177221 ⎘
Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor; Exposure apparatus for microlithography; Handling of masks or wafers Position control
Exposure apparatus, calibration method, and method of manufacturing article
#602Position-measuring device
#603Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
#604Lithographic apparatus and device manufacturing method
#605Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
#606Exposure apparatus and device manufacturing method
#607Exposure apparatus, exposure method, and device manufacturing method
#608Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
#609Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
#610Measuring method, stage apparatus, and exposure apparatus
#611Measuring method, stage apparatus, and exposure apparatus
#612Exposure method, exposure apparatus, and device manufacturing method
#613Irradiation module for a measuring apparatus
#614Lithographic apparatuses and methods for compensating for eigenmode coupling
#615Non-harmonic cyclic error compensation in interferometric encoder systems
#616Exposure apparatus, method of controlling the same and method of manufacturing device
#617Lithographic apparatus and device manufacturing method
#618Exposure apparatus
#619Ultra-precision position control device and method for determining position and attitude information associated with a 6-degree-of-freedom stage thereof
#620System having a plurality of scanning units of a position measuring device
#621System for detecting motion, lithographic apparatus and device manufacturing method
#622Interferometric apparatus for detecting 3D position of a diffracting object
#623Exposure apparatus and exposure method, and device manufacturing method with encoder of higher reliability for position measurement
#624Imprint lithography
#625Substrate placement in immersion lithography
#626Stage system and a lithographic apparatus
#627Lithographic apparatus and method
#628Encoder device, method for measuring moving amount, optical apparatus, exposure apparatus, exposure method and method for producing device
#629Thermally stable optical sensor mount
#630Compact encoder head for interferometric encoder system
#631Double pass interferometric encoder system
#632MOVABLE BODY DRIVE METHOD, MOVABLE BODY DRIVE SYSTEM, PATTERN FORMATION METHOD, PATTERN FORMING APPARATUS, EXPOSURE METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
#633Exposure apparatus
#634Two-dimension precision transfer equipment, three-dimension precision transfer equipment, and coordinate measuring machine
#635Lithographic apparatus, device manufacturing method, and method of calibrating a displacement measuring system
#636Position measurement system, lithographic apparatus and device manufacturing method
#637Movable body apparatus, movable body drive method, exposure apparatus, exposure method, and device manufacturing method
#638Exposure method and device manufacturing method measuring position of substrate stage using at least three of four encoder heads
#639Substrate handling apparatus and lithographic apparatus
#640Lithography system and method for storing positional data of a target
#641Apparatus and method of controlling chuck, and exposure apparatus and control method thereof
#642Movable body drive method, pattern formation method, exposure method, and device manufacturing method for maintaining position coordinate before and after switching encoder head
#643MOVABLE BODY DRIVE METHOD AND MOVABLE BODY DRIVE SYSTEM, PATTERN FORMATION METHOD AND APPARATUS, EXPOSURE METHOD AND APPARATUS, AND DEVICE MANUFACTURING METHOD FOR CONTINUOUS POSITION MEASUREMENT OF MOVEABLE BODY BEFORE AND AFTER SWITCHING BETWEEN SENSOR HEADS
#644Lithography system for processing a target, such as a wafer, and a method for operating a lithography system for processing a target, such as a wafer
#645Lithography system for processing a target, such as a wafer, a method for operating a lithography system for processing a target, such as a wafer and a substrate for use in such a lithography system
#646MOVABLE BODY DRIVE SYSTEM, PATTERN FORMATION APPARATUS, EXPOSURE APPARATUS AND EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
#647Environmental system including vacuum scavenge for an immersion lithography apparatus
#648Alignment of an interferometer module for use in an exposure tool
#649Interferometer module
#650Lithography system with differential interferometer module
#651Lithographic apparatus
#652Light source assembly that generates heterodyne output beams
#653Exposure method and apparatus measuring position of movable body based on information on flatness of encoder grating section
#654Exposure method and apparatus compensating measuring error of encoder due to grating section and displacement of movable body in Z direction
#655Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, position control method and position control system, and device manufacturing method
#656Interferometric heterodyne optical encoder system
#657Alignment method, alignment apparatus, and exposure apparatus
#658Method of updating calibration data and a device manufacturing method
#659Cyclic error compensation in interferometric encoder systems
#660Optical-component fabricating method and optical-component fabricating apparatus
#661Stage apparatus, exposure apparatus and device fabrication method
