177149 ⎘
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography; Mask illumination systems; Details of optical elements Lamphouse reflector arrangements, i.e. collecting light from solid angle upstream of the light source
EUV RADIATION SOURCE APPARATUS FOR LITHOGRAPHY
#2EUV LIGHT SOURCE DEVICE FOR EUV MASK INSPECTION
#3LIGHT GENERATION DEVICE AND LITHOGRAPHY APPARATUS INCLUDING THE SAME
#4RADIATION COLLECTOR
#5EUV COLLECTOR
#6EUV COLLECTOR FOR USE IN AN EUV PROJECTION EXPOSURE APPARATUS
#7APPARATUS FOR STRESS-REDUCED MOUNTING OF MEMS-BASED MICROMIRRORS
#8CLEANING A STRUCTURE SURFACE IN AN EUV CHAMBER
#9EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEM
#10OPTICAL COMPONENT GROUP, IN PARTICULAR FOR USE IN AN ILLUMINATION DEVICE OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
#11DETECTION APPARATUS, ALIGNMENT MICROSCOPE, AND EXPOSURE APPARATUS
#12EXTREME ULTRAVIOLET EXPOSURE APPARATUS INCLUDING A MASK STAGE
#13EXPOSURE APPARATUS AND DECONTAMINATION APPARATUS
#14OPTICAL SYSTEM FOR A LITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
#15RADIATION COLLECTOR
#16OPTICAL ELEMENT, IN PARTICULAR FOR REFLECTING EUV RADIATION, OPTICAL ARRANGEMENT, AND METHOD FOR MANUFACTURING AN OPTICAL ELEMENT
#17Light source apparatus, lithography apparatus, and article manufacturing
#18EUV COLLECTOR
#19OPTICAL ELEMENT FOR A EUV PROJECTION EXPOSURE SYSTEM
#20Mirror, in particular for a microlithographic projection exposure apparatus
#21Collector mirror and apparatus for creating extreme ultraviolet light including the same
#22EUV RADIATION SOURCE APPARATUS FOR LITHOGRAPHY
#23EUV LIGHT SOURCE AND APPARATUS FOR LITHOGRAPHY
#24Lamp, light source device, exposure apparatus, and article manufacturing method
#25Oxygen-loss resistant top coating for optical elements
#26Radiation source for lithography process
#27Cleaning a structure surface in an EUV chamber
#28Optical diffraction component
#29Extreme ultraviolet lithography system
#30In-situ light detection methods and apparatus for ultraviolet semiconductor substrate processing
#31EUV radiation source apparatus for lithography
#32Radiation source for lithography process
#33Cleaning a structure surface in an EUV chamber
#34Extreme ultraviolet lithography system
#35Extreme ultraviolet light generation apparatus and electronic device manufacturing method
#36EUV vessel inspection method and related system
#37Extreme ultraviolet light generation device and electronic device manufacturing method
#38Radiation source for lithography process
#39Extreme ultraviolet light generation apparatus
#40System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
#41EUV vessel inspection method and related system
#42EUV light source and apparatus for lithography
#43EUV light source and apparatus for lithography
#44EUV radiation source apparatus for lithography
#45System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
#46Radiation source for lithography process
#47Radiation source, lithographic apparatus device manufacturing method, sensor system and sensing method
#48Collector pellicle
#49EUV Collector
#50Method of controlling debris in an EUV light source
#51EUV vessel inspection method and related system
#52Suppression filter, radiation collector and radiation source for a lithographic apparatus; method of determining a separation distance between at least two reflective surface levels of a suppression filter
#53Optical assembly with a protective element and optical arrangement therewith
#54Extreme ultraviolet light generating apparatus
#55Extreme ultraviolet lithography system with debris trapper on exhaust line
#56System, method and apparatus for target material debris cleaning of EUV vessel and EUV collector
#57Mirror, in particular collector mirror for microlithography
#58Extreme ultraviolet light generation device
#59EUV element having barrier to hydrogen transport
#60Light source apparatus, illumination device, exposure apparatus, and device manufacturing method
#61Faceted EUV optical element
#62Rotary EUV collector
#63Radiation source
#64Radiation source device, lithographic apparatus and device manufacturing method
#65Radiation source, lithographic apparatus device manufacturing method, sensor system and sensing method
#66Illumination system
#67Collector
