199737 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
Non-volatile semiconductor memory device
#302Semiconductor chip having plural penetration electrode penetrating therethrough
#303SEMICONDUCTOR STORAGE DEVICE
#304Non-volatile storage with broken word line screen and data recovery
#305Defective word line detection
#306Apparatuses, integrated circuits, and methods for measuring leakage current
#307Semiconductor device with aligned bumps
#308Method of screening static random access memories for pass transistor defects
#309Capacitance evaluation apparatuses and methods
#310Device and method for detecting resistive defect
#311Devices, methods, and systems supporting on unit termination
#312Method of detecting connection defects of memory and memory capable of detecting connection defects thereof
#313Semiconductor device, adjustment method thereof and data processing system
#314Semiconductor apparatus and testing method thereof
#315Word line fault detection
#316Infrastructure for performance based chip-to-chip stacking
#317Device and system detecting breakage in dummy bumps and method thereof
#318Detection of broken word-lines in memory arrays
#319INTERNAL WORDLINE CURRENT LEAKAGE SELF-DETECTION METHOD, DETECTION SYSTEM AND COMPUTER-READABLE STORAGE MEDIUM FOR NOR-TYPE FLASH MEMORY DEVICE
#320Test method for screening local bit-line defects in a memory array
#321SEMICONDUCTOR DEVICE INCLUDING PLURAL CORE CHIPS AND INTERFACE CHIP THAT CONTROLS THE CORE CHIPS AND CONTROL METHOD THEREOF
#322Dynamic random access memory address line test technique
#323Nonvolatile semiconductor memory
#324Semiconductor memory device having memory block configuration
#325Power supply circuit system
#326Setting a reference voltage in a memory controller trained to a memory device
#327TEST CIRCUIT, SEMICONDUCTOR MEMORY APPARATUS USING THE SAME, AND TEST METHOD OF THE SEMICONDUCTOR MEMORY APPARATUS
#328Utilizing two algorithms to determine a delay value for training DDR3 memory
#329Leakage measurement systems
#330Semiconductor device having plural penetration electrodes penetrating through semiconductor substrate and testing method thereof
#331Semiconductor device
#332Semiconductor memory device having data compression test circuit
#333Semiconductor apparatus transmitting fuse information and repair method thereof
#334Method of testing asynchronous modules in semiconductor device
#335Methods and circuits for calibrating multi-modal termination schemes
#336Non-volatile semiconductor memory device capable of improving failure-relief efficiency
#337Methods and systems for reducing supply and termination noise
#338Method and apparatus for evaluating and optimizing a signaling system
#339Semiconductor device having level shift circuit
#340Semiconductor device, adjustment method thereof and data processing system
#341Semiconductor device having bit lines and local I/O lines
#342Method and system for synchronizing address and control signals in threaded memory modules
#343Semiconductor device
#344VERIFYING A DATA PATH IN A SEMICONDUCTOR APPARATUS
#345Technique for determining performance characteristics of electronic devices and systems
#346Nonvolatile semiconductor memory device
#347Method for manufacturing a stacked device conductive path connectivity
#348Memory control circuit, memory control method, and integrated circuit
#349Nonvolatile semiconductor memory device and method testing the same
#350Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device
#351Safe memory storage by internal operation verification
#352Test method for screening manufacturing defects in a memory array
#353Semiconductor device and test method thereof
#354Detection of word-line leakage in memory arrays: current based approach
#355Detection of broken word-lines in memory arrays
#356Detection of word-line leakage in memory arrays
#357Semiconductor device capable of suppressing a coupling effect of a test-disable transmission line
#358Semiconductor device
#359Setting a reference voltage in a memory controller trained to a memory device
#360Training a memory controller and a memory device using multiple read and write operations
#361Semiconductor memory device incorporating an interface chip for selectively refreshing memory cells in core chips
#362Semiconductor devices having a three-dimensional stacked structure and methods of de-skewing data therein
#363Maintenance operations in a DRAM
#364Memory with multi-page read
#365Memory device having a local current sink
#366Semiconductor memory apparatus
#367Semiconductor memory device and method for testing the same
#368Apparatus and methods for through substrate via test
#369Semiconductor memory device having memory block configuration
#370Bit-line sense amplifier, semiconductor memory device having the same, and method of testing bit-line micro-bridge defect
#371Semiconductor device and method of detecting abnormality on semiconductor device
#372Method of in-process intralayer yield detection, interlayer shunt detection and correction
#373Semiconductor device semiconductor device testing method, and data processing system
#374Integrated solution for identifying malfunctioning components within memory devices
#375Semiconductor device capable of detecting defect of column selection line
