171854 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing Soft error testing; Soft error rate evaluation; Single event testing
Error protection analysis of an integrated circuit
#2GLITCH DETECTOR WITH HIGH RELIABILITY
#3Methods and systems for single-event upset fault injection testing
#4SEMICONDUCTOR DEVICE
#5Device for determining soft error occurred in a memory having stacked layers, and computer readable medium storing program thereon for determining the soft error
#6Method, system and device to test a plurality of devices by comparing test results of test chains of the plurality of devices
#7Methods and apparatuses to detect test probe contact at external terminals
#8Method for generating redundant configuration in FPGAs
#9Soft error-resilient latch
#10Flip flop of a digital electronic chip
#11Systems and methods for analyzing failure rates due to soft/hard errors in the design of a digital electronic device
#12Soft error rate calculation device and calculation method for semiconductor large scale integration (LSI)
#13Test circuit for 3D semiconductor device and method for testing thereof
#14Method of fault tolerance in combinational circuits
#15SYSTEMS AND METHODS FOR PARTICLE DETECTION AND ERROR CORRECTION IN AN INTEGRATED CIRCUIT
#16Semiconductor test device and method, and data analysis device
#17Single event latchup (SEL) current surge mitigation
#18Embedded transient scanning systems, transient scanning data visualization systems, and/or related methods
#19Semiconductor device with upset event detection and method of making
#20On-die electric cosmic ray detector
#21Method and apparatus for power glitch detection in integrated circuits
#22Method and circuit structure for suppressing single event transients or glitches in digital electronic circuits
#23Method and apparatus for measuring alpha particle induced soft errors in semiconductor devices
#24On-die electric cosmic ray detector
#25Integrated circuit with error repair and fault tolerance
#26Integrated circuit with error repair and fault tolerance
#27Noise rejection for built-in self-test with loopback
#28Simulation apparatus and simulation method for determining soft error rates for a configured model
#29Embedded transient scanning system apparatus and methodology
#30Method for characterizing the sensitivity of electronic components to destructive mechanisms
#31Hardware execution driven application level derating calculation for soft error rate analysis
#32Method of determining the particle sensitivity of electronic components
#33Single event transient direct measurement methodology and circuit
#34Information processing apparatus, information processing system, controlling method for information processing apparatus and program
#35Wide area soft defect localization
#36Robust scan synthesis for protecting soft errors
#37Measurement device and measurement method
#38Single event transient direct measurement methodology and circuit
#39BUILT-IN SELF-TEST CIRCUIT-BASED RADIATION SENSOR, RADIATION SENSING METHOD AND INTEGRATED CIRCUIT INCORPORATING THE SAME
#40SER testing for an IC chip using hot underfill
#41RC delay detectors with high sensitivity for through substrate vias
#42System and method for detecting soft-fails
#43Systems and methods for measuring soft errors and soft error rates in an application specific integrated circuit
#44Apparatus and method for protecting soft errors
#45Robust scan synthesis for protecting soft errors
#46Integrated circuit with error repair and fault tolerance
#47Method using time to digital converter for direct measurement of set pulse widths
#48Soft error and transient error detection device and methods therefor
#49Latch circuit
#50Digital fault detection circuit and method
#51Single event upset (SEU) testing system and method
#52Error detection and location circuitry for configuration random-access memory
#53System and method for conducting accelerated soft error rate testing
#54Discrete placement of radiation sources on integrated circuit devices
#55Method and apparatus for testing a full system integrated circuit design by statistical fault injection using hardware-based simulation
#56STRESS ENGINEERING FOR SRAM STABILITY
#57Method and structures for accelerated soft-error testing
#58Programmable heavy-ion sensing device for accelerated DRAM soft error detection
#59Programmable heavy-ion sensing device for accelerated DRAM soft error detection
#60Method and apparatus for detecting and correcting soft-error upsets in latches
#61Single event upset test circuit and methodology
#62Method for soft error modeling with double current pulse
#63Logic soft error rate prediction and improvement
#64Boxes for Soft Error Rate Calculation
#65Method and system for analyzing single event upset in semiconductor devices
#66Storage system comprising logical circuit configured in accordance with information in memory on PLD
#67Method and system for correcting soft errors in memory circuit
#68Method and apparatus for providing SEU-tolerant circuits
#69System and scanout circuits with error resilience circuit
#70Error detecting circuit
#71Method for evaluating semiconductor device error and system for supporting the same
#72Dynamic resynchronization of clocked interfaces
#73Conformationally constrained backbone cyclized somatostatin analogs
#74Spatial and temporal selective laser assisted fault localization
#75Single event upset enhanced architecture
#76Memory error detection and correction circuitry