#68Light source apparatus, illumination device, exposure apparatus, and device manufacturing method
#69Systems and methods for synchronous operation of debris-mitigation devices
#70EUV collector
#71Rotary EUV collector
#72Module and method for producing extreme ultraviolet radiation
#73Radiation source
#74Debris protection system for reflective optic utilizing gas flow
#75Collector
#76Imaging optical system and projection exposure system including the same
#77EUV collector system with enhanced EUV radiation collection
#78Illumination optical unit
#79Collector mirror assembly and method for producing extreme ultraviolet radiation
#80Mirror device
#81EUV collector
#82ILLUMINANCE DISTRIBUTION DETECTION METHOD IN EXTREME ULTRAVIOLET LIGHT SOURCE APPARATUS AND POSITIONING METHOD OF LIGHT FOCUSING OPTICAL MEANS
#83Optical collector for collecting extreme ultraviolet radiation, method for operating such an optical collector, and EUV source with such a collector
#84Laser-produced-plasma EUV light source
#85Source collector, lithographic apparatus and device manufacturing method
#86Illumination optical unit for microlithography
#87Ex-situ removal of deposition on an optical element
#88EUV collector with cooling device
#89Source-collector module with GIC mirror and tin vapor LPP target system
#90Master oscillator-power amplifier drive laser with pre-pulse for EUV light source
#91Chamber apparatus and extreme ultraviolet light generation system
#92Extreme ultraviolet light source apparatus
#93EUV collector system with enhanced EUV radiation collection
#94OPTICAL COMPONENT HAVING AN IMPROVED TRANSIENT THERMAL BEHAVIOR AND METHOD FOR IMPROVING THE TRANSIENT THERMAL BEHAVIOR OF AN OPTICAL COMPONENT
#95Optical element mount for lithographic apparatus
#96COLLECTOR ASSEMBLY, RADIATION SOURCE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
#97Alignment of collector device in lithographic apparatus
#98Radiation source with a debris mitigation system, lithographic apparatus with a debris mitigation system, method for preventing debris from depositing on collector mirror, and device manufacturing method
#99Radiation system and lithographic apparatus
#100Source-collector module with GIC mirror and LPP EUV light source
#101Cooling systems and methods for grazing incidence EUV lightography collectors
#102RADIATION SOURCE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
#103RADIATION SYSTEM AND METHOD, AND A SPECTRAL PURITY FILTER
#104ILLUMINATION SYSTEM FOR A MICROLITHOGRAPHY PROJECTION EXPOSURE APPARATUS
#105Ex-situ removal of deposition on an optical element
#106LITHOGRAPHIC RADIATION SOURCE, COLLECTOR, APPARATUS AND METHOD
#107Imaging optical system and projection exposure system including the same
#108OBLIQUE MIRROR-TYPE NORMAL-INCIDENCE COLLECTOR SYSTEM FOR LIGHT SOURCES, PARTICULARLY EUV PLASMA DISCHARGE SOURCES
#109Radiation source
#110Bundle-guiding optical collector for collecting the emission of a radiation source
#111Laser device
#112Self-shading electrodes for debris suppression in an EUV source
#113Extreme ultraviolet light source
#114Radiation source, lithographic apparatus and device manufacturing method
#115Gas management system for a laser-produced-plasma EUV light source
#116Extreme ultraviolet light source apparatus
#117Extreme ultraviolet light source apparatus
#118Collector optical system
#119MULTI-REFLECTION OPTICAL SYSTEMS AND THEIR FABRICATION
#120Optical element for radiation in the EUV and/or soft X-ray region and an optical system with at least one optical element
#121Radiation sources and methods of generating radiation
#122Radiation source
#123Device for collecting flux of electromagnetic radiation in the extreme ultraviolet
#124High power EUV lamp system
#125OPTICAL ELEMENT, AND LIGHT SOURCE UNIT AND EXPOSURE APPARATUS HAVING THE SAME
#126Module and method for producing extreme ultraviolet radiation
#127Lithographic apparatus, device manufacturing method, and use of a radiation collector
#128Systems and methods for in-situ reflectivity degradation monitoring of optical collectors used in extreme ultraviolet (EUV) lithography processes
#129Gas management system for a laser-produced-plasma EUV light source
#130Optical component having an improved transient thermal behavior and method for improving the transient thermal behavior of an optical component