#376Clock delay correcting device and semiconductor device having the same
#377Data channel test apparatus and method thereof
#378Semiconductor apparatus and local skew detecting circuit therefor
#379Semiconductor memory device and inspecting method of the same
#380Test circuit, semiconductor memory apparatus using the same, and test method of the semiconductor memory apparatus
#381Impedance adjusting device
#382Semiconductor device, system with semiconductor device, and calibration method
#383Compensating for aging in integrated circuits
#384Semiconductor memory device, method of adjusting the same and information processing system including the same
#385Semiconductor device, semiconductor device testing method, and data processing system
#386Semiconductor device
#387Semiconductor device, adjustment method thereof and data processing system
#388Memory device bit line sensing system and method that compensates for bit line resistance variations
#389Phase shift adjusting method and circuit
#390Die location compensation
#391Methods and systems to calibrate push-pull drivers
#392Semiconductor devices having ZQ calibration circuits and calibration methods thereof
#393Apparatus and method for detecting word line leakage in memory devices
#394Low cost high density rectifier matrix memory
#395Method for performing data pattern management regarding data accessed by a controller of a flash memory, and associated memory device and controller thereof
#396Semiconductor memory device having memory block configuration
#397Word line defect detecting device and method thereof
#398Semiconductor memory apparatus and test method thereof
#399Method of testing for a leakage current between bit lines of nonvolatile memory device
#400Nonvolatile semiconductor memory device
#401Method and apparatus for evaluating and optimizing a signaling system
#402Semiconductor memory devices including burn-in test circuits
#403Burn-In Test Method and System
#404Quiescent testing of non-volatile memory array
#405Semiconductor memory device, memory module including the same, and data processing system
#406SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME
#407Burn-in methods for static random access memories and chips
#408Semiconductor device
#409Bit line bridge detecting method in semiconductor memory device
#410Automatic word line leakage measurement circuitry
#411Bitline leakage detection in memories
#412Apparatus for the dynamic detection, selection and deselection of leaking decoupling capacitors
#413APPARATUS FOR THE DYNAMIC DETECTION, SELECTION AND DESELECTION OF LEAKING DECOUPLING CAPACITORS
#414Stacked device conductive path connectivity
#415SEMICONDUCTOR DEVICE
#416Method and apparatus for measuring statistics of dram parameters with minimum perturbation to cell layout and environment
#417Semiconductor device and method for designing the same
#418SEMICONDUCTOR MEMORY DEVICE
#419On-die termination of address and command signals
#420Memory device bit line sensing system and method that compensates for bit line resistance variations
#421Apparatus and methods for through substrate via test
#422Semiconductor memory device and redundancy method therefor
#423System and method for an asynchronous data buffer having buffer write and read pointers
#424Test circuit device for semiconductor memory apparatus
#425Leakage testing method for dynamic random access memory having a recess gate
#426Method and apparatus for handling failure in address line
#427Semiconductor memory device and test method thereof
#428Method and apparatus for output driver calibration, and memory devices and system embodying same
#429Device and method for testing a resistance value of on-die-termination device and semiconductor device having the same
#430Data channel test apparatus and method thereof
#431Semiconductor memory device
#432SEMICONDUCTOR MEMORY DEVICE AND SYSTEM USING SEMICONDUCTOR MEMORY DEVICE
#433Semiconductor integrated circuit
#434Technique for determining performance characteristics of electronic devices and systems
#435Nonvolatile memory device using variable resistive element
#436Memory and voltage monitoring device thereof
#437Memory control circuit, memory control method, and integrated circuit
#438Apparatus and method for detecting word line leakage in memory devices
#439Semiconductor memory device and semiconductor memory system for compensating crosstalk
#440Method for detecting erroneous word lines of a memory array and device thereof
#441Test apparatus for determining if adjacent contacts are short-circuited and semiconductor integrated circuit devices that include such test apparatus
#442Fault injection in dynamic random access memory modules for performing built-in self-tests
#443SEMICONDUCTOR DEVICE AND TESTING METHOD THEREOF
#444Separate testing of continuity between an internal terminal in each chip and an external terminal in a stacked semiconductor device
#445SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME
#446Test circuit capable of sequentially performing boundary scan test and test method thereof
#447Data transfer between chips in a multi-chip semiconductor device with an increased data transfer speed
#448Data channel test apparatus and method thereof
#449Semiconductor memory device capable of suppressing a coupling effect of a test-disable transmission line