#662REFLECTOR, OPTICAL ELEMENT, INTERFEROMETER SYSTEM, STAGE DEVICE, EXPOSURE APPARATUS, AND DEVICE FABRICATING METHOD
#663Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, device manufacturing method, and calibration method
#664Positioning system, a lithographic apparatus and a method for positional control
#665Movable body drive method and movable body drive system, and pattern formation method and pattern formation apparatus
#666Method for determing a commutation offset and for determining a compensation map for a stage
#667Stage device and stage cleaning method
#668Method for determining a commutation offset and for determining a compensation map for a stage
#669Method of aligning a wafer stage and apparatus for performing the same
#670DETECTION DEVICE, MOVABLE BODY APPARATUS, PATTERN FORMATION APPARATUS AND PATTERN FORMATION METHOD, EXPOSURE APPARATUS AND EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
#671Method for Calibrating a Target Surface of a Position Measurement System, Position Measurement System, and Lithographic Apparatus
#672Lithographic apparatus having an encoder type position sensor system
#673Method and apparatus for measuring displacement of a sample using a wire grid polarizer to generate interference light
#674Positioning apparatus judging moving method to control positioning timing
#675Exposure apparatus, movable body apparatus, flat-panel display manufacturing method, and device manufacturing method
#676Positioning apparatus, positioning method, and storage medium
#677Lithographic apparatus and device manufacturing method
#678Substrate placement in immersion lithography
#679Stage apparatus, lithographic apparatus and method of positioning an object table
#680Two dimensional encoder system and method
#681Position control system, lithographic apparatus, and method to control a position of a movable object
#682Variable reluctance device, stage apparatus, lithographic apparatus and device manufacturing method
#683Lithographic apparatus and method
#684Method of adjusting speed and/or routing of a table movement plan and a lithographic apparatus
#685Lithographic apparatus and device manufacturing method
#686Measurement system, method and lithographic apparatus
#687Lithographic apparatus
#688Position sensor and lithographic apparatus
#689Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method
#690Measuring apparatus and method, processing apparatus and method, pattern forming apparatus and method, exposure apparatus and method, and device manufacturing method
#691Movable body drive method and system, pattern formation method and apparatus, exposure method and apparatus for driving movable body based on measurement value of encoder and information on flatness of scale, and device manufacturing method
#692Exposure apparatus, exposure method, and method of manufacturing device
#693Positioning apparatus
#694Pattern generators, calibration systems and methods for patterning workpieces
#695Lithographic apparatus and device manufacturing method
#696Lithographic apparatus and device manufacturing method
#697Lithographic apparatus and method for measuring a position
#698Lithographic apparatus and method for correcting a position of a stage of a lithographic apparatus
#699Substrate table, a lithographic apparatus and a method involving an encoder plate
#700Exposure apparatus and method for producing device
#701Assembly comprising a conditioning system and at least one object, a conditioning system, a lithographic apparatus and methods
#702Movable body drive method, movable body apparatus, exposure method, exposure apparatus, and device manufacturing method
#703Displacement measurement device, exposure apparatus, and working device
#704Measurement system and lithographic apparatus for measuring a position dependent signal of a movable object
#705Maskless exposure apparatus and pattern compensation method using the same
#706STAGE APPARATUS, EXPOSURE APPARATUS, DRIVING METHOD, EXPOSING METHOD, AND DEVICE FABRICATING METHOD
#707EXPOSURE APPARATUS, EXPOSING METHOD, AND DEVICE FABRICATING METHOD
#708Exposure aparatus and method of manufacturing device to avoid collision between an elevating member of a substrate stage and a conveyance arm
#709Lithographic apparatus and device manufacturing method
#710STAGE APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATING METHOD
#711Exposure apparatus and device manufacturing method measuring position of substrate stage using at least three of four encoder heads
#712CALIBRATION METHOD AND LITHOGRAPHIC APPARATUS USING SUCH A CALIBRATION METHOD
#713STAGE APPARATUS, EXPOSURE APPARATUS, DRIVING METHOD, EXPOSING METHOD, AND DEVICE FABRICATING METHOD
#714Lithographic apparatus and device manufacturing method of applying a pattern to a substrate using sensor and alignment mark
#715EXPOSURE APPARATUS, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
#716Lithographic apparatus and device manufacturing method
#717Lithographic apparatus and method for calibrating the same
#718EXPOSURE APPARATUS, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
#719Exposure method, exposure apparatus, and device manufacturing method
#720Exposure apparatus, exposure method, and device manufacturing method
#721MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
#722Exposure method, exposure apparatus, and device manufacturing method
