171915 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Tester hardware, i.e. output processing circuits tester configuration In-circuit Testers
DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZATION
#2TEST DEVICE, TEST SYSTEM, TEST METHOD, AND TEST APPARATUS
#3TEST CIRCUIT AND INTEGRATED CIRCUIT INCLUDING THE SAME
#4FORCED EARLY FAILURE FOR MEMORY DEVICE
#5IMPROVED DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZATION
#6DIAGNOSTIC RING OSCILLATOR CIRCUIT FOR DC AND TRANSIENT CHARACTERIZATION
#7IN-CIRCUIT EMULATOR DEVICE
#8Data recorder
#9Compiler-based code generation for post-silicon validation
#10Controller structural testing with automated test vectors
#11Trimming analog circuits
#12Controller structural testing with automated test vectors
#13Detection of performance degradation in integrated circuits
#14Automatic test equipment (ATE) contactor adaptor
#15Integrated circuit on chip instrument controller
#16Independently driving built-in self test circuitry over a range of operating conditions
#17INTEGRATED CIRCUIT STRUCTURE
#18Apparatus and method for a scalable test engine
#19Semiconductor integtrated circuit including test pads
#20Wafer-level gate stress testing
#21Integrated defect detection and location systems and methods in semiconductor chip devices
#22Methods and structure for correlation of test signals routed using different signaling pathways
#23Contactor with multi-pin device contacts
#24Self-trim and self-test of on-chip values
#25Built off testing apparatus
#26Equipment testing system and method having scaleable test line limits
#27Integrated circuit (IC) with on-board characterization unit
#28Method for network extraction based on phase localization