METHOD AND SYSTEM FOR PERFORMING TRANSFER FUNCTION MEASUREMENTS ON A DEVICE

METHOD, SYSTEM, DEVICE, AND MEDIA RELATED TO DRIFT VERIFICATION

METHODS AND APPARATUS TO GENERATE SEMICONDUCTOR PRODUCT YIELD INDICATORS

TEST CONTROL DEVICE AND OPERATING METHOD THEREOF

Functional Circuit Block Harvesting in Integrated Circuits

PLUGGABLE LOAD MODULE TO TEST A VOLTAGE REGULATOR

DATA SIMULATION APPARATUS AND DATA SIMULATION METHOD

TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN

MULTI-USER DEVELOPMENT SYSTEM FOR SYSTEM LEVEL DEVICE TESTING

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE

AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION

UNIVERSAL DETECTION DEVICE AND METHOD FOR HIGH SPEED DIGITAL INTERFACE OF INTEGRATED CIRCUIT

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND SIGNAL PROCESSING METHOD

METHOD AND SYSTEM FOR TESTING BLOCKS WITHIN DEVICE UNDER TEST (DUT) USING RECONFIGURABLE TEST LOGIC

CONFIGURABLE PIN DRIVER CIRCUIT OUTPUT IMPEDANCE BACKGROUND

METHOD AND SYSTEM FOR TRACKING AND MANAGING ACTIVITIES OF TESTBENCH COMPONENTS IN A TEST ENVIRONMENT

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITSMETHOD OF USE

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE

Random function selection and insertion during compilation for post-silicon validation

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE

AUTOMATED TEST EQUIPMENT, DEVICE UNDER TEST, TEST SETUP METHODS USING AN ACKNOWLEDGE SIGNALING

OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARALLEL INSTRUMENT CHANNELS AND MACHINE LEARNING ASSISTANCE

Controlling storage of test data based on prior test program execution

DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME

GRPC-Based Chip Test Method, GRPC-Based Chip Test Apparatus, and Storage Medium

Functional Circuit Block Harvesting in Computer Systems

METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A TESTBED TRANSPILER

Device under test simulation equipment

TUNING A DEVICE UNDER TEST USING PARALLEL PIPELINE MACHINE LEARNING ASSISTANCE

System and method of over-the-air testing of a device under test

DEVICES AND METHODS FOR TESTING OF FAR-FIELD WIRELESS CHARGING

AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION

Systems and Methods for Measurement of a Parameter of a DUT

Board adapter device, test method, system, apparatus, and device, and storage medium

Testbenches for electronic systems with automatic insertion of verification features

Software-Defined Synthesizable Testbench

Test method and apparatus of communication chip, device and medium

Compiler-based code generation for post-silicon validation

Bit error ratio estimation using machine learning

SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE

System and method of testing single DUT through multiple cores in parallel

Measurement system for identifying aggressor signals

Device under test synchronization with automated test equipment check cycle

Reformatting scan patterns in presence of hold type pipelines

Signal processing method

System and method for separation and classification of signals using cyclic loop images

SYSTEM AND METHOD FOR MULTI-LEVEL SIGNAL CYCLIC LOOP IMAGE REPRESENTATIONS FOR MEASUREMENTS AND MACHINE LEARNING

Cyclic loop image representation for waveform data

Electrical testing apparatus for spintronics devices

Test equipment diagnostics systems and methods

Vector Eyes

Chip test method, apparatus, device, and system

Trajectory-optimized test pattern generation for built-in self-test

Automated test equipment for testing one or more devices under test, method for automated testing of one or more devices under test, and computer program for handling command errors

Digital circuit robustness verification method and system

Automated test equipment for testing one or more devices under test, method for automated testing of one or more devices under test, and computer program using a buffer memory

Data channel optimization with smart black box algorithms

Automated test equipment using an on-chip-system test controller

Measurement device and method of setting a measurement device

Method and device for sending data according to a signal timing

Test system supporting reverse compliance

Test method and test system

SYSTEM AND METHODS FOR DYNAMICALLY RECONFIGURING AUTOMATIC TEST EQUIPMENT

System for testing an integrated circuit of a device and its method of use

Electrical testing apparatus for spintronics devices

Methods and systems for testing a tester

System and method for temporal signal measurement of device under test (DUT) and method of forming system

Wafer probe card integrated with a light source facing a device under test side and method of manufacturing

Device and methods for reducing peak noise and peak power consumption in semiconductor devices under test

Method and system for acquisition of test data

Test equipment for over the air tests as well as method for testing a device under test

Smart and efficient protocol logic analyzer configured within automated test equipment (ATE) hardware

Electrical testing apparatus for spintronics devices

Systems and methods for bypass testing

Method for producing a semiconductor device by means of computer-aided development of test scenarios

ATE compatible high-efficient functional test

Test and measurement device and operating method

Automatic device detection and connection verification

Testing device and testing method

Converged test platforms and processes for class and system testing of integrated circuits

Systems and methods for dynamically reconfiguring automatic test equipment

Test architecture with an FPGA based test board to simulate a DUT or end-point

Method and system for acquisition of test data

Universal automated testing of embedded systems

Automated test equipment for combined signals

Automatic test equipment (ATE) platform translation

Configuration and testing method and system for FPGA chip using bumping process

Self-contained reconfigurable personal laboratory

Test equipment, method for operating a test equipment and computer program

Test device and test system having the same

Test devices and test systems

Magnetic field programming of electronic devices on a wafer

Tester for integrated circuits on a silicon wafer and integrated circuit

Test IP-based A.T.E. instrument architecture

Controlling a test run on a device under test without directly controlling the test equipment within a vendor test platform testing the device under test

