199640 ⎘
Erasable programmable read-only memories electrically programmable; Auxiliary circuits, e.g. for writing into memory; Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention; Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells Circuits or methods to recover overerased nonvolatile memory cells detected during erase verification, usually by means of a "soft" programming step
DATA STORAGE DEVICE AND OPERATING METHOD THEREOF
#2DATA STORAGE DEVICE AND OPERATING METHOD THEREOF
#3PROGRAMMING MEMORY DEVICES
#4FLASH MEMORY FOR REDUCING RELIABILITY DEGRADATION OF OS DATA DUE TO SMT PROCESS
#5DATA STORAGE DEVICE AND OPERATING METHOD THEREOF
#6DATA STORAGE DEVICE AND OPERATING METHOD THEREOF
#7NONVOLATILE MEMORY DEVICE AND METHOD OF DETECTING DEFECTIVE MEMORY CELL BLOCK OF NONVOLATILE MEMORY DEVICE
#8Systems and methods for adapting sense time
#9Edge word line concurrent programming with verify for memory apparatus with on-pitch semi-circle drain side select gate technology
#10Semi-circle drain side select gate maintenance by selective semi-circle dummy word line program
#11Memory programming operation comprising preprogramming memory cells
#12Systems and methods for modeless read threshold voltage estimation
#13DATA STORAGE DEVICE AND OPERATING METHOD THEREOF
#14Memory system and read method
#15Dual verify for quick charge loss reduction in memory cells
#16Almost ready memory management
#17Random value generator
#18Method and system for improving word line data retention for memory blocks
#19Nonvolatile memory device for performing double sensing operation
#20Secure erase for data corruption
#21Memory device and method of operating the memory device
#22Nonvolatile memory device and method of detecting defective memory cell block of nonvolatile memory device
#23Memory apparatus and associated control method for reducing erase disturb of non-volatile memory
#24Data storage device and operating method thereof
#25Secure erase for data corruption
#26Page buffer, a memory device having page buffer, and a method of operating the memory device
#27Memory device and method of operating the memory device
#28Method for recovering EEPROM of slave device by PLC communication module
#29Post write erase conditioning
#30Data storage device and operating method thereof
#31Secure erase for data corruption
#32Memory device and operating method thereof
#33Erase and soft program for vertical NAND flash
#34Internal copy to handle NAND program fail
#35Enhanced erase retry of non-volatile storage device
#36Secure erase for data corruption
#37Memory device and operating method thereof
#38Memory device and method of operating the same
#39Non-volatile semiconductor memory device
#40Memory array, and method for reading, programming and erasing memory array
#41Adaptive operation of 3D memory
#42Erase and soft program for vertical NAND flash
#43Weak erase after programming to improve data retention in charge-trapping memory
#44Low latency memory erase suspend operation
#45Method for Performing Erase Operation in Non-Volatile Memory
#46Semiconductor device
#47Erase method for flash
#48Fractured erase system and method
#49Data protection for unexpected power loss
#50SOLID STATE STORAGE DEVICE AND CONTROLLING METHOD THEREOF
#51Multi-pass soft programming
#52Method and apparatus for leakage suppression in flash memory in response to external commands
#53Dynamic detection method for latent slow-to-erase bit for high performance and high reliability flash memory
#54Erase and soft program for vertical NAND flash
#55Bit error rate based wear leveling for solid state drive memory
#56Block and page level bad bit line and bits screening methods for program algorithm
#57Cycling endurance extending for memory cells of a non-volatile memory array
#58Nonvolatile memory device and a method of adjusting a threshold voltage of a ground selection transistor thereof
#59Bit error rate based wear leveling for solid state drive memory
#601T smart write
#61Method of operating non-volatile memory device
#62Method for operating non-volatile memory device
#63Method and apparatus for leakage suppression in flash memory
#64Method and apparatus for leakage suppression in flash memory in response to external commands
#65Nonvolatile semiconductor storage device
#66NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND DATA ERASE METHOD OF THE SAME
#67Semiconductor memory device comprising memory cell having charge accumulation layer and control gate and method of erasing data thereof
#68Over-erase verification and repair methods for flash memory
#69Method and apparatus for management of over-erasure in NAND-based NOR-type flash memory
#70Non-volatile memory (NVM) erase operation with brownout recovery technique
#71Semiconductor memory device having improved erase characteristic of memory cells and erase method thereof
