ClassID:

177164

G03F7/703 - CPC Classification

Classification description:

Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography; Systems for imaging mask onto workpiece Non-planar pattern area or non-planar masks

Recent Application in this class:
#1
20260133503
2026-05-14

MASKLESS EXPOSURE SYSTEM HAVING IMAGE PROCESSING FUNCTION FOR SUBSTRATE POSITIONING

#2
20210405537
2021-12-30

Method and device for lithographically producing a target structure on a non-planar initial structure

#3
20210223697
2021-07-22

CYLINDRICAL SEMICONDUCTOR INTEGRATED CIRCUITS AND CONCENTRIC PHOTOLITHOGRAPHY FOR THE FABRICATION THEREOF

#4
20200401055
2020-12-24

Conformal stage

#5
20200047379
2020-02-13

Flexible mask modulation for controlling atmosphere between mask and substrate and methods of using the same

#6
20190163067
2019-05-30

Method and device for lithographically producing a target structure on a non-planar initial structure

#7
20190146347
2019-05-16

Maskless exposure method, maskless exposure apparatus and method of manufacturing a semiconductor device using the same

#8
20180341176
2018-11-29

Film mask, method for manufacturing same, and method for forming pattern using film mask and pattern formed thereby

#9
20180329286
2018-11-15

Film mask, method for manufacturing same, and method for forming pattern using film mask

#10
20180196351
2018-07-12

Lithographic apparatus and method

#11
20170248850
2017-08-31

PROJECTION OBJECTIVE FOR MICROLITHOGRAPHY

#12
20160306272
2016-10-20

Extreme ultraviolet lithography process and mask

#13
20160238941
2016-08-18

Maskless lithography for web based processing

#14
20160170307
2016-06-16

Projection objective for microlithography

#15
20160154298
2016-06-02

Reflective lithography masks and systems and methods

#16
20160011525
2016-01-14

Lithography tool having a reticle stage capable of dynamic reticle bending to compensate for distortion

#17
20150220005
2015-08-06

Real-time reticle curvature sensing

#18
20150147685
2015-05-28

SYSTEM AND METHOD FOR HOLOGRAPHY-BASED FABRICATION

#19
20150098069
2015-04-09

Extreme ultraviolet lithography process and mask

#20
20150091230
2015-04-02

Chucking system with recessed support feature

#21
20140333914
2014-11-13

Reflective lithography masks and systems and methods

#22
20140253897
2014-09-11

Exposure apparatus and exposure method thereof

#23
20140253896
2014-09-11

Exposure apparatus and exposure method thereof

#24
20140253893
2014-09-11

Cylindrical reticle system, exposure apparatus and exposure method

#25
20130329209
2013-12-12

Mask, exposure apparatus and device manufacturing method

#26
20130244140
2013-09-19

Non-planar lithography mask and system and methods

#27
20130244139
2013-09-19

Reflective lithography masks and systems and methods

#28
20130208251
2013-08-15

Large area nanopatterning method and apparatus

#29
20130120732
2013-05-16

Cylindrical magnetic levitation stage and lithography

#30
20130120726
2013-05-16

Method of structuring a photosensitive material

#31
20130040230
2013-02-14

Method of determining focus and dose of an apparatus of optical micro-lithography