#450Semiconductor integrated circuit and electronic device
#451Method and system for testing address lines
#452Semiconductor memory device
#453Memory diagnosis apparatus
#454Structure for a memory switching data processing system
#455Nonvolatile semiconductor memory
#456Memory device for detecting bit line leakage current and method thereof
#457Memory with weighted multi-page read
#458Apparatus and method for detecting word line leakage in memory devices
#459Calibration circuit and semiconductor memory device with the same
#460Semiconductor memory device having memory block configuration
#461Word line driving circuit and method of testing a word line using the word line driving circuit
#462Multi-column decoder stress test circuit
#463Semiconductor memory, test method of semiconductor memory and system
#464Semiconductor memory capable of testing a failure before programming a fuse circuit and method thereof
#465Semiconductor memory device
#466Semiconductor memory device
#467Local skew detecting circuit for semiconductor memory apparatus
#468Hybrid DRAM
#469Calibration system and method
#470Method for testing semiconductor memory device
#471Memory device bit line sensing system and method that compensates for bit line resistance variations
#472Method, Device And Computer Program For Evaluating A Signal Transmission
#473Apparatus for measuring on-die termination (ODT) resistance and semiconductor memory device having the same
#474Word line driving circuit, semiconductor memory device including the same, and method for testing the semiconductor memory device
#475Integrated circuit memory device responsive to word line/bit line short-circuit
#476Memory device
#477Stacked semiconductor device and method of testing the same
#478Circuit and method to find wordline-bitline shorts in a DRAM
#479Storage cell design evaluation circuit including a wordline timing and cell access detection circuit
#480Method and circuit for stressing upper level interconnects in semiconductor devices
#481METHOD FOR TESTING A WORD LINE FAILURE
#482Switching a defective signal line with a spare signal line without shutting down the computer system
#483Semiconductor device including adjustable driver output impedances
#484Circuit and method of testing a fail in a memory device
#485Semiconductor memory having function to determine semiconductor low current
#486Test cells for semiconductor yield improvement
#487Circuit for testing word line of semiconductor memory device
#488Method for evaluating storage cell design using a wordline timing and cell access detection circuit
#489Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit
#490TRAINING OF SIGNAL TRANSFER CHANNELS BETWEEN MEMORY CONTROLLER AND MEMORY DEVICE
#491Apparatus and method for determining on die termination modes in memory device
#492SEMICONDUCTOR MEMORY AND METHOD FOR TESTING SEMICONDUCTOR MEMORIES
#493Phase shift adjusting method and circuit
#494Detection of row-to-row shorts and other row decode defects in memory devices
#495Semiconductor device and impedance adjusting method thereof
#496Method of detecting bit line bridge by selectively floating even-or odd-numbered bit lines of memory device
#497METHOD OF FIXING A READ EVALUATION TIME OR THE DIFFERENCE BETWEEN A READ CHARGE VOLTAGE AND A READ DISCRIMINATING VOLTAGE IN A NON-VOLATILE NAND TYPE MEMORY DEVICE
#498Method and apparatus for output driver calibration, and memory devices and system embodying same
#499Memory test system including semiconductor memory device suitable for testing an on-die termination, and method thereof
#500Line defect detection circuit for detecting weak line
#501Semiconductor memory device capable of detecting bridge defects and bridge defect detecting method performed in the semiconductor memory device
#502Low cost high density rectifier matrix memory
#503Low cost high density rectifier matrix memory
#504Semiconductor memory device capable of effectively testing failure of data
#505Semiconductor device and memory circuit including a redundancy arrangement
#506Semiconductor memory device having memory block configuration
#507Exposure system, semiconductor device, and method for fabricating the semiconductor device
#508Communication channel calibration for drift conditions
#509Semiconductor integrated circuit and electronic device
#510Integrated Semiconductor Memory with a Test Function and Method for Testing an Integrated Semiconductor Memory
#511Semiconductor device and method for testing semiconductor device
#512Integrated circuit having a word line driver
#513Memory with weighted multi-page read
#514Method and system for testing a random access memory (RAM) device having an internal cache
#515Semiconductor memory device
#516Output driver capable of controlling a short circuit current
#517Semiconductor memory module and semiconductor memory device
#518Memory with element redundancy
#519METHOD AND APPARATUS FOR EVALUATING AND OPTIMIZING A SIGNALING SYSTEM
#520Test mode for IPP current measurement for wordline defect detection
#521Method for calibrating a driver and on-die termination of a synchronous memory device
#522Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor integrated circuit thereof
#523Test patterns to insure read signal integrity for high speed DDR DRAM
