191654 ⎘
Method of fabricating an integrated circuit with optimized pattern density uniformity
#602System and method for integrated circuit manufacturing
#603Stretch dummy cell insertion in finFET process
#604ESD protection circuit cell
#605Automated design and manufacturing feedback for three dimensional (3D) printability
#606Automated metrology and model correction for three dimensional (3D) printability
#607Method and system for overlay control
#608Transformer synthesis and optimization in integrated circuit design
#609Shared channel masks in on-product test compression system
#610Shared channel masks in on-product test compression system
#611Dynamic yield prediction
#612Method for printing three-dimensional parts with part strain orientation
#613Minimizing harmful effects caused by reticle defects by re-arranging IC layout locally
#614Synthesizing low mask error enhancement factor lithography solutions
#615Generating guiding patterns for directed self-assembly
#616Method and apparatus for controlling printability of a 3-dimensional model
#617Common template for electronic article
#618Invariant sharing to speed up formal verification
#619Resistive capacitance determination method for multiple-patterning-multiple spacer integrated circuit layout
#620Placing transistors in proximity to through-silicon vias
#621Layout design system for generating layout design of semiconductor device
#622Layout optimization for integrated circuit design
#623Area array device connection structures with complimentary warp characteristics
#624Method for generating layout of photomask
#625Methods of patterning wafers using self-aligned double patterning processes
#626Method for creating three dimensional lattice structures in computer-aided design models for additive manufacturing
#627Method to improve transistor matching
#628System for and method of combining CMOS inverters of multiple drive strengths to create tune-able clock inverters of variable drive strengths in hybrid tree-mesh clock distribution networks
#629Performance-driven and gradient-aware dummy insertion for gradient-sensitive array
#630Method of designing impedance transformation circuit
#631WEAK POINTS AUTO-CORRECTION PROCESS FOR OPC TAPE-OUT
#632Pattern-based via redundancy insertion
#633Method of making semiconductor device and system for performing the same
#634Techniques for optimizing orientation of models for three-dimensional printing
#635Techniques for performing cross-sectional stress analysis for three-dimensional objects
#636Generating support material for three-dimensional printing
#637Generating support material for three-dimensional printing
#638Simulation method, simulation program, process control system, simulator, process design method, and mask design method
#639Layout design for electron-beam high volume manufacturing
#640Methods for cell phasing and placement in dynamic array architecture and implementation of the same
#641Determination Of Electromigration Features
#642Grouping layout features for directed self assembly
#643Three-dimensional object development
#644Canonical forms of layout patterns
#645Method and system for repairing wafer defects
#646Method for implementing design-for-manufacturability checks
#647System and method for CNC machines and software
#648Method of determining if layout design is N-colorable
#649Chip level critical point analysis with manufacturer specific data
#650Method of making semiconductor device and a control system for performing the same
#651METHOD, PROGRAM PRODUCT AND APPARATUS FOR PERFORMING DOUBLE EXPOSURE LITHOGRAPHY
#652Method and system for multi-patterning layout decomposition
#653Rule and lithographic process co-optimization
#654Hierarchical Approach to Triple Patterning Decomposition
#655Modeling multi-patterning variability with statistical timing
#656Layout optimization for integrated circuit design
#657Method for forming circular patterns on a surface
#658Optimization of source, mask and projection optics
#659Layout content analysis for source mask optimization acceleration
#660Integrated circuit layout design methodology with process variation bands
#661Method and system for overlay control
#662EVALUATION SAMPLE, METHOD OF OBTAINING ETCHING YIELD FUNCTION AND SIMULATION METHOD
#663Detecting and displaying multi-patterning fix guidance
#664Mask design and decomposition for sidewall image transfer
#665Scaling of bipolar transistors
#666Method for manufacturing EUV masks minimizing the impact of substrate defects
#667Graphical specification and constraint language for developing programs for hardware implementation and use
#668Method and system for design of a reticle to be manufactured using variable shaped beam lithography
#669Method for adjusting target layout based on intensity of background light in etch mask layer