#131Method and arrangement for cleaning optical surfaces in plasma-based radiation sources
#132Assembly comprising a radiation source, a reflector and a contaminant barrier
#133Efficient EUV collector designs
#134Illumination system for illuminating a patterning device and method for manufacturing an illumination system
#135COLLECTOR FOR ILLUMINATION SYSTEMS WITH A WAVELENGTH LESS THAN OR EQUAL TO 193 nm
#136Illumination system particularly for microlithography
#137Collector mirror exchanging apparatus and method for extreme ultraviolet light source apparatus
#138High-Precision Optical Surface Prepared by Sagging from a Masterpiece
#139X-ray generator and exposure apparatus
#140Collector with fastening devices for fastening mirror shells
#141Extreme ultraviolet light source
#142EUV light source
#143Collector configured of mirror shells
#144Optical apparatus
#145Systems and methods for reducing the influence of plasma-generated debris on the internal components of an EUV light source
#146OPTICAL ELEMENT, AND LIGHT SOURCE UNIT AND EXPOSURE APPARATUS HAVING THE SAME
#147EUV light source optical elements
#148EUV light source
#149EUV light source
#150EUV light source
#151Lithographic apparatus including a cleaning device and method for cleaning an optical element
#152Illumination system particularly for microlithography
#153Collector for EUV light source
#154Collector for EUV light source
#155Collector for EUV light source
#156Optical element for radiation in the EUV and/or soft X-ray region and an optical system with at least one optical element
#157Lithographic apparatus, device manufacturing method, and use of a radiation collector
#158Lithographic apparatus, device manufacturing method and radiation collector
#159Ex-situ removal of deposition on an optical element
#160Ex-situ removal of deposition on an optical element
#161Oblique mirror-type normal-incidence collector system for light sources, particularly EUV plasma discharge sources
#162Optical systems that correct optical irregularities, and projection-exposure systems and methods comprising same
#163Discharge produced plasma EUV light source
#164Collector with fastening devices for fastening mirror shells
#165Adjustment of distance between source plasma and mirrors to change partial coherence
#166EUV light source collector erosion mitigation
#167Lithographic projection apparatus, reflector assembly for use therein, and device manufacturing method
#168Condenser optic with sacrificial reflective surface
#169Dual hemispherical collectors
#170Collector mirror for plasma-based, short-wavelength radiation sources
#171Efficient EUV collector designs
#172Method for removal of deposition on an optical element, lithographic apparatus, device manufacturing method, and device manufactured thereby
#173Device for generating and/or influencing electromagnetic radiation from a plasma
#174Collector for EUV light source
#175Collector optical system, light source unit, illumination optical apparatus, and exposure apparatus
#176Lithographic apparatus and device manufacturing method
#177Collector having unused region for illumination systems using a wavelength ≦193 nm
#178Optical component having an improved transient thermal behavior and method for improving the transient thermal behavior of an optical component
#179X-ray generator and exposure apparatus
#180Adjustable illumination source
#181Optics for extreme ultraviolet lithography
#182Systems and methods for reducing the influence of plasma-generated debris on the internal components of an EUV light source
#183Technique to prevent tin contamination of mirrors and electrodes in an EUV lithography system
#184Extreme ultraviolet light source
#185Exposure apparatus and device fabrication method using the same
#186EUV light source optical elements
#187EUV light source
#188Condenser optic with sacrificial reflective surface
#189Lithographic apparatus, device manufacturing method, and device manufactured thereby
#190Lithographic projection apparatus, reflector assembly for use therein, and device manufacturing method
#191Illumination system particularly for microlithography
#192Reflection mirror apparatus, exposure apparatus and device manufacturing method
#193Facet mirror having a number of mirror facets
#194EUV light source with spectral purity filter and power recycling