#524Semiconductor memory device comprising plural source lines
#525Deterministic addressing of nanoscale devices assembled at sublithographic pitches
#526Device for controlling on die termination
#527Dynamic on-die termination launch latency reduction
#528Polarity driven dynamic on-die termination
#529Power line control circuit of semiconductor device
#530Current reduction circuit of semiconductor device
#531Semiconductor memory device
#532Method and apparatus for evaluating and optimizing a signaling system
#533System and method for testing for memory address aliasing errors
#534Test circuitry and testing methods
#535Time controllable sensing scheme for sense amplifier in memory IC test
#536Method and apparatus to calibrate DRAM on resistance (Ron) and on-die termination (ODT) values over process, voltage and temperature (PVT) variations
#537Current reduction circuit of semiconductor device
#538Semiconductor memory device
#539Communication channel calibration for drift conditions
#540Read source line compensation in a non-volatile memory
#541Semiconductor device and testing method thereof
#542On-die termination apparatus
#543Test apparatus and test method
#544Semiconductor device and method for testing semiconductor device
#545System and method for reducing jitter of signals coupled through adjacent signal lines
#546Test mode for detecting a floating word line
#547Detection of row-to-row shorts and other row decode defects in memory devices
#548System and method for an asynchronous data buffer having buffer write and read pointers
#549Integrated semiconductor memory having sense amplifiers selectively activated at different timing
#550Memory bus checking procedure
#551Switching a defective signal line with a spare signal line without shutting down the computer system
#552METHOD AND SYSTEM FOR DETECTING POTENTIAL RELIABILITY FAILURES OF INTEGRATED CIRCUIT
#553Method for allocating resources in heterogeneous nanowire crossbars having defective nanowire junctions
#554Semiconductor device having a mode of functional test
#555Technique for determining performance characteristics of electronic devices and systems
#556Semiconductor driver circuit with signal swing balance and enhanced testing
#557Integrated semiconduct memory with test circuit
#558Method for capacitance measurement in silicon
#559Failure test method for split gate flash memory
#560Integrated semiconductor memory and method for operating an integrated semiconductor memory
#561Method and apparatus for identifying short circuits in an integrated circuit device
#562Built-in self test for memory interconnect testing
#563Electronic circuit with test unit
#564Integrated semiconductor memory comprising at least one word line and method
#565Test method for determining the wire configuration for circuit carriers with components arranged thereon
#566Method for testing the serviceability of bit lines in a DRAM memory device
#567Method for routing data paths in a semiconductor chip with a plurality of layers
#568Exposure system, semiconductor device, and method for fabricating the semiconductor device
#569Semiconductor memory device for simultaneously testing blocks of cells
#570Low cost high density rectifier matrix memory
#571System and method for an asynchronous data buffer having buffer write and read pointers
#572Integrated semiconductor memory comprising at least one word line and comprising a multiplicity of memory cells
#573Memory device
#574Test method and test circuit for electronic device
#575Method of detecting potential bridging effects between conducting lines in an integrated circuit
#576Semiconductor memory device
#577Semiconductor integrated circuit
#578Semiconductor integrated circuit which properly executes an operational test of a circuit under test in the semiconductor integrated circuit
#579Method for detecting resistive-open defects in semiconductor memories
#580Semiconductor memory device and test method thereof
#581Integrated semiconductor memory and method for electrically stressing an integrated semiconductor memory
#582Bit line discharge control method and circuit for a semiconductor memory
#583Communication channel calibration for drift conditions
#584Flash array implementation with local and global bit lines
#585Method and apparatus for identifying short circuits in an integrated circuit device
#586Method and device for testing a sense amp
#587Semiconductor integrated circuit device and bit line capacitance adjusting method using the device
#588On chip diagnosis block with mixed redundancy
#589Built-in self test for memory interconnect testing
#590Semiconductor device
#591Method of driving and testing a semiconductor memory device
#592Semiconductor memory device having memory block configuration
#593Semiconductor integrated circuit device capable of controlling impedance
#594Nanoscale wire-based sublithographic programmable logic arrays
#595Fault tolerant semiconductor system
#596Memory bus checking procedure
#597Method for measuring and compensating for skews of data transmission lines by compensating for skew by delay elements switched in response to the calculated reative skew
#598Memory test circuit and device wafer
#599Signal verification system
#600Defect detection for a memory device