177129 ⎘
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography Production of exposure light, i.e. light sources
Sub-classes:LITHOGRAPHY MASKS INCLUDING CURVILINEAR SUB-RESOLUTION ASSIST FEATURES AND METHOD OF MANUFACTURING THEREOF
#2Lithography Using Spin Isolated Monochromatic Electromagnetic Radiation
#3PHOTOSENSITIVE RESIN COMPOSITION, PHOTOSENSITIVE RESIN LAYER USING THE SAME, DISPLAY DEVICE, AND MANUFACTURING METHOD OF PHOTOSENSITIVE RESIN LAYER
#4LITHOGRAPHY APPARATUS, PATTERNING SYSTEM, AND METHOD OF PATTERNING A LAYERED STRUCTURE
#5MICROCHANNEL CHIP AND METHOD FOR PRODUCING THE SAME
#6RESIST COMPOSITION, DRY FILM RESIST, METHOD FOR PRODUCING DRY FILM RESIST, METHOD FOR FORMING RESIST PATTERN, AND METHOD FOR PRODUCING PLATED OBJECT
#7PSEUDO-HOMOGENEOUS PHOTO-PATTERNABLE SEMICONDUCTING POLYMER BLENDS FOR ORGANIC THIN-FILM TRANSISTORS (OTFT)
#8RESIST PATTERN FORMING PROCESS
#9APPARATUS AND METHOD FOR DETERMINING AN ANGULAR REFLECTIVITY PROFILE
#10RADIATION-SENSITIVE RESIN COMPOSITION AND PATTERN FORMATION METHOD
#11Transferable Nanostructure Fabrication by Gapless Stencil Lithography
#12ELECTRON PROBE POSITIONING PATTERN, DISPLACEMENT MEASUREMENT METHOD, AND POSITIONING CONTROL METHOD
#13OPTICAL PULSE STRETCHER APPARATUS
#14Polymer, Positive And Negative Photosensitive Resin Compositions, Patterning Process, Method For Forming Cured Film, Interlayer Insulating Film, Surface Protective Film, And Electronic Component
#15COMPOSITION FOR FORMING RESIST UNDERLAYER FILM, RESIST UNDERLAYER FILM, METHOD FOR MANUFACTURING RESIST UNDERLAYER FILM, PATTERNING PROCESS, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#16PHOTOCURABLE RESIN COMPOSITION CONTAINING SELF-CROSSLINKABLE POLYMER
#17RESIST UNDERLAYER FILM-FORMING COMPOSITION
#18Dual-modal information storage and anti-counterfeiting material, and its preparation method
#19A CLEANING METHOD AND ASSOCIATED ILLUMINATION SOURCE METROLOGY APPARATUS
#20TEMPORARY CAPPING MATERIAL FOR OXIDE PREVENTION IN LOW TEMPERATURE DIRECT METAL-METAL BONDING
#21SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS
#22Lithographic Method for Imprinting Three-Dimensional Microstructures Having Oversized Structural Heights Into a Carrier Material
#23ELECTRON BEAM LITHOGRAPHY APPARATUS, ELECTRON BEAM LITHOGRAPHY METHOD, AND RECORDING MEDIUM
#24ELECTRO OPTICAL DEVICES FABRICATED USING DEEP ULTRAVIOLET RADIATION
#25RESIN MEMBRANE FILTER AND MANUFACTURING METHOD OF RESIN MEMBRANE FILTER
#26OPTICAL COMPONENT FOR DEEP ULTRAVIOLET LIGHT SOURCE
#27METHOD FOR PREPARING JOSEPHSON JUNCTION AND PRODUCTION LINE DEVICE
#28AN ILLUMINATION SOURCE AND ASSOCIATED METROLOGY APPARATUS
#29Photolithography system including selective light array
#30METHODS AND SYSTEMS FOR PHOTOPATTERNING AND MINIATURIZATION
#31Gamma ray generator and method of generating gamma ray
#32Mask protective module, pellicle having the same, and lithography apparatus having the same
#33Mounted hollow-core fiber arrangement
#34DRAWING METHOD, MASTER PLATE MANUFACTURING METHOD, AND DRAWING APPARATUS
#35CONTROL SYSTEM FOR A PLURALITY OF DEEP ULTRAVIOLET OPTICAL OSCILLATORS
#36System and method for overlay error reduction
#37Gamma ray generator and gamma ray lithography system
#38APPARATUS FOR AND METHOD OF MANUFACTURING AN ARTICLE USING PHOTOLITHOGRAPHY AND A PHOTORESIST
#39Electro optical devices fabricated using deep ultraviolet radiation
#40Charged particle beam writing apparatus, charged particle beam writing method, and a non-transitory computer-readable storage medium
#41Reducing speckle in an excimer light source
#42Artificial nerve conduit construction using tissue engineering methods
#43Patterning method and method for manufacturing array substrate
#44Exposure device
#45Projection exposure apparatus for semiconductor lithography
#46Gamma ray generator, gamma ray lithography system and method of performing gamma ray lithography
#47Mounted hollow-core fiber arrangement
#48Half tone scheme for maskless lithography
#49Light source for lithography exposure process
#50Temperature controlled heat transfer frame for pellicle
#51System and method for light field correction of colored surfaces in an image
#52High purity tin and method for manufacturing same
#53Reducing speckle in an excimer light source
#54Light source for lithography exposure process
#55Lithographic method
#56Spatial light modulator with variable intensity diodes
#57Mask protective module, pellicle having the same, and lithography apparatus having the same
#58Method for forming a chemical guiding structure on a substrate and chemoepitaxy method
#59Substrate processing apparatus, substrate processing method and recording medium
#60Light source for lithography exposure process
#61EXPOSURE DEVICE AND EXPOSURE METHOD THEREOF
#62Electron source
#63Particle irradiation apparatus, beam modifier device, and semiconductor device including a junction termination extension zone
#64High power broadband illumination source
#65Exposure apparatus and article manufacturing method
