G01R31/3181 - CPC Classification Index

ClassID:

171852 ⎘

G01R31/3181 - CPC Classification

Classification description:

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits Functional testing

Sub-classes:

G01R31/31813 » {Test pattern generators} 194
G01R31/31816 » {Soft error testing; Soft error rate evaluation; Single event testing} 74
G01R31/3183 » Generation of test inputs, e.g. test vectors, patterns or sequence 161
G01R31/3185 » Reconfiguring for testing, e.g. LSSD, partitioning 46
G01R31/3187 » Built-in tests 413
G01R31/319 » Tester hardware, i.e. output processing circuit 115

Recent Application in this class:

20260140176

2026-05-21

FUNCTIONAL EVENT MANAGEMENT SYSTEM AND METHOD

20260029466

2026-01-29

LOGIC BIST CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING SAME

20250258221

2025-08-14

CO-DEBUG OF PROCESSING CONDITIONS OF LOGIC DEVICES

20250224449

2025-07-10

FUNCTIONAL SAFETY PROTECTION METHOD FOR COMPUTING CIRCUIT AND ELECTRONIC DEVICE

20240426909

2024-12-26

LOGIC BIST CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING SAME

20240235806

2024-07-11

DETECTING AND MITIGATING SIDE CHANNEL ATTACKS WITH RAZOR-FLOPS

20240137203

2024-04-25

DETECTING AND MITIGATING SIDE CHANNEL ATTACKS WITH RAZOR-FLOPS

20230266388

2023-08-24

Programmable scan chain debug technique

20230187014

2023-06-15

Simulating memory cell sensing for testing sensing circuitry

#10

20220137130

2022-05-05

Self diagnostic apparatus for electronic device

#11

20220003818

2022-01-06

CROSSTALK PATTERN DETECTING DEVICE AND DETECTING METHOD

#12

20210325444

2021-10-21

Facilitating debugging electronic device, system and method thereof

#13

20210255243

2021-08-19

Determining a voltage and/or frequency for a performance mode

#14

20210255242

2021-08-19

Failure diagnostic apparatus and failure diagnostic method

#15

20200209310

2020-07-02

Fault detection circuit for a PWM driver, related system and integrated circuit

#16

20200073786

2020-03-05

Integrated circuit device with integrated fault monitoring system

#17

20190146034

2019-05-16

Fault detection circuit for a PWM driver, related system and integrated circuit

#18

20190087260

2019-03-21

Arithmetic processing device and method therefor

#19

20190018731

2019-01-17

Integrated circuit fault detection

#20

20190018061

2019-01-17

ATE compatible high-efficient functional test

#21

20180284188

2018-10-04

Single circuit fault detection

#22

20180238964

2018-08-23

Non-destructive recirculation test support for integrated circuits

#23

20180080986

2018-03-22

Independently driving built-in self test circuitry over a range of operating conditions

#24

20170370973

2017-12-28

SENSOR MODULE

#25

20170328953

2017-11-16

Fault detection circuit for a PWM driver, related system and integrated circuit

#26

20170310541

2017-10-26

Hybrid fibre coaxial fault classification in cable network environments

#27

20170310361

2017-10-26

Radio frequency signal fault signature isolation in cable network environments

#28

20170178751

2017-06-22

Semiconductor memory device and method for detecting weak cells

#29

20170160343

2017-06-08

Systems and methods for SerDes physical layer qualification and mitigation

#30

20170108548

2017-04-20

Test device and test system having the same

#31

20170074940

2017-03-16

Light-on module testing device, method for testing light-on module and method for testing display panel

#32

20160284423

2016-09-29

Semiconductor memory apparatus

#33

20160117964

2016-04-28

Testing apparatus for electronic device

#34

20160084903

2016-03-24

Integrated circuit and method of operating an integrated circuit

#35

20160003892

2016-01-07

SYSTEM AND METHOD FOR PERFORMING PROCESSING IN A TESTING SYSTEM

#36

20150377966

2015-12-31

Monitoring circuit of semiconductor device to monitor a read-period signal during activation of a boot-up enable signal

#37

20150276873

2015-10-01

Test circuits

#38

20150276824

2015-10-01

On-chip IR drop detectors for functional and test mode scenarios, circuits, processes and systems

#39

20150198663

2015-07-16

On-the-fly test and debug logic for ATPG failures of designs using on-chip clocking

#40

20150121143

2015-04-30

Testing and mitigation framework for networked devices

#41

20150025818

2015-01-22

SYNCHRONIZED TESTING OF MULTIPLE WIRELESS DEVICES

#42

20140219413

2014-08-07

Method and evaluation device for checking plausibility of an incremental counter

#43

20140129883

2014-05-08

Hardware-based memory initialization

#44

20140089752

2014-03-27

Method, system and apparatus for evaluation of input/output buffer circuitry

#45

20140081590

2014-03-20

ELECTRONIC DEVICE AND METHOD FOR MANAGING TEST ITEMS OF AN OBJECT

#46

20130091382

2013-04-11

Modeling test space for system behavior with optional variable combinations

#47

20120265490

2012-10-18

TESTING AND MITIGATION FRAMEWORK FOR NETWORKED DEVICES

#48

20120173931

2012-07-05

Testing and mitigation framework for networked devices

#49

20120126781

2012-05-24

On-chip IR drop detectors for functional and test mode scenarios, circuits, processes and systems

#50

20120062257

2012-03-15

Semiconductor device with a test circuit and a reference circuit

#51

20100225348

2010-09-09

Method and apparatus for statistical CMOS device characterization

#52

20100194400

2010-08-05

Circuit arrangement with a test circuit and a reference circuit and corresponding method

#53

20090013230

2009-01-08

CIRCUIT ARRANGEMENT AND METHOD OF TESTING AND/OR DIAGNOSING THE SAME

#54

20080284460

2008-11-20

Method and apparatus for statistical CMOS device characterization

#55

20080157810

2008-07-03

Method for testing liquid crystal display panels

#56

20080104462

2008-05-01

Serializer/de-serializer bus controller interface

#57

20080046790

2008-02-21

Random number test circuit, random number generation circuit, semiconductor integrated circuit, IC card and information terminal device

#58