199641 ⎘
Erasable programmable read-only memories electrically programmable; Auxiliary circuits, e.g. for writing into memory; Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention; Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells Circuits or methods to recover overprogrammed nonvolatile memory cells detected during program verification, usually by means of a "soft" erasing step
MEMORY DEVICE AND METHOD OF OPERATING THE SAME
#2Nonvolatile semiconductor memory device
#3SEMICONDUCTOR DEVICE
#4Nonvolatile semiconductor memory device
#5Short program verify recovery with reduced programming disturbance in a memory sub-system
#6Short program verify recovery with reduced programming disturbance in a memory sub-system
#7Short program verify recovery with reduced programming disturbance in a memory sub-system
#8Nonvolatile semiconductor memory device
#9Memory controller and method of operating the same
#10Memory system and non-volatile semiconductor memory
#11Nonvolatile semiconductor memory device
#12Semiconductor memory device and method of operating the same
#13Internal copy to handle NAND program fail
#14Non-volatile memory device, method for operating the same and data storage device including the same
#15Semiconductor memory device and method of operating the same
#16Nonvolatile semiconductor memory device
#17First read countermeasures in memory
#183D memory with staged-level multibit programming
#19Memory array, and method for reading, programming and erasing memory array
#20Nonvolatile semiconductor memory device
#21Temperature variation compensation
#22INTEGRATED CONTROL OF WRITE-ONCE DATA STORAGE DEVICES
#23Data storage device and method of driving the same
#24Nonvolatile semiconductor memory device
#25Weak erase after programming to improve data retention in charge-trapping memory
#26Nonvolatile semiconductor memory device
#27Methods of operating nonvolatile memory devices that support efficient error detection
#28Multi-pass soft programming
#29Memory buffer having accessible information after a program-fail
#30Nonvolatile semiconductor memory device
#31Non-volatile storage with process that reduces read disturb on end wordlines
#32Block and page level bad bit line and bits screening methods for program algorithm
#33Semiconductor memory device comprising memory cell having charge accumulation layer and control gate and method of erasing data thereof
#34Nonvolatile semiconductor memory device
#35Apparatus and method for detecting over-programming condition in multistate memory device
#36Nonvolatile semiconductor memory device and method of operating a nonvolatile memory device
#37Memory buffer having accessible information after a program-fail
#38Correcting for over programming non-volatile storage
#39Nonvolatile semiconductor memory device
#40Correcting for over programming non-volatile storage
#41Nonvolatile semiconductor memory device
#42Semiconductor memory device
#43Nonvolatile semiconductor memory device
#44Systems and methods for handling immediate data errors in flash memory
#45Correcting for over programming non-volatile storage
#46Semiconductor memory device comprising memory cell having charge accumulation layer and control gate and method of erasing data thereof
#47Flash memory devices and erasing methods thereof
#48Semiconductor memory devices that are configured to analyze read failures and related methods of operating such devices
#49Method of programming nonvolatile memory device
#50Methods of biasing a multi-level-cell memory
#51Method of performing an erase operation in a non-volatile memory device
#52Non-volatile memory device and erasing method thereof
#53Nonvolatile semiconductor memory device
#54Apparatus and method for detecting over-programming condition in multistate memory device
#55Page buffer and non-volatile memory device including the same
#56Multi-state memory having data recovery after program fail
#57Erase algorithm for multi-level bit flash memory
#58First read countermeasures in memory
#59Reduced current program verify in non-volatile memory