199821 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout using a hierarchical redundancy scheme
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
#2MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
#3Optimizing recovery of recurrent blocks using bloom filter
#4Memory system and data processing system including the same
#5Memory devices implementing data-access schemes for digit lines proximate to edges of column planes, and related devices, systems, and methods
#6Devices including control logic structures, and related methods
#7Redundancy in microelectronic devices, and related methods, devices, and systems
#8Memory devices configured to detect internal potential failures
#9Devices including control logic structures, and related methods
#10Field recovery of graphics on-die memory
#11Memory devices having spare column remap storages and methods of remapping column addresses in the memory devices
#12Memory system and data processing system including the same
#13Memory testing techniques
#14Devices including control logic structures, electronic systems, and related methods
#15Post-packaging environment recovery of graphics on-die memory
#16Memory device and memory system including the same
#17Semiconductor memory devices, methods of operating semiconductor memory devices and memory systems
#18Memory devices having spare column remap storages
#19Column repair in memory
#20Post-packaging environment recovery of graphics on-die memory
#21Memory with bit line short circuit detection and masking of groups of bad bit lines
#22Methods, apparatus, and systems to repair memory
#23Memory repair system and method therefor
#24Methods, apparatus, and systems to repair memory
#25Semiconductor device, control method thereof and data processing system
#26SEMICONDUCTOR MEMORY DEVICE AND SYSTEM HAVING REDUNDANCY CELLS
#27Semiconductor memory device and system having redundancy cells
#28SEMICONDUCTOR DEVICE HAVING REDUNDANT SELECT LINE TO REPLACE REGULAR SELECT LINE
#29Semiconductor memory device and repair method thereof
#30Semiconductor device, control method thereof and data processing system
#31Redundant memory array for replacing memory sections of main memory
#32Methods, apparatus, and systems to repair memory
#33Control apparatus and control method
#34Circuit for controlling redundancy in semiconductor memory apparatus
#35Redundant memory array for replacing memory sections of main memory
#36Method of managing non-volatile memory device and memory system including the same
#37Resistance change memory
#38Redundant memory array for replacing memory sections of main memory
#39Semiconductor memory device including signal controller connected between memory blocks
#40Methods, apparatus, and systems to repair memory
#41Block redundancy implementation in hierarchical rams
#42CIRCUIT AND METHOD FOR CONTROLLING REDUNDANCY IN SEMICONDUCTOR MEMORY APPARATUS
#43ERROR CORRECTION IN AN INTEGRATED CIRCUIT WITH AN ARRAY OF MEMORY CELLS
#44Built-in self-repair method for NAND flash memory and system thereof
#45Three dimensional structure memory
#46System and method for providing a high fault tolerant memory system
#47Test apparatus and selection apparatus
#48Error Detection/Correction Method
#49Integrated circuit device and electronic instrument
#50SEMICONDUCTOR MEMORY DEVICE WITH DATA AND LOCAL REDUNDANCY MEMORY CELL ARRAYS, AND REDUNDANCY METHOD THEREOF
#51Block redundancy implementation in heirarchical ram's
#52Memory with retargetable memory cell redundancy
#53Retargetable memory cell redundancy methods
#54Component testing and recovery
#55Reconfigurable memory block redundancy to repair defective input/output lines
#56Combination column redundancy system for a memory array
#57Managing memory health
#58Non-volatile semiconductor memory device
#59Method and apparatus for semiconductor device repair with reduced number of programmable elements
#60Method and apparatus for semiconductor device repair with reduced number of programmable elements
#61Non-volatile semiconductor memory device
#62Semiconductor memory storage device and a redundancy control method therefor