171925 ⎘
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere; Testing of electronic circuits, e.g. by signal tracer; Testing of digital circuits; Functional testing; Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response Storing data, e.g. failure memory
METHOD OF USING A TEST PATTERN FOR TESTING FUNCTIONALITIES OF EXTERNAL DEVICES WHEN AN ITEM IS ATTACHED TO A VEHICLE
#2TEST DEVICE, TEST SYSTEM, TEST METHOD, AND TEST APPARATUS
#3SEMICONDUCTOR DEVICE AND FAILURE ANALYSIS METHOD THEREFOR
#4DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
#5METHOD AND APPARATUS FOR INTEGRATED CIRCUIT TESTING
#6DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE
#7SEMICONDUCTOR TEST APPARATUS USING FPGA AND MEMORY CONTROL METHOD FOR SEMICONDUCTOR TEST
#8SEMICONDUCTOR TEST APPARATUS CAPABLE OF INDUCING REDUCTION OF POWER CONSUMPTION
#9System on chip for performing scan test and method of designing the same
#10Row redundancy techniques
#11Measurement system and measurement method
#12Memory device test method, apparatus, and system, medium, and electronic device
#13Leakage screening based on use-case power prediction
#14Semiconductor integrated circuit device and operating method thereof
#15Automated testing machine with data processing function and information processing method thereof
#16DEBUG DATA COMMUNICATION SYSTEM FOR MULTIPLE CHIPS
#17Secondary monitoring system for a machine under test
#18Wafer test system and methods thereof
#19End of life performance throttling to prevent data loss
#20Method, apparatus and storage medium for testing chip, and chip thereof
#21Device, method and system of error detection and correction in multiple devices
#22Test apparatus
#23Procedure for reviewing an FPGA-program
#24End of life performance throttling to prevent data loss
#25Memory apparatus relating to determination of a failed region and test method thereof, memory module and system using the same
#26End of life performance throttling to prevent data loss
#27System, apparatus and method for functional testing of one or more fabrics of a processor
#28Memory apparatus relating to determination of a failed region and test method thereof, memory module and system using the same
#29Measuring device for measuring signals and data handling method
#30Fast auto shift of failing memory diagnostics data using pattern detection
#31Integrated circuit with self-verification function, verification method and method for generating a BIST signature adjustment code
#32Integrated circuit and method for testing semiconductor devices using the same
#33De-skewing transmitted data
#34System and method for scan-testing of idle functional units in operating systems
#35Voltage-driven intelligent characterization bench for semiconductor
#36Method and apparatus for low latency communication in an automatic testing system
#37Apparatuses and methods for compressing data received over multiple memory accesses
#38Measurement System Results Queue For Improved Performance
#39Method of enhancing error correction performance and storage device using the method
#40Circuit for detecting and recording chip fails and the method thereof
#41Voltage-driven intelligent characterization bench for semiconductor
#42Measured device and test system utilizing the same
#43Test apparatus and test method
#44Test apparatus and test method
#45Compensating for harmonic distortion in an instrument channel
#46REPORT GENERATION SYSTEM AND METHOD
#47Bit failure signature identification
#48Method and apparatus for increasing yield
#49Reliability test with monitoring of the results
#50Integrated circuit self-monitored burn-in
#51COMPENSATING FOR HARMONIC DISTORTION IN AN INSTRUMENT CHANNEL
#52Test circuit
#53System for isolating faults between electrical equipment
#54Test apparatus for testing a device under test and device for receiving a signal
#55Test system and failure parsing method thereof
#56Circuit testing apparatus
#57Compensating for harmonic distortion in an instrument channel
#58Integrated testing apparatus, systems, and methods
#59Method, code, and apparatus for logging test results
#60Analysis apparatus and analysis method
#61Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit
#62System, method and apparatus for completing the generation of test records after an abort event
#63Data capture in automatic test equipment
#64Test data reporting and analyzing using data array and related data analysis
#65Test apparatus, and method of manufacturing semiconductor memory
#66Test apparatus
#67Program, test apparatus and testing method
#68Memory tester having defect analysis memory with two storage sections
#69Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
#70Multiple sweep point testing of circuit devices
#71Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory
#72Method for collecting data from semiconductor equipment
#73Apparatus and method for reading out defect information items from an integrated chip
#74Method of mapping logic failures in an integrated circuit die
#75System and method for testing devices
#76Functional failure analysis techniques for programmable integrated circuits