#723Environmental system including vacuum scavenge for an immersion lithography apparatus
#724Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
#725Exposure apparatus, exposure method, and device manufacturing method measuring position of substrate stage by switching between encoder and interferometer
#726Exposure apparatus, exposure method, and method for producing device
#727Method and apparatus for measuring of masks for the photo-lithography
#728Projection exposure system for microlithography with a measurement device
#729EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
#730Exposure apparatus, exposure method and device manufacturing method
#731Exposure apparatus and device manufacturing method
#732Lithographic apparatus and device manufacturing method
#733Exposure apparatus and device manufacturing method
#734Exposure apparatus and device manufacturing method
#735Optical imaging arrangement
#736Imprint Lithography Apparatus and Method
#737Movable body system, pattern formation apparatus, exposure apparatus and exposure method, and device manufacturing method
#738Lithographic apparatus and device manufacturing method
#739Object exchange method, exposure method, carrier system, exposure apparatus, and device manufacturing method
#740Lithographic apparatus and device manufacturing method
#741Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
#742EXPOSURE APPARATUS, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
#743Folded Optical Encoder and Applications for Same
#744Interferometric apparatus for detecting 3D position of a diffracting object
#745DISPLACEMENT DEVICE WITH PRECISION MEASUREMENT
#746Substrate Handling Structure
#747Stage device and stage cleaning method
#748Calibration of a position measuring device of an optical device
#749Lithographic apparatus and method for calibrating the same
#750Deformation measuring apparatus, exposure apparatus, jig for the deformation measuring apparatus, position measuring method and device fabricating method
#751Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
#752Lithographic apparatus with gas pressure means for controlling a planar position of a patterning device contactless
#753Exposure apparatus, exposure method, device manufacturing method, and carrier method
#754Exposure apparatus, exposure method, and device manufacturing method
#755Exposure apparatus including positional measurement system of movable body, exposure method of exposing object including measuring positional information of movable body, and device manufacturing method that includes exposure method of exposing object, including measuring positional information of movable body
#756Lithographic apparatus, and patterning device for use in a lithographic process
#757Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
#758Lithographic apparatus and device manufacturing method having a barrier and/or a contamination removal device for a sensor and/or grating
#759Wavelength shift measuring apparatus, optical source apparatus, interference measuring apparatus, exposure apparatus, and device manufacturing method
#760Method for determination of residual errors
#761Interferometer system for monitoring an object
#762Lithographic apparatus and device manufacturing method
#763LITHOGRAPHIC APPARATUS AND HUMIDITY MEASUREMENT SYSTEM
#764Movable body apparatus, movable body drive method, exposure apparatus, exposure method, and device manufacturing method
#765Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
#766Movable body apparatus, movable body drive method, exposure apparatus, exposure method, and device manufacturing method
#767Lithographic apparatus and device manufacturing method
#768POSITION MEASURING MODULE, POSITION MEASURING APPARATUS, STAGE APPARATUS, EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
#769Stage apparatus, exposure apparatus, and device fabricating method
#770Methods and systems for interferometric analysis of surfaces and related applications
#771EXPOSURE APPARTUS, EXPOSURE METHOD AND METHOD OF MANUFACTURING DISPLAY PANEL SUBSTRATE
#772Displacement measurement system having a prism, for displacement measurement between two or more gratings
#773Method and apparatus for measuring displacement of a sample to be inspected using an interference light
#774Multi nozzle proximity sensor employing common sensing and nozzle shaping
#775Optical position sensor, a position sensitive detector, a lithographic apparatus and a method for determining an absolute position of a movable object to be used in a relative position measurement system
#776Laser interferometer systems and methods with suppressed error and pattern generators having the same
#777Interferometer calibration system and method
#778Lithographic apparatus and device manufacturing method
#779ALGORITHM CORRECTING FOR CORRECTION OF INTERFEROMETER FLUCTUATION
#780Lithographic apparatus and calibration method
#781Damping apparatus and exposure apparatus
#782Lithographic apparatus, device manufacturing method and device manufactured thereby
#783Optical member, interferometer system, stage apparatus, exposure apparatus, and device manufacturing method
#784Exposure apparatus and method of manufacturing device
#785EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
#786Movable body system, movable body drive method, pattern formation apparatus, pattern formation method, exposure apparatus, exposure method, and device manufacturing method