#670Method and apparatus for a diffusion bridged cell library
#671Verification support method, recording medium having stored verification support program therein, and verification support apparatus
#672Device for assisting with setting of manufacturing conditions for silica glass crucible, device for assisting with setting of manufacturing conditions for mold for manufacturing silica glass crucible, device for assisting with condition setting for pulling up monocrystalline silicon using silica glass crucible
#673Information processing apparatus, information processing method, program, and board manufacturing system
#674MODULAR PLATFORM FOR INTEGRATED CIRCUIT DESIGN ANALYSIS AND VERIFICATION
#675Semiconductor device and method for making the same using semiconductor fin density design rules
#676Stretch dummy cell insertion in FinFET process
#677Semiconductor chip including region including linear-shaped conductive structures forming gate electrodes and having electrical connection areas arranged relative to inner region between transistors of different types and associated methods
#678Method of performing circuit simulation and generating circuit layout
#679Common template for electronic article
#680Topography driven OPC and lithography flow
#681Method and apparatus for performing optical proximity and photomask correction
#682Design-for-manufacturing—design-enabled-manufacturing (DFM-DEM) proactive integrated manufacturing flow
#683Area array device connection structures with complimentary warp characteristics
#684Integrated circuit device, method for producing mask layout, and program for producing mask layout
#685Semiconductor chip including integrated circuit defined within dynamic array section
#686Variation factor assignment
#687Double-mask photolithography method minimizing the impact of substrate defects
#688Layout decomposition for triple patterning lithography
#689Layout method and system for multi-patterning integrated circuits
#690Method and system for forming high accuracy patterns using charged particle beam lithography
#691Arrayed imaging systems having improved alignment and associated methods
#692Adjustable dummy fill
#693Method and system for designing 3D semiconductor package
#694Pre-colored methodology of multiple patterning
#695Enforcement of semiconductor structure regularity for localized transistors and interconnect
#696Method and system for identifying fastener placement zones
#697Performance-driven and gradient-aware dummy insertion for gradient-sensitive array
#698Lithography aware leakage analysis
#699Placing transistors in proximity to through-silicon vias
#700System and method for critical path replication
#701Fragmentation point and simulation site adjustment for resolution enhancement techniques
#702Setting method and information processing apparatus
#703Object design data model
#704Compensation for patterning device deformation
#705Layout method for printed circuit board
#706Systems and methods for integrated circuit C4 ball placement
#707Nesting using rigid body simulation
#708Pre-colored methodology of multiple patterning
#709Methodology on developing metal fill as library device
#710Compression method and system for use with multi-patterning
#711Fabrication of materials with desired characteristics from base materials having determined characteristics
#712Semiconductor structure and method for fabricating semiconductor layout
#713Dummy patterns and method for generating dummy patterns
#714Dummy patterns and method for generating dummy patterns
#715Low-voltage swing circuit modifications
#716Methods for cell phasing and placement in dynamic array architecture and implementation of the same
#717Method of decomposing layout of semiconductor device
#718Pattern-dependent proximity matching/tuning including light manipulation by projection optics
#719Cross-coupling based design using diffusion contact structures
#720Soft error and radiation hardened sequential logic cell
#721Method for creating a photolithography mask
#722Microelectromechanical system design and layout
#723Method and system for design of a reticle to be manufactured using variable shaped beam lithography
#724Method of managing electro migration in logic designs and design structure thereof
#725System and method for lithography simulation
#726Modified design rules to improve device performance
#727Semiconductor device design system and method of using the same
#728Systems and methods for creating frequency-dependent netlist
#729Analysis optimizer
#730Mobile applicator for thermo pavement marking
#731Method for increasing the robustness of a double patterning router used to manufacture integrated circuit devices
#732Process aware metrology
#733Method and apparatus for optimizing refrigeration systems
#734Structure and method for E-beam writing
