199819 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout by reducing size of decoders
Redundancy array column decoder for memory
#2Semiconductor memory device and method of operating the same
#3Redundancy array column decoder for memory
#4Redundancy array column decoder for memory
#5Efficient coding for memory redundancy
#6Redundancy evaluation circuit for semiconductor device
#7Memories and methods for performing column repair
#8SEMICONDUCTOR DEVICE HAVING REDUNDANT SELECT LINE TO REPLACE REGULAR SELECT LINE
#9THREE-DIMENSIONAL STACKED SEMICONDUCTOR INTEGRATED CIRCUIT AND TSV REPAIR METHOD THEREOF
#10Semiconductor integrated circuit including column redundancy fuse block
#11Semiconductor memory device and method for operating the same
#12Sharing physical memory locations in memory devices
#13Flash memory device and method of controlling flash memory device
#14Semiconductor memory and manufacturing method thereof
#15Semiconductor memory device that can relieve defective address
#16Flash memory device and method of controlling flash memory device
#17Sharing physical memory locations in memory devices
#18Implementation of column redundancy for a flash memory with a high write parallelism
#19Method and Apparatus For Repairing Defective Cell for Each Cell Section Word Line
#20Semiconductor memory device capable of relieving defective bits found after packaging
#21Semiconductor storage device
#22Integrated circuit device and electronic instrument
#23Semiconductor device with a relief processing portion
#24Integrated electrical module with regular and redundant elements
#25Semiconductor memory unit with repair circuit
#26Semiconductor storage device
#27Semiconductor memory device and a method of redressing a memory cell
#28Monitoring of solid state memory devices in active memory system utilizing redundant devices
#29Method and apparatus for semiconductor device repair with reduced number of programmable elements
#30Semiconductor memory devices having column redundancy circuits therein that support multiple memory blocks
#31Enhanced functionality in a two-terminal memory array
#32Method and apparatus for semiconductor device repair with reduced number of programmable elements
#33Repair of memory cells
#34Method for skip over redundancy decode with very low overhead
#35Semiconductor memory device providing redundancy
#36Semiconductor memory device
#37Redundancy circuit in semiconductor memory device having a multiblock structure