#787Stage device, pattern formation apparatus, exposure apparatus, stage drive method, exposure method, and device manufacturing method
#788Exposure apparatus, exposure method, and device manufacturing method
#789Exposure apparatus, exposure method, and device manufacturing method
#790Stage system and lithographic apparatus comprising such stage system
#791Movable body apparatus, exposure apparatus and pattern formation apparatus, and device manufacturing method
#792Compact Littrow encoder
#793Position control system, a lithographic apparatus and a method for controlling a position of a movable object
#794Stage system calibration method, stage system and lithographic apparatus comprising an encoder measurement system to measure position of stage system
#795Position measuring system and position measuring method, Movable body apparatus, movable body drive method, exposure apparatus and exposure method, pattern forming apparatus, and device manufacturing method
#796Encoder-type measurement system, lithographic apparatus and method to detect an error on or in a grid or grating of an encoder-type measurement system
#797Lithographic apparatus, stage system and stage control method
#798Measuring method, stage apparatus, and exposure apparatus
#799Exposure apparatus, exposure method, and device manufacturing method
#800Exposure apparatus and device manufacturing method
#801Lithographic apparatus and method for calibrating the same
#802Exposure apparatus, exposure method, and device manufacturing method having encoders to measure displacement between optical member and measurement mount and between measurement mount and movable body
#803Movable support, position control system, lithographic apparatus and method of controlling a position of an exchangeable object
#804POSITIONING APPARATUS, EXPOSURE APPARATUS, AND METHOD OF MANUFACTURING DEVICE
#805Movable body drive system, pattern formation apparatus, exposure apparatus and exposure method, and device manufacturing method
#806Movable body drive method and apparatus, exposure method and apparatus, pattern formation method and apparatus, and device manufacturing method
#807Environmental system including vacuum scavenge for an immersion lithography apparatus
#808Lithographic apparatus with an encoder arranged for defining a zero level
#809Movable body system, pattern formation apparatus, exposure apparatus and measurement device, and device manufacturing method
#810Exposure apparatus and exposure method
#811Method of transferring a substrate, transfer system and lithographic projection apparatus
#812OPTICAL SYSTEM FOR DETECTING MOTION OF A BODY
#813Exposure apparatus, exposure method, and device manufacturing method
#814Method of transferring a substrate, transfer system and lithographic projection apparatus
#815DRAWING DEVICE, EXPOSURE DEVICE, AND DRAWING METHOD
#816Movable-body apparatus, exposure apparatus, exposure method, and device manufacturing method
#817Stage system, lithographic apparatus including such stage system, and correction method
#818Movable body apparatus, pattern formation apparatus and exposure apparatus, and device manufacturing method
#819Movable body apparatus, pattern formation apparatus and exposure apparatus, and device manufacturing method
#820Movable body apparatus, pattern formation apparatus and exposure apparatus, and device manufacturing method
#821Movable body apparatus, pattern formation apparatus and exposure apparatus, and device manufacturing method with measurement device to measure movable body in Z direction
#822Exposure apparatus and device manufacturing method
#823Lithographic apparatus and device manufacturing method
#824Methods and systems for interferometric analysis of surfaces and related applications
#825Lithographic apparatus and device manufacturing method
#826Movable body drive method and movable body drive system, and pattern formation method and pattern formation apparatus
#827Lithographic apparatus and exposure method
#828Laminar Flow Gas Curtains for Lithographic Applications
#829ALIGNMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD USING EXPOSURE APPARATUS
#830Integrated circuit manufacturing methods with patterning device position determination
#831Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method for continuous position measurement of movable body before and after switching between sensor heads
#832Position measurement system, exposure apparatus, position measuring method, exposure method and device manufacturing method, and tool and measuring method
#833Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method
#834MOVABLE BODY DRIVE METHOD AND MOVABLE BODY DRIVE SYSTEM, PATTERN FORMATION METHOD AND APPARATUS, DEVICE MANUFACTURING METHOD, AND PROCESSING SYSTEM
#835Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, device manufacturing method, and measuring method
#836Movable body drive method and movable body drive system, pattern formation method and apparatus, and device manufacturing method
#837Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, device manufacturing method, measuring method, and position measurement system
#838Atmosphere-density-fluctuation monitors for interferometer beams, and atmosphere-supplying systems comprising same
#839Positioning apparatus, exposure apparatus, and device manufacturing method
