and Control of Advance Die-to-Die Interconnect Lanes
#5FLEXIBLE PATTERN TESTING FOR D2D LINK PATHS
#6SEMICONDUCTOR DEVICE AND METHOD OF FAILURE ANALYSIS FOR SEMICONDUCTOR DEVICE
#7SAMPLER CIRCUIT CALIBRATION
#8CHIP INSPECTION DEVICE AND CHIP INSPECTION METHOD
#9DIE-TO-DIE AND CHIP-TO-CHIP INTERCONNECT CLOCK SKEW COMPENSATION
#10Chip Self-Repair for Interconnect Short Faults
#11ARRAY OF UNIT CELLS HAVING PAD STRUCTURES
#12INTEGRATED CIRCUIT TESTING
#13TEST AND REPAIR OF INTERCONNECTS BETWEEN CHIPS
#14Array of unit cells having pad structures
#15SEMICONDUCTOR DEVICE AND METHOD OF FAILURE ANALYSIS FOR SEMICONDUCTOR DEVICE
#16Board adapter device, test method, system, apparatus, and device, and storage medium
#17Memory device, memory system including the same and methods of operation
#18Semiconductor device having micro-bumps and test method thereof
#19Stacked semiconductor device and test method thereof
#20Side-channel signature based PCB authentication using JTAG architecture and a challenge-response mechanism
#21Plurality of edge through-silicon vias and related systems, methods, and devices
#22SEMICONDUCTOR WAFER
#23Thermal abnormality detection system and method
#24Monitoring accesses to a region of an integrated circuit chip
#25High density routing for heterogeneous package integration
#26Failure detection for wire bonding in semiconductors
#27Identifying lane errors using a pseudo-random binary sequence
#28Technique for determining performance characteristics of electronic devices and systems
#29Method for detecting the topology of electrical wiring
#30Automatic device detection and connection verification
#31Inspection circuit, semiconductor storage element, semiconductor device, and connection inspection method
#32Method for testing inter-layer connections
#33TEST DEVICE
#34Method for testing through silicon vias in 3D integrated circuits
#35High speed interconnect circuit test method and apparatus
#36Method and apparatus for evaluating and optimizing a signaling system
#37Method and apparatus for interconnect test
#38Method for determining a condition of pin connection of the integrated circuit and integrated circuit thereof
#39Through-substrate via (TSV) testing
#40Method and apparatus for evaluating and optimizing a signaling system
#41Semiconductor device
#42Test circuit and method for semiconductor device
#43Method and circuit of pulse-vanishing test
#44Method and apparatus for interconnect test
#45Method of testing a semiconductor structure
#46Technique for determining performance characteristics of electronic devices and systems
#47Circuit test system electric element memory control chip under different test modes
#48Method and apparatus for testing I/O boundary scan chain for SoC's having I/O's powered off by default
#49Method and apparatus for evaluating and optimizing a signaling system
#50Through-substrate via (TSV) testing
#51Semiconductor integrated circuit with testing and repairing via
#52Method of analyzing coupling effect between signal lines in an integrated circuit
#53Testing and repairing apparatus of through silicon via in stacked-chip
#54METHOD OF INSPECTING AND MANUFACTURING A STACK CHIP PACKAGE
#55Test access architecture for TSV-based 3D stacked ICS
#56Method and architecture for pre-bond probing of TSVs in 3D stacked integrated circuits
#57Semiconductor apparatus and testing method thereof
#58Test circuit for testing through-silicon-vias in 3D integrated circuits
#59Method and apparatus for 3D IC test
#60Chip damage detection device for a semiconductor integrated circuit
#61Method and apparatus for evaluating and optimizing a signaling system
#62Method for testing a partially assembled multi-die device, integrated circuit die and multi-die device
#63Technique for determining performance characteristics of electronic devices and systems
#64Connection quality verification for integrated circuit test
#65Circuitry for built-in self-test
#66BUILT-IN SELF-TEST CIRCUITRY
#67Methods for defect testing of externally accessible integrated circuit interconnects
#68Module and electronic device
#69Instruction register delay select outputs to clock delay circuitry
#70Method and apparatus for monitoring via's in a semiconductor fab
#71Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices
#72Integrated systems testing
#73Built-in line test method
#74INTEGRATED CIRCUIT WITH TEST ARRANGEMENT, INTEGRATED CIRCUIT ARRANGEMENT AND TEXT METHOD
#75In line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same
#76Method and apparatus for testing multiple data signal transceivers substantially simultaneously with common transceiver tester
#77Method and apparatus for evaluating and optimizing a signaling system
#78Enhanced characterization of electrical connection degradation
#79System for testing connections between chips
#80Continuity testing apparatus and continuity testing method including open/short detection circuit
#81Fault injection
#82Fault testing for interconnections
#83Clock delay circuits and multiplexer connected to boundary scan circuitry
#84CIRCUIT TESTING APPARATUS AND SYSTEM
#85Method for testing a communication connection
#86Systems and methods for defect testing of externally accessible integrated circuit interconnects
#87Transmission delay analyzing apparatus, medium recording transmission delay analyzing program, and transmission delay analyzing method
#88Technique for determining performance characteristics of electronic devices and systems
