171907 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Tester hardware, i.e. output processing circuits Analysis of tester Performance; Tester characterization
SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE
#2Test time reduction in circuits with redundancy flip-flops
#3FAULT DETECTION IN PARALLEL HARDWARE
#4METHOD, CENTRAL TEST CONTROL UNIT, MEASUREMENT SYSTEM
#5SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE
#6METHOD AND APPARATUS OF ANALYZING DATA, AND STORAGE MEDIUM
#7Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test
#8AUTOMATED VERIFICATION OF INTEGRATED CIRCUITS
#9USAGE-AWARE COMPRESSION FOR STREAMING DATA FROM A TEST AND MEASUREMENT INSTRUMENT
#10Multi-rate sampling for hierarchical system analysis
#11Testing device and method
#12DIAGNOSTIC TOOL FOR TRAFFIC CAPTURE WITH KNOWN SIGNATURE DATABASE
#13Self test for safety logic
#14Methods and systems for testing a tester
#15An interferometric IQ-mixer/DAC solution for active, high speed vector network analyser impedance renormalization
#16Magnetic field sensor able to identify an error condition
#17Battery monitoring system, signal transmission method, and semiconductor device for monitoring batteries
#18Self test for safety logic
#19Test system for measuring propagation delay time of transmission line
#20Self test for safety logic
#21Built-in device testing of integrated circuits
#22Enhancing spectral purity in high-speed testing
#23Apparatus and method for measuring relative frequency response of audio device microphones
#24Determining electrical path length
#25Correction of transmission line induced phase and amplitude errors in reflectivity measurements
#26Testing system and method
#27Multi-wire electrical parameter measurements via test patterns
#28Test apparatus, test method, calibration device, and calibration method
#29Test circuit and method for processing a test routine
#30Integrated cross-tester analysis and real-time adaptive test
#31Integrated cross-tester analysis and real-time adaptive test
#32Test apparatus and recording medium
#33Automatic test equipment self test
#34Test apparatus and test method
#35Flexible interposer system
#36System and Method for Physical-Layer Testing of High-Speed Serial Links in their Mission Environments
#37Using statistical signatures for testing high-speed circuits
#38SIGNAL DETECTING APPARATUS AND SIGNAL DETECTING SYSTEM
#39Calibrating a testing device
#40Signal detecting apparatus and signal detecting system
#41Method of testing integrated circuit and apparatus therefor
#42Test device
#43Test apparatus with tester channel availability identification
#44System and method of automating the addition of programmable breakpoint hardware to design models
#45System and method for complex programmable breakpoints using a switching network
#46Test apparatus, diagnosing program and diagnosing method therefor
#47Diagnostic program, a switching program, a testing apparatus, and a diagnostic method
#48Systems and methods for identifying system links
#49Tester simulation system and tester simulation method using same
#50Tester simulation system and tester simulation method using same
#51Method and apparatus for quantifying the timing error induced by an impedance variation of a signal path
#52Method and apparatus to simulate automatic test equipment
#53Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components
#54Method and system for using statistical signatures for testing high-speed circuits
#55Eye diagram analyzer correctly samples low dv/dt voltages
#56Apparatus and method for measuring relative frequency response of audio device microphones