#735Semiconductor chip including a chip level based on a layout that includes both regular and irregular wires
#736Dummy gate cell, cell-based IC, and portable device
#737Generating capacitance look-up tables for wiring patterns in the presence of metal fills
#738Generation method, storage medium, and information processing apparatus
#739Supporting device, design support method and computer-readable recording medium
#740Rapid prototyping process and device using parallel computation for working points
#741Circuit assembly yield prediction with respect to manufacturing process
#742Processor for executing wide operand operations using a control register and a results register
#743ESD protection circuit cell
#744Semiconductor device and layout design method for the same
#745Circuits with linear finfet structures
#746Parameter matching hotspot detection
#747Method for checking and fixing double-patterning layout
#748Layout content analysis for source mask optimization acceleration
#749Metal density aware signal routing
#750Method and apparatus to enable a selective push process during manufacturing to improve performance of a selected circuit of an integrated circuit
#751Robust design using manufacturability models
#752Method and system for automatic generation of solutions for circuit design rule violations
#753Lens and method of forming shape of lens based on calculated normal direction of light incident points on virtual light incident surface
#754Developing programs for hardware implementation in a graphical specification and constraint language
#755Semiconductor integrating circuit layout pattern generating apparatus and method
#756Simulation parameter correction technique
#757Simultaneous multi-layer fill generation
#758Scaling of bipolar transistors
#759Integrated circuit device with reduced leakage and method therefor
#760Optimizing bias points for a semiconductor device
#761Dummy pattern performance aware analysis and implementation
#762Adjustable dummy fill
#763Cell circuit and layout with linear finfet structures
#764Integrated circuit having adaptive via sizing
#765Methods for controlling microloading variation in semiconductor wafer layout and fabrication
#766Integrated design-for-manufacturing platform
#767Method and system for automatically extracting layout design patterns for custom layout design reuse through interactive recommendations
#768Calculating and extracting joule-heating and self-heat induced temperature on wire segments for chip reliability
#769Tree-routing for specific areas of an electronic design
#770EM-compliance topology in a tree router
#771Arrangement and method for facilitating electronics design in connection with 3D structures
#772Digital device protective artwork case method and device
#773Serial pixel processing with storage for overlapping texel data
#774Light source and method for making a light source
#775Interactive platform to predict mismatch variation and contribution when adjusting component parameters
#776Integrated circuit simulation with data persistency for efficient memory usage
#777Integrated circuit simulation with efficient memory usage
#778Analog design tool, cell set, and related methods, systems and equipment
#779Timing optimization driven by statistical sensitivites
#780Direct probing characterization vehicle for transistor, capacitor and resistor testing
#781Method for manufacturing custom in-ear monitor with decorative faceplate
#782Methods, systems, and articles of manufacture for implementing a physical design of an electronic design with DFM and design specification awareness
#783Model-based definition for machining aircraft parts
#784Method and system for implementing efficient trim data representation for an electronic design
#785Breast shape visualization and modeling tool
#786Methods, systems, and articles of manufacture for implementing an electronic design with disconnected field domains
#787Methods, systems, and computer program product for a bottom-up electronic design implementation flow and track pattern definition for multiple-patterning lithographic techniques
#788Methods, systems, and computer program product for implementing DRC clean multi-patterning process nodes with lateral fills in electronic designs
#789SRAM cell layout structure and devices therefrom
#790Method and system for creating improved routing polygon abstracts
#791Lithography mask functional optimization and spatial frequency analysis
#792Statistical overlay error prediction for feed forward and feedback correction of overlay errors, root cause analysis and process control
#793Based device risk assessment
#794OPC method with higher degree of freedom
#795Optimized design verification of an electronic circuit
#796Computational thermal analysis during microchip design
#797Managing aging of silicon in an integrated circuit device