199818 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout to prevent clustered faults
Redundancy array column decoder for memory
#2Redundancy array column decoder for memory
#3Method for screening bad data columns in data storage medium
#4Memory with bit line short circuit detection and masking of groups of bad bit lines
#5Redundancy array column decoder for memory
#6Method for screening bad data columns in data storage medium
#7Memory repair system and method therefor
#8Semiconductor memory device that applies same voltage to two adjacent word lines for access
#9Defective block management
#10Fault tolerant control line configuration
#11Redundancy schemes for non-volatile memory based on physical memory layout
#12INSPECTING METHOD, TEMPLATE MANUFACTURING METHOD, SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING METHOD, AND INSPECTING SYSTEM
#13Methods for efficiently repairing embedded dynamic random-access memory having marginally failing cells
#14Cache memory, processor, and production methods for cache memory and processor
#15Phase-change random access memory
#16Charge-trap flash memory device with reduced erasure stress and related programming and erasing methods thereof
#17NAND string with a redundant memory cell
#18Column redundancy system for a memory array
#19Method for repairing a neighborhood of rows in a memory array using a patch table
#20Semiconductor memory device and defect remedying method thereof
#21Non-volatile memory device and method for operating the memory device
#22Thin film magnetic memory device having redundant configuration
#23Yield calculation method
#24Semiconductor memory device and defect remedying method thereof
#25NAND string with a redundant memory cell
#26Phase-change random access memory
#27Thin film magnetic memory device having redundant configuration
#28Method and apparatus for incorporating block redundancy in a memory array
#29Program verification for non-volatile memory
#30Semiconductor memory device and defect remedying method thereof
#31Cache memory, processor, and production methods for cache memory and processor
#32Semiconductor memory device and defect remedying method thereof
#33Thin film magnetic memory device having redundant configuration
#34Semiconductor memory device providing redundancy