#72Nonvolatile semiconductor memory device
#73Dynamic soft program trims
#74Nonvolatile semiconductor memory devices, data updating methods thereof, and nonvolatile semiconductor memory systems
#75Operation method and leakage controller for a memory and a memory applying the same
#76Method of programming nonvolatile memory device
#77Method of programming nonvolatile memory device
#78Nonvolatile semiconductor memory device
#79Method, apparatus, and system for erasing memory
#80NOR flash memory device and related methods of operation
#81APPARATUS AND METHODS FOR CORRECTING OVER-ERASED FLASH MEMORY CELLS
#82Nonvolatile semiconductor memory device
#83Dynamic soft program trims
#84All-bit-line erase verify and soft program verify
#85Fractured erase system and method
#86Method for conducting over-erase correction
#87All-bit-line erase verify and soft program verify
#88Nonvolatile semiconductor memory device and method for controlling the same
#89Method of programming nonvolatile memory device
#90Non volatile memory
#91Method for reducing lateral movement of charges and memory device thereof
#92Semiconductor memory device comprising memory cell having charge accumulation layer and control gate and method of erasing data thereof
#93Flash memory devices and erasing methods thereof
#94Method, apparatus, and system for erasing memory
#95Room temperature drift suppression via soft program after erase
#96Non-volatile memory having a dynamically adjustable soft program verify voltage level and method therefor
#97Systems and methods for self convergence during erase of a non-volatile memory device
#98SOURCE BIASING OF NOR-TYPE FLASH ARRAY WITH DYNAMICALLY VARIABLE SOURCE RESISTANCE
#99Non volatile memory
#100Method of performing an erase operation in a non-volatile memory device
#101Erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
#102Repetitive erase verify technique for flash memory devices
#103Scheme of semiconductor memory and method for operating same
#104Non-volatile memory device and erasing method thereof
#105Controlled boosting in non-volatile memory soft programming
#106Method of achieving zero column leakage after erase in flash EPROM
#107Nonvolatile semiconductor memory device
#108Flash memory device and erasing method thereof
#109Non-volatile memory device and associated method of erasure
#110Programming method for NAND flash
#111Method for operating non-volatile memory device
#112Reliable method for erasing a flash memory
#113Method of erasing flash memory with pre-programming memory cells only in the presence of a cell leakage
#114Nonvolatile semiconductor memory device
#115Flash memory device and related erase operation
#116Nonvolatile semiconductor memory device
#117Nonvolatile semiconductor memory device
#118Nonvolatile semiconductor memory device performing erase operation that creates narrow threshold distribution
#119Nonvolatile semiconductor storage device
#120Flash memory device with NAND architecture with reduced capacitive coupling effect
#121Systems for erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
#122Erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells
#123Soft programming non-volatile memory utilizing individual verification and additional soft programming of subsets of memory cells
#124Systems for erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells
#125Systems for soft programming non-volatile memory utilizing individual verification and additional soft programming of subsets of memory cells
#126Erasing non-volatile memory using individual verification and additional erasing of subsets of memory cells
#127Method for erasing an NROM cell
#128Semiconductor memory device and method for writing to semiconductor memory device
#129Non-volatile memory device and associated method of erasure
#130Non-volatile memory device and erasing method therefor
#131Nonvolatile semiconductor storage device
#132Method of converting contents of flash memory cells in the presence of leakage
#133Faster method of erasing flash memory
#134Erase algorithm for multi-level bit flash memory
#135Memory block erasing in a flash memory device
#136Nonvolatile semiconductor memory device
#137Non volatile memory
#138Overerase correction in flash EEPROM memory
#139Method for erasing an NROM cell
#140Method for erasing an NROM cell
#141Semiconductor memory device having memory cells with floating gates and memory cell threshold voltage control method
#142Memory block erasing in a flash memory device
#143Memory device and method using positive gate stress to recover overerased cell
#144Method for erasing an NROM cell
#145Nonvolatile semiconductor memory device
#146Method and system for improving word line data retention for memory blocks
#147Erase voltage compensation mechanism for group erase mode with bit line leakage detection method