177154 ⎘
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography Systems for imaging mask onto workpiece
Sub-classes:STRUCTURE, EXPOSURE APPARATUS, AND ARTICLE MANUFACTURING METHOD
#2Mask structure for deposition device, deposition device, and operation method thereof
#3Two-dimensional (2D) patterns using multiple exposures of one-dimensional (1D) photolithography masks or holographic interference lithography
#4Methods for manufacturing semiconductor devices using MOIRÉ patterns
#5Self-referencing and self-calibrating interference pattern overlay measurement
#6Method of controlling a position of a first object relative to a second object, control unit, lithographic apparatus and apparatus
#7Method and system for nanoscale data recording
#8Mask structure for deposition device, deposition device, and operation method thereof
#9Mask structure for deposition device, deposition device, and operation method thereof
#10Method and system for nanoscale data recording
#11Method of and apparatus for in-situ repair of reflective optic
#12Exposure apparatus and article manufacturing method
#13Self-referencing and self-calibrating interference pattern overlay measurement
#14Grating structure, manufacturing method thereof and display device
#15Evaluation method, exposure method, and method for manufacturing an article
#16Self-referencing and self-calibrating interference pattern overlay measurement
#17System and method for producing an optical mask for surface microtexturing, and surface microtexturing plant and method
#18Substrate and preparation method therefor, and display panel
#19Overlay mark structures
#20Method For Adjusting A Projection Objective
#21IMAGING OPTICAL SYSTEM
#22Energy controller for excimer-laser silicon crystallization
#23Reflective optical element and optical system for EUV lithography having proportions of substances which differ across a surface
#24Mask and method of fabricating display device using the mask
#25Detection apparatus, pattern forming apparatus, obtaining method, detection method, and article manufacturing method
#26UV mask device and method for using the same
#27Substrate with multilayer reflective film, mask blank, transfer mask and method of manufacturing semiconductor device
#28Method for adjusting a projection objective
#29Lithographic apparatus and method
#30Mask and method of fabricating display device using the mask
#31Substrate with multilayer reflective film, mask blank, transfer mask and method of manufacturing semiconductor device
#32Photostructured chemical devices and methods for making same
#33Data tuning for fast computation and polygonal manipulation simplification
#34Anamorphically imaging projection lens system and related optical systems, projection exposure systems and methods
#35Lithographic apparatus and method
#36Method for evaluating and improving pupil luminance distribution, illumination optical system and adjustment method thereof, exposure apparatus, exposure method, and device manufacturing method
#37Mirror arrangement for an EUV projection exposure apparatus, method for operating the same, and EUV projection exposure apparatus
#38Method of extreme ultraviolet lithography projection objective
#39Method for adjusting a projection objective
#40Extreme ultraviolet lithography process and mask
#41Self-aligned dynamic pattern generator device and method of fabrication
#42Arrangement for thermal actuation of a mirror in a microlithographic projection exposure apparatus
#43METHOD OF AND APPARATUS FOR IN-SITU REPAIR OF REFLECTIVE OPTIC
#44Resonator electrodes and related methods and apparatus
#45Method for collecting a sample of microorganisms from the surface of a solid material using a contactless partitioning system, and apparatus for partitioning the surface of the solid material
#46Lithographic apparatus and device manufacturing method
#47DEVICE-SPECIFIC MARKINGS
#48Chromatically corrected objective with specifically structured and arranged dioptric optical elements and projection exposure apparatus including the same
#49Anamorphically imaging projection lens system and related optical systems, projection exposure systems and methods
#50Method of structuring a photosensitive material
#51Reflective mask for EUV lithography
#52Illuminating waveguide fabrication method
#53Nanolithography system
#54Method for correcting a lithography projection objective, and such a projection objective
#55CLEANING METHOD, LIQUID IMMERSION MEMBER, IMMERSION EXPOSURE APPARATUS, DEVICE FABRICATING METHOD, PROGRAM AND STORAGE MEDIUM
#56LIQUID IMMERSION MEMBER, IMMERSION EXPOSURE APPARATUS, EXPOSING METHOD, DEVICE FABRICATING METHOD, PROGRAM, AND STORAGE MEDIUM
#57Microlithographic projection exposure apparatus
#58Reflective film interface to restore transverse magnetic wave contrast in lithographic processing
#59Lithographic apparatus, aberration detector and device manufacturing method
#60Method for correcting a lithography projection objective, and such a projection objective
#61Photolithography focus improvement by reduction of autofocus radiation transmission into substrate
#62Laser fixing device, image forming apparatus equipped with the laser fixing device, and image forming method employing the image forming apparatus
#63METHOD FOR ADJUSTING A PROJECTION OBJECTIVE
#64Photostructured chemical devices and methods for making same
#65Exposure method, exposure apparatus, photomask and method for manufacturing photomask
#66Exposure apparatus, exposure method and device fabricating method
#67Photolithography systems and associated methods of selective die exposure
#68Computer generated hologram and exposure apparatus to suppress an illumination variation and loss in light
#69Projection objective and method for optimizing a system aperture stop of a projection objective
#70Method of structuring a photosensitive material