#840Movable body drive method, pattern formation method, exposure method, and device manufacturing method for maintaining position coordinate before and after switching encoder head
#841WORK POSITION INFORMATION OBTAINING METHOD AND APPARATUS
#842Movable body drive method and movable body drive system, pattern formation method and pattern formation apparatus, and device manufacturing method
#843EXPOSURE APPARATUS, EXPOSURE METHOD, AND METHOD FOR MANUFACTURING DISPLAY PANEL SUBSTRATE
#844Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, position control method and position control system, and device manufacturing method
#845Lithographic apparatus and position sensor
#846Exposure method, exposure apparatus, and method for producing device
#847Surface level detection method, exposure apparatus, and device manufacturing method
#848Detection device, movable body apparatus, pattern formation apparatus and pattern formation method, exposure apparatus and exposure method, and device manufacturing method
#849Lithographic apparatus having encoder type position sensor system
#850System for detecting motion of a body
#851Method and system for operating an air gauge at programmable or constant standoff
#852Lithographic projection apparatus and method for controlling a support structure
#853Laser Interferometer Mirror Assembly
#854Control system, lithographic projection apparatus, method of controlling a support structure, and a computer program product
#855Calibrating a lithographic apparatus
#856Displacement measurement sensor head and system having measurement sub-beams comprising zeroth order and first order diffraction components
#857Stage controller and exposure method in which position of the stage is controlled based on position measurements of first and second laser interferometers
#858STAGE APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION METHOD
#859Motion measurement and synchronization using a scanning interferometer with gratings
#860Exposure method, exposure apparatus, and method for producing device
#861Exposure method, exposure apparatus, and method for producing device
#862Interferometric position-measuring devices and methods
#863Lithographic apparatus having an encoder position sensor system
#864Multiple-degree of freedom interferometer with compensation for gas effects
#865Stage assembly with measurement system initialization, vibration compensation, low transmissibility, and lightweight fine stage
#866Lithographic apparatus and sensor calibration method
#867Exposure apparatus, method of controlling the same, and manufacturing method
#868Measurement system, lithographic apparatus and method for measuring a position dependent signal of a movable object
#869Lithographic apparatus having feedthrough control system
#870Stage Apparatus and Exposure Apparatus
#871Exposure Apparatus and method for producing device
#872Displacement measurement system
#873Exposure apparatus and method for producing device
#874Exposure apparatus and method for producing device
#875Movable body drive method and system, pattern formation method and apparatus, exposure method and apparatus for driving movable body based on measurement value of encoder and information on flatness of scale, and device manufacturing method
#876Optical imaging arrangement
#877Exposure method, exposure apparatus, method for producing device, and method for evaluating exposure apparatus
#878Interferometer air-fluctuation monitors and systems comprising same
#879Positioning device having dynamically isolated frame, and lithographic device provided with such a positioning device
#880Apparatus configured to position a workpiece
#881Interferometer system for monitoring an object
#882Distance measuring interferometer and encoder metrology systems for use in lithography tools
#883Exposure apparatus, exposure method, and method for producing device
#884Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
#885Position measurement method
#886Multiple-degree of freedom interferometer with compensation for gas effects
#887Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
#888Stage apparatus, control system, exposure apparatus, and device manufacturing method
#889Position measuring method, position measuring system, and exposure apparatus
#890Exposure apparatus configured to minimize effects of mechanism for measuring stage position on peripheral mechanism and device-manufacturing method
#891Positioning apparatus, exposure apparatus, and device manufacturing method
#892Method and system for predicting and correcting signal fluctuations of an interferometric measuring apparatus
#893Substrate placement in immersion lithography
#894Movable body drive system and movable body drive method, pattern formation apparatus and method, exposure apparatus and method, device manufacturing method, and decision-making method
#895Lithographic apparatus and device manufacturing method
#896Lithographic apparatus and method
#897Lithographic apparatus and method
#898Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, and device manufacturing method
#899Movable body system, pattern formation apparatus, exposure apparatus and exposure method, and device manufacturing method
#900Movable body drive method and movable body drive system, pattern formation method and apparatus, exposure method and apparatus, device manufacturing method, and calibration method