171922 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Tester hardware, i.e. output processing circuits; Stimuli generation or application of test patterns to the device under test [DUT] Formatter
TESTING A CONTROL DEVICE USING A TEST ASSEMBLY
#2Multiple-level driver circuit with non-commutating bridge
#3Automated test system with event detection capability
#4Integrated circuit testing module including signal shaping interface
#5Integrated circuit testing module including signal shaping interface
#6Method, apparatus, and system for enabling a deterministic interface
#7Programmable on-chip logic analyzer apparatus, systems, and methods
#8Semiconductor test apparatus and test method
#9High speed fully differential resistor-based level formatter
#10Timing vernier using a delay locked loop
#11Test apparatus for digital modulated signal
#12Test apparatus for digital modulated signal
#13High impedance, high parallelism, high temperature memory test system architecture
#14Multiply apparatus for semiconductor test pattern signal
#15Probe card
#16Test apparatus, test method and manufacturing method
#17Timing vernier using a delay locked loop
#18Signal generating apparatus, test apparatus and circuit device
#19Test apparatus and manufacturing method
#20PIN ELECTRONICS CIRCUIT, SEMICONDUCTOR DEVICE TEST EQUIPMENT AND SYSTEM
#21Fast, low power formatter for automatic test system
#22Test apparatus, test method and manufacturing method
#23Programmable on-chip logic analyzer apparatus, systems, and methods
#24Test apparatus, probe card, and test method
#25Test apparatus
#26Waveform generator, waveform generating device, test apparatus, and machine readable medium storing a program thereof
#27Signal generating apparatus, periodic-signal observing system, integrated circuit, periodic-signal observing method, and method of testing integrated circuit
#28Integrated circuit with continuous testing of repetitive functional blocks
#29Waveform generation apparatus, setup cycle correction method and semiconductor test apparatus
#30Timing vernier using a delay locked loop
#31Test apparatus and electronic device
#32TEST APPARATUS AND ELECTRONIC DEVICE
#33Testing apparatus
#34Methods and apparatus for testing a circuit
#35Automatic test equipment capable of high speed test
#36Pulse-generating apparatus and a method for adjusting levels of pulses outputted from pulse-generating apparatus
#37High impedance, high parallelism, high temperature memory test system architecture
#38Testing hardware components to detect hardware failures
#39Pattern controlled, full speed ATE compare capability for deterministic and non-deterministic IC data
#40Test apparatus and test module
#41Sub-instruction repeats for algorithmic pattern generators
#42Apparatus for testing integrated circuit
#43Signal generator, test apparatus, and circuit device
#44Systems and methods for continuity testing using a functional pattern
#45Circuit verification apparatus, circuit verification method, and signal distribution method for the same
#46Electronic device, testing apparatus, and testing method
#47Methods and apparatus using a service to launch and/or monitor data formatting processes
#48Device and method for testing and for diagnosing digital circuits
#49Integrated circuit testing module including data compression
#50Test apparatus and test method
#51Pulse pattern generator and communication device evaluation system utilizing the same
#52Testing methods of a semiconductor integrated incorporating a high-frequency receiving circuit and a demodulation circuit
#53Driver circuit, test apparatus and adjusting method
#54Electronic test apparatus and method for testing at least one circuit unit
#55Integrated circuit testing module including signal shaping interface
#56Integrated circuit testing module configured for set-up and hold time testing
#57Timing vernier using a delay locked loop
#58Test apparatus and testing method
#59Test apparatus and testing method
#60Test apparatus and testing method
#61Signal shaping circuit
#62Sampling apparatus, and testing apparatus
#63Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method
#64Test apparatus and testing method
#65Apparatus and method for generating a high-frequency signal
#66Test apparatus and test method
#67Semiconductor test apparatus and control method therefor
#68Test apparatus and test method
#69Format control circuit and semiconductor test device
#70Test apparatus and testing method
#71Test probe with side arm
#72Timing vernier using a delay locked loop
#73Test apparatus and control method
#74System and method for testing integrated circuits
#75Testing apparatus and a testing method
#76Voltage waveform generation circuit
#77Test device
#78Test apparatus
#79Timing vernier using a delay locked loop
#80Method of choosing tester designs and use model using operating characteristics
#81Methods and apparatus for optimizing lists of waveforms
#82Methods and apparatus for optimizing the masking of waveforms to reduce the number of waveforms in a list of waveforms
#83Semiconductor testing apparatus
#84Pulse pattern generating apparatus
#85Apparatus and method for automatic elimination of round-trip delay errors induced by automatic test equipment calibration
#86System to temporarily modify an output waveform
#87Test device and test module
#88Test apparatus
#89Test systems and methods with compensation techniques
#90Systems and methods associated with test equipment