On-chip field testing methods and apparatus

Testing apparatus for electronic device

Structural testing of integrated circuits

System for testing an integrated circuit of a device and its method of use

Simultaneous transition testing of different clock domains in a digital integrated circuit

API-based pattern-controlled test on an ATE

RF probe

Integrated circuit testing interface on automatic test equipment

Executing code on a test instrument in response to an event

Universal device multi-function test apparatus

Tester to simultaneously test different types of semiconductor devices and test system including the same

Probe card partition scheme

Testing an integrated circuit

Multi-core processor having disabled cores

Using shared pins in a concurrent test execution environment

Embedded tester

Semiconductor inspection apparatus and semiconductor inspection method

Testing device

Built-off test device and test system including the same

Built-in-self-test using embedded memory and processor in an application specific intergrated circuit

Real-time rule engine for adaptive testing of integrated circuits

Real-time rule engine for adaptive testing of integrated circuits

Test apparatus and test method

Solution for full speed, parallel DUT testing

Packetizing JTAG across industry standard interfaces

Digital integrated circuit testing and characterization system and method

Test instrument having a configurable interface

Programmable test instrument

Probe card partition scheme

Built-in-self-test using embedded memory and processor in an application specific integrated circuit

Semiconductor module, test system and method employing the same

SIGNAL TRANSMISSION APPARATUS AND SEMICONDUCTOR TEST APPARATUS USING THE SAME

System for testing an integrated circuit of a device and its method of use

Method of testing asynchronous modules in semiconductor device

Flexible storage interface tester with variable parallelism and firmware upgradeability

Tester to test a plurality of semiconductor devices and test system including the same

METHOD OF TESTING AN OBJECT AND APPARATUS FOR PERFORMING THE SAME

Built-in-self-test using embedded memory and processor in an application specific integrated circuit

METHOD OF TESTING INTEGRATED CIRCUITS

Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment

Process for making an electric testing of electronic devices

Built-in self-test using embedded memory and processor in an application specific integrated circuit

TEST APPARATUS, TEST METHOD, AND PHASE SHIFTER

Built-off test device and test system including the same

Using pattern generators to control flow of data to and from a semiconductor device under test

Test apparatus of semiconductor integrated circuit and method using the same

Method of sharing a test resource at a plurality of test sites, automated test equipment, handler for loading and unloading devices to be tested and test system

System for testing an integrated circuit of a device and its method of use

Signal processing apparatus, test system, distortion detecting apparatus, signal compensation apparatus, analytic signal generating apparatus, recording medium and analytic signal generating method

Distortion identification apparatus, test system, recording medium and distortion identification method

Semiconductor testing device, semiconductor device, and testing method

SEMICONDUCTOR TEST APPARATUS AND TEST METHOD FOR SEMICONDUCTOR DEVICE

Electronic device, host apparatus, communication system, and recording medium

System and method for checking analog circuit with digital checker

Test equipment and semiconductor device

Data processor having disabled cores

Method and product for testing a device under test

Electrical tester setup and calibration device

Testing system for a device under test

Test apparatus of semiconductor integrated circuit and method using the same

System for testing an integrated circuit of a device and its method of use

GENERATION OF TEST SPECIFICATIONS BASED ON MEASURED DATA POINTS

Methodology and system to set JTAG interface

Built-in self-test using embedded memory and processor in an application specific integrated circuit

System and method for testing information handling system components

TEST APPARATUS AND DEVICE INTERFACE

Apparatus for testing electronic devices

MEASUREMENT DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM

Method and system for controlling multiple physical pin electronics channels in a semiconductor test head

Method for optimizing probe card design

Mapping logic for controlling loading of the select ram of an error data crossbar multiplexer

Memory test engine

Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method

Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets

Wireless test system

Testing system using configurable integrated circuit

Configurable voltage regulator

Configurable voltage regulator

Test apparatus with tester channel availability identification

Test device with test parameter adaptation

Fasttest module

Site-aware objects

Automatic test equipment operating architecture

Automatic test equipment operating architecture

Test apparatus and setting method therefor

Method for managing semiconductor characteristic evaluation apparatus and computer program therefor

Test program set obsolescence mitigation through software and automatic test equipment system processes

Method and system for performing installation and configuration management of tester instrument modules

Clock transferring apparatus for synchronizing input data with internal clock and test apparatus having the same

Semiconductor device with termination resistor circuit

Integrated circuit die including a temperature detection circuit, and system and methods for calibrating the temperature detection circuit

System and method for linking and loading compiled pattern data

System and method for linking and loading compiled pattern data

Testing apparatus

Automatic test equipment operating architecture

Test apparatus and writing control circuit

Compensation for test signal degradation due to DUT fault

Wireless test system

Circuit and method for testing a circuit having memory array and addressing and control unit

System and method for performing concurrent mixed signal testing on a single processor

Universal test chiplet

Dynamically configurable system-on-chip network

Test arrangement for adjusting a setup of testing a device under test, a method of operating the test arrangement, and a non-transitory computer-readable recording medium

Multi-function electronic device testing