#66Pellicle composition for photomask, pellicle for photomask formed from the pellicle composition, method of forming the pellicle, reticle including the pellicle, and exposure apparatus for lithography including the reticle
#67Projection optical unit for imaging an object field into an image field, and projection exposure apparatus comprising such a projection optical unit
#68High purity tin and method for manufacturing same
#69Temperature controlled heat transfer frame for pellicle
#70Lithographic thermal distortion compensation with the use of machine learning
#71Pellicle for photomask, reticle including the same, and exposure apparatus for lithography
#72Lithographic apparatus and method
#73Exposure device, substrate processing apparatus, exposure method of substrate and substrate processing method
#74Exposure device substrate processing apparatus, exposure method of substrate and substrate processing method
#75Illumination system for EUV projection lithography
#76UV mask device and method for using the same
#77Reducing speckle in an excimer light source
#78Optical apparatus and vibration removing method
#79Electromagnetic drive comprising a stator and a stator holder
#80Lithographic apparatus and method
#81Measurement apparatus and method
#82Lithographic method
#83Illumination source for an inspection apparatus, inspection apparatus and inspection method
#84Radiation source and lithographic apparatus
#85Lithographic apparatus and method
#86Electrodeless single low power CW laser driven plasma lamp
#87Method of improving measurement of energy of extreme ultraviolet radiation generated in a chamber
#88Systems and methods for high-throughput and small-footprint scanning exposure for lithography
#89Particle irradiation apparatus, beam modifier device, and semiconductor device including a junction termination extension zone
#90Electron source
#91Organic light emitting device
#92Laser apparatus and laser apparatus manufacturing method
#93Electrodeless single CW laser driven xenon lamp
#94Data tuning for fast computation and polygonal manipulation simplification
#95Illumination system for EUV projection lithography
#96Method of temperature compensation in high power focusing system for EUV LPP source
#97Lithographic method
#98Systems and methods for high-throughput and small-footprint scanning exposure for lithography
#99Projection optical unit for imaging an object field into an image field, and projection exposure apparatus comprising such a projection optical unit
#100Minimizing grazing incidence reflections for reliable EUV power measurements having a light source comprising plural tubes with centerlines disposed between a radiation region and corresponding photodetector modules
#101Device for controlling temperature of an optical element
#102Plasmonic nano-lithography based on attenuated total reflection
#103EUV light source
#104Illumination system for an EUV projection lithographic projection exposure apparatus
#105Device for controlling temperature of an optical element
#106Resonant cavity conditioning for improved nonlinear crystal performance
#107Processing apparatus and article manufacturing method using same
#108Lithographic apparatus, spectral purity filter and device manufacturing method
#109Fly's eye optical mirror with a plurality of optical elements rotationally aligned along two axes
#110Liquid optically clear adhesive lamination process control
#111EUV collector system with enhanced EUV radiation collection
#112Lithographic apparatus and method
#113Chamber apparatus and extreme ultraviolet (EUV) light generation apparatus including the chamber apparatus
#114Optical device including wavefront correction parts and beam direction parts, laser apparatus including the optical device, and extreme ultraviolet light generation system including the laser apparatus
#115Device for controlling temperature of an optical element
#116EUV collector system with enhanced EUV radiation collection
#117Light source device
#118Projection illumination system for EUV microlithography
#119Device for controlling temperature of an optical element
#120Method and apparatus for using a synchrotron as a source in extreme ultraviolet lithography
#121Photocathode lighting device, method for manufacturing the same and exposure apparatus using photocathode lighting device
#122Illumination system for a microlithography projection exposure apparatus
#123Controlling fluctuations in pointing, positioning, size or divergence errors of a beam of light for optical apparatus
#124Automated x-ray optic alignment with four-sector sensor
#125Euv Light Source
#126Radiation system and lithographic apparatus
#127Device for generating and emitting XUV radiation
#128Lithographic apparatus and device manufacturing method
#129Exposure apparatus, and device manufacturing method
#130Transition radiation apparatus
#131Lithographic apparatus and device manufacturing method
#132Half tone scheme for maskless lithography
#133Half tone scheme for maskless lithography