#89Semiconductor integrated circuit and method for inspecting same
#90Multi-chip package semiconductor device and method of detecting a failure thereof
#91Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatus
#92Separate testing of continuity between an internal terminal in each chip and an external terminal in a stacked semiconductor device
#93System for measuring signal path resistance for an integrated circuit tester interconnect structure
#94Propagation test strobe circuitry with boundary scan circuitry
#95Interactivity with a bus interface card
#96Test method and semiconductor device
#97SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP, INTERCHIP INTERCONNECT TEST METHOD, AND INTERCHIP INTERCONNECT SWITCHING METHOD
#98Connection testing apparatus and method and chip using the same
#99Method and tester for verifying the electrical connection integrity of a component to a substrate
#100Circuit interconnect testing arrangement and approach therefor
#101Semiconductor integrated circuit
#102Techniques for detecting open integrated circuit pins
#103Defect detection system with multilevel output capability and method thereof
#104Semiconductor device
#105Method and apparatus for monitoring via's in a semiconductor fab
#106Method and circuit for stressing upper level interconnects in semiconductor devices
#107System and method for system-on-chip interconnect verification
#108Systems and methods for defect testing of externally accessible integrated circuit interconnects
#109Diagnostic operations associated with wireless modem
#110METHODS AND APPARATUS FOR TESTING A LINK BETWEEN CHIPS
#111Data generating method, connection checking system, and computer product
#112Method and system for validating PCI/PCI-X adapters
#113System and method to support use of bus spare wires in connection modules
#114Method for verifying interconnected blocks of IP
#115Electrical test method of an integrated circuit
#116Propagation test strobe circuitry with boundary scan circuitry
#117Method and arrangement to estimate transmission channel characteristics
#118Inspection method of semiconductor integrated circuit and semiconductor
#119In-line test circuit and method for determining interconnect electrical properties and integrated circuit incorporating the same
#120Integrated systems testing
#121Branch element for operation in a communication network, network and method for operating the branch element
#122Failure detection apparatus and failure detection method for a semiconductor apparatus
#123Semiconductor device and method for testing semiconductor device
#124Methods and apparatus for testing a link between chips
#125Semiconductor testing system and testing method
#126Providing precise timing control between multiple standardized test instrumentation chassis
#127METHOD AND APPARATUS FOR EVALUATING AND OPTIMIZING A SIGNALING SYSTEM
#128Fuse circuit with leakage path elimination
#129PLL with programmable jitter for loopback serdes testing and the like
#130Multi-chip package semiconductor device and method of detecting a failure thereof
#131Method and system for validating PCI/PCI-X adapters
#132Method and apparatus for evaluating and optimizing a signaling system
#133Valid-transmission verifying circuit and a semiconductor device including the same
#134Integrated systems testing
#135System for measuring signal path resistance for an integrated circuit tester interconnect structure
#136Method and apparatus for proactive fault monitoring in interconnects
#137Rapid interconnect and logic testing of FPGA device
#138System and method for system-on-chip interconnect verification
#139AC propagation testing preventing sampling test data at Capture-DR state
#140Method and apparatus for evaluating and optimizing a signaling system
#141Semiconductor integrated circuit and method for testing connection state between semiconductor integrated circuits
#142Semiconductor device and method for testing semiconductor device
#143Eclipz wiretest for differential clock/oscillator signals
#144Semiconductor device, test apparatus and measurement method therefor
#145Technique for determining performance characteristics of electronic devices and systems
#146Method and apparatus for an embedded time domain reflectometry test
#147Method and apparatus for rapid inline measurement of parameter spreads and defects in integrated circuit chips
#148Method and apparatus for manufacturing test generation
#149Defect detection using multiple sensors and parallel processing
#150Algorithm for estimation of multiple faults on a transmission line or waveguide
#151Repeatability over communication links
#152Algorithm for estimation of multiple faults on a transmission line or waveguide
#153Method and apparatus for calibrating a frequency domain reflectometer
#154Testing memory access signal connections
#155Method and apparatus for transmission line and waveguide testing
#156Systems and methods for non-intrusive testing of signals between circuits
#157Reduced complexity transmission line and waveguide fault tester
#158Systems and methods for assessing timing of PCI signals
#159Method and device for monitoring an integrated circuit
#160System for measuring signal path resistance for an integrated circuit tester interconnect structure
#161Test network for a network on a chip and a configuration network
#162Method for testing through silicon vias in 3D integrated circuits