#32
20130027684
2013-01-31

EXPOSURE APPARATUS, SUBSTRATE PROCESSING APPARATUS, AND DEVICE MANUFACTURING METHOD

#33
20120327382
2012-12-27

Projection objective for microlithography

#34
20120307225
2012-12-06

Optical imaging writer system

#35
20120282554
2012-11-08

LARGE AREA NANOPATTERNING METHOD AND APPARATUS

#36
20120281192
2012-11-08

Lithographic apparatus and method

#37
20120264067
2012-10-18

Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server

#38
20120183907
2012-07-19

Patterning process for small devices

#39
20120162629
2012-06-28

Large area nanopatterning method and apparatus

#40
20120153323
2012-06-21

Photolithographic LED fabrication using phase-shift mask

#41
20120087058
2012-04-12

Image-compensating addressable electrostatic chuck system

#42
20110292363
2011-12-01

Exposure apparatus and methods

#43
20110292360
2011-12-01

Patterning non-planar surfaces

#44
20110262848
2011-10-27

Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server

#45
20110234343
2011-09-29

Cylindrical magnetic levitation stage

#46
20110222039
2011-09-15

Lithographic apparatus and device manufacturing method

#47
20110001954
2011-01-06

Chucking system with recessed support feature

#48
20100290016
2010-11-18

MICRODEVICE FABRICATION

#49
20100259745
2010-10-14

METHOD FOR OBTAINING FORCE COMBINATIONS FOR TEMPLATE DEFORMATION USING NULLSPACE AND METHODS OPTIMIZATION TECHNIQUES

#50
20100149503
2010-06-17

Method of structuring a photosensitive material

#51
20100123885
2010-05-20

Large area nanopatterning method and apparatus

#52
20100009140
2010-01-14

LITHOGRAPHIC METHOD FOR WIRING A SIDE SURFACE OF A SUBSTRATE

#53
20090170014
2009-07-02

Mask, exposure apparatus and device manufacturing method

#54
20090147226
2009-06-11

Inner Surface Exposure Apparatus and Inner Surface Exposure Method Technical Field

#55
20090068765
2009-03-12

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE

#56
20090042139
2009-02-12

Exposure method and electronic device manufacturing method

#57
20090042115
2009-02-12

Exposure apparatus, exposure method, and electronic device manufacturing method

#58
20090040494
2009-02-12

METHODS AND APPARATUSES FOR CONFIGURING RADIATION IN MICROLITHOGRAPHIC PROCESSING OF WORKPIECES

#59
20090035880
2009-02-05

Maunfacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server

#60
20090024978
2009-01-22

SEMICONDUCTOR DEVICE MASK, METHOD OF FORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME

#61
20080299492
2008-12-04

Exposure method and electronic device manufacturing method

#62
20080297747
2008-12-04

Lithographic apparatus and device manufacturing method

#63
20080252987
2008-10-16

Projection objective for microlithography

#64
20080085462
2008-04-10

Lithographic apparatus and device manufacturing method

#65
20080074633
2008-03-27

NEAR-FIELD EXPOSURE METHOD AND APPARATUS, NEAR-FIELD EXPOSURE MASK, AND DEVICE MANUFACTURING METHOD

#66
20080062390
2008-03-13

Customizing equipment for individualized contact lenses

#67
20080038677
2008-02-14

Patterning non-planar surfaces

#68
20070287081
2007-12-13

Method for obtaining force combinations for template deformation using nullspace and methods optimization techniques

#69
20070103639
2007-05-10

Method of manufacturing a mould for producing an optical surface, a method of producing a contact lens and a device for use with these methods

#70
20070059608
2007-03-15

Photomask, photomask manufacturing method, and photomask processing device

#71
20070024830
2007-02-01

Illumination compensator for curved surface lithography

#72
20070019178
2007-01-25

Methods and apparatuses for configuring radiation in microlithographic processing of workpieces using an adjustment structure

#73
20060286488
2006-12-21

Methods and devices for fabricating three-dimensional nanoscale structures

#74
20060198028
2006-09-07

Refractive optical imaging system, in particular projection objective for microlithography

#75
20060177778
2006-08-10

System and method for photolithography in semiconductor manufacturing

#76
20060160036
2006-07-20

Near-field exposure method and apparatus, near-field exposure mask, and device manufacturing method

#77
20060051979
2006-03-09

Apparatus and method of exposing a semiconductor device having a curved surface to light

#78
20060051679
2006-03-09

Lithographic method for wiring a side surface of a substrate

#79
20060050940
2006-03-09

System and method for detecting and correcting position deviations of an object having a curved surface

#80
20060050343
2006-03-09

Apparatus and method of exposing light to a semiconductor device having a curved surface

#81
20060050255
2006-03-09

Multiple level photolithography

#82
20050271955
2005-12-08

System and method for improvement of alignment and overlay for microlithography

#83
20050244726
2005-11-03

Manufacturing method for exposure mask, generating method for mask substrate information, mask substrate, exposure mask, manufacturing method for semiconductor device and server

#84
20050146703
2005-07-07

Device manufacturing method, device manufactured thereby and a mask for use in the method

#85
20050122494
2005-06-09

Illumination compensator for curved surface lithography

#86
20050112481
2005-05-26

Exposure method and apparatus

#87
20050074906
2005-04-07

Method and systems for total focus deviation adjustments on maskless lithography systems

#88
20050068510
2005-03-31

Lithographic apparatus and device manufacturing method