198295 ⎘
Recording or reproducing using a method not covered by one of the main groups - ; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information; Disposition or mounting of heads or record carriers with provision for moving the heads or record carriers relatively to each other or for access to indexed parts without effectively imparting a relative movement with provision for moving the heads or record carriers relatively to each other switching at least one head in operating function; Controlling the relative spacing to keep the head operative, e.g. for allowing a tunnel current flow
Multiple probe detection and actuation
#2Multiple probe actuation
#3Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material
#4Double electrode cantilever actuation for seek-scan-probe data access
#5Method for forming composites of sub-arrays of fullerene nanotubes
#6Double-electrode cantilever actuation for seek-scan-probe data access
#7Data storage device and method for operating a data storage system
#8Seek and scan probe (SSP) cantilever stop structures
#9Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
#10Folded beam suspension for probe
#11Array of fullerene nanotubes
#12Method for cutting fullerene nanotubes
#13Double electrode cantilever actuation for seek-scan-probe data access
#14Method for forming a patterned array of fullerene nanotubes
#15Device and method for mechanical data storage device operation and control
#16Methods for producing composites of fullerene nanotubes and compositions thereof
#17Seek-scan probe (SSP) including see-saw scan probe with redundant tip
#18Scanning probe microscopy inspection and modification system
#19Method for producing a catalyst support and compositions thereof
#20Fullerene nanotube compositions
#21Method for purification of as-produced fullerene nanotubes
#22Writing and reading of data in probe-based data storage devices
#23Writing and reading of data in probe-based data storage devices
#24Probe-based data storage devices
#25CANTILEVER WITH CONTROL OF VERTICAL AND LATERAL POSITION OF CONTACT PROBE TIP
#26Storage system using an array of electro-magnetic sensors
#27CANTILEVER WITH CONTROL OF VERTICAL AND LATERAL POSITION OF CONTACT PROBE TIP
#28Storage system using electromagnetic array
#29Continuous fiber of fullerene nanotubes
#30Method for producing self-assembled objects comprising fullerene nanotubes and compositions thereof
#31Scanning probe microscopy inspection and modification system
#32Nanometer scale data storage device and associated positioning system
#33Data recording using carbon nanotube electron sources
#34Movable terminal in a two terminal memory array
#35Data storage device and method for operating a data storage device
#36Writing and reading of data in probe-based data storage devices
#37Recording/reproducing head, method of producing the same, recording apparatus and reproducing apparatus
#38Recording/reproducing apparatus with double-sided beam type probe
#39Temperature sensing apparatus and methods for servo and write compensation in a data recording module
#40Method for mechanical data storage device operation and control
#41Method for forming an array of single-wall carbon nanotubes in an electric field and compositions thereof
#42Method for forming a patterned array of single-wall carbon nanotubes
#43Storage device including a probe having an electrically conductive tip portion for electrical contact with a storage medium
#44Storage device having a probe with a first plate that cooperates with a second plate to provide a variable capacitance
#45Method and apparatus for storing and reading information in a ferroelectric material
#46Nanometer scale data storage device and associated positioning system
#47Scanning probe microscopy inspection and modification system
#48Data readout arrangement
#49Contact probe storage FET sensor
#50Contact probe storage sensor pod
#51Electrostatic actuator for contact probe storage device
#52Recording/reproducing head, method of producing the same, and recording apparatus and reproducing apparatus
#53Data storage device including conductive probe and ferroelectric storage medium
#54Data storage device
#55Storage device having a probe and a storage cell with moveable parts
#56Data storage device and a method of reading data in a data storage device
#57Nanoscale digital data storage device
#58Storage device having a probe with plural tips