#71Chromatically corrected objective with specifically structured and arranged dioptric optical elements and projection exposure apparatus including the same
#72Illuminating waveguide fabrication method
#73Nanolithography system
#74Illumination system for illuminating a mask in a microlithographic exposure apparatus
#75LITHOGRAPHY APPARATUS AND MANUFACTURING METHOD USING THE SAME
#76IMAGE EXPOSURE APPARATUS
#77EXPOSURE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
#78Exposure apparatus and electronic device manufacturing method
#79PROJECTION EXPOSURE APPARATUS FOR MICROLITHOGRAPHY
#80PHOTOLITHOGRAPHY FOCUS IMPROVEMENT BY REDUCTION OF AUTOFOCUS RADIATION TRANSMISSION INTO SUBSTRATE
#81Illumination system or projection objective of a microlithographic projection exposure apparatus
#82Method for producing polymers
#83Structures and methods for reducing aberration in optical systems
#84Non-Telecentric Lithography Apparatus and Method of Manufacturing Integrated Circuits
#85Gray level method for slim-based optical lithography
#86Apparatus for SLM-based optical lithography with gray level capability
#87Method of operation for SLM-based optical lithography tool
#88Microlithographic projection exposure apparatus
#89METHOD AND APPARATUS FOR MODELING A VECTORIAL POLARIZATION EFFECT IN AN OPTICAL LITHOGRAPHY SYSTEM
#90APPARATUS AND METHOD FOR TRANSFERRING FEATURES TO AN EDGE OF A WAFER
#91Reflective film interface to restore transverse magnetic wave contrast in lithographic processing
#92Lithographic apparatus and method
#93Reflective film interface to restore transverse magnetic wave contrast in lithographic processing
#94Reflective, refractive and projecting optical system; reflective, refractive and projecting device; scanning exposure device; and method of manufacturing micro device
#95Lithographic apparatus with mask to prevent exposure of peripheral exposure region of substrate
#96Ultraviolet Polarization Beam Splitter with Minimum Apodization
#97Lithographic apparatus and method
#98METHOD AND DEVICE FOR PREPARING AND/OR ANALYZING BIOCHEMICAL REACTION CARRIERS
#99Method, program product and apparatus for generating a calibrated pupil kernel and method of using the same in a lithography simulation process
#100Method for adjusting a projection objective
#101Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
#102Method and apparatus for modeling an apodization effect in an optical lithography system
#103Projection objective and method for optimizing a system aperture stop of a projection objective
#104Projection optical apparatus, exposure method and apparatus, photomask, and device and photomask manufacturing method
#105HIGHLY PURIFIED LIQUID PERFLUORO-n-ALKANES AND METHOD FOR PREPARING
#106Polarization evaluation mask, polarization evaluation method, and polarization determination device
#107Exposure method, exposure apparatus, photomask and method for manufacturing photomask
#108Method of optimizing imaging performance
#109Imprint lithographic apparatus, device manufacturing method and device manufactured thereby
#110Lithographic apparatus and device manufacturing method
#111LITHOGRAPHIC PELLICLE
#112Scanning type exposure apparatus, method of manufacturing micro-apparatus, mask, projection optical apparatus, and method of manufacturing mask
#113Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
#114Method for producing polymers
#115Method of manufacturing a device, device manufactured thereby, computer program and lithographic apparatus
#116Laser device and exposure device using the same
#117Polarization evaluation mask, polarization evaluation method, and polarization determination device
#118Nanolithography system
#119Exposure apparatus and an exposure method
#120Reflective film interface to restore transverse magnetic wave contrast in lithographic processing
#121Apparatus and method for improving detected resolution and/or intensity of a sampled image
#122Near-field photo-lithography using nano light emitting diodes
#123Support for analyte determination methods and method for producing the support
#124Method for correcting a lithography projection objective, and such a projection objective
#125$M(c)method for producing inclined flank patterns by photolithography
#126Scanning photolithography apparatus and method
#127Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
#128Illumination apparatus, projection exposure apparatus, and device fabricating method
#129Method for the production of photoresist structures
#130Lithographic apparatus and device manufacturing method
#131Mask and exposure device
#132Optical position assessment apparatus and method
#133Correction of birefringence in cubic crystalline optical systems
#134Highly purified liquid perfluoro-n-alkanes and method for preparing
#135Method of optimizing imaging performance
#136Exposure method and apparatus
#137Optical component that includes a material having a thermal longitudinal expansion with a zero crossing
#138Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
#139Multilayer reflective mirrors for EUV, wavefront-aberration-correction methods for same, and EUV optical systems comprising same
#140Method of forming optical fiber preforms
#141Lithographic apparatus and device manufacturing method
#142Lithographic alignment system and device manufacturing method
#143Microprocessing apparatus, semiconductor device manufacturing apparatus, and device manufacturing method
#144Exposure method
#145Optical member, method of manufacturing the same, and projection exposure system
#146Exposure apparatus and exposure method
#147Continuous direct-write optical lithography
#148Correction of birefringence in cubic crystalline optical systems
#149Exposure apparatus
#150Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus
#151Apparatus and methods for applying fiducial markings