ClassID:

199902

G11C2211/5632 - CPC Classification

Classification description:

Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor; Indexing scheme relating to and sub-groups for features not covered by these groups; Multilevel memory reading aspects Multilevel reading using successive approximation

Recent Application in this class:
#1
20210249088
2021-08-12

Adjustable read retry order based on decoding success trend

#2
20200265903
2020-08-20

Memory system and method of operating the same

#3
20200219571
2020-07-09

Adjustable read retry order based on decoding success trend

#4
20190378576
2019-12-12

Adjustable read retry order based on decoding success trend

#5
20190122726
2019-04-25

Adaptive read threshold voltage tracking with gap estimation between adjacent read threshold voltages

#6
20190080731
2019-03-14

MEMORY DEVICE WITH MULTIPLE MEMORY ARRAYS TO FACILITATE IN-MEMORY COMPUTATION

#7
20180081575
2018-03-22

Memory system

#8
20170263320
2017-09-14

Method for writing into and reading a multi-levels EEPROM and corresponding memory device

#9
20170125089
2017-05-04

Adaptive read threshold voltage tracking with gap estimation between default read threshold voltages

#10
20150117116
2015-04-30

Method for writing into and reading a multi-levels EEPROM and corresponding memory device

#11
20140281293
2014-09-18

Method of operating memory controller and devices including memory controller

#12
20120127792
2012-05-24

Semiconductor memory having electrically erasable and programmable semiconductor memory cells

#13
20110292727
2011-12-01

Semiconductor memory having electrically erasable and programmable semiconductor memory cells

#14
20110122701
2011-05-26

Semiconductor memory having electrically erasable and programmable semiconductor memory cells

#15
20110116301
2011-05-19

State machine sensing of memory cells

#16
20110062409
2011-03-17

Phase change memory structure with multiple resistance states and methods of programming and sensing same

#17
20100271875
2010-10-28

Compensating for variations in memory cell programmed state distributions

#18
20100014351
2010-01-21

Semiconductor memory having electrically erasable and programmable semiconductor memory cells

#19
20090251952
2009-10-08

State machine sensing of memory cells

#20
20080298114
2008-12-04

Phase change memory structure with multiple resistance states and methods of programming and sensing same

#21
20080225607
2008-09-18

Division-based sensing and partitioning of electronic memory

#22
20080080228
2008-04-03

Resistive memory having shunted memory cells

#23
20080037322
2008-02-14

Semiconductor memory having electrically erasable and programmable semiconductor memory cells

#24
20060062045
2006-03-23

Semiconductor memory having electrically erasable and programmable semiconductor memory cells

#25
20050128819
2005-06-16

Electrically alterable non-volatile multi-level memory device and method of operating such a device