199823 ⎘
Checking stores for correct operation ; Subsequent repair ; Testing stores during standby or offline operation; Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for optimized yield
Semiconductor memory devices and repair methods of the semiconductor memory devices
#2Runtime cell row replacement in a memory
#3Memory devices having spare column remap storages and methods of remapping column addresses in the memory devices
#4Stacked memory apparatus using error correction code and repairing method thereof
#5Layered semiconductor device, and production method therefor
#6On-the-fly bit failure detection and bit redundancy remapping techniques to correct for fixed bit defects
#7Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to short during testing and using on-the-fly bit failure detection and bit redundancy remapping techniques to correct them
#8Memory devices having spare column remap storages
#9E-fuse circuit
#10Method and apparatus for SOC with optimal RSMA
#11Techniques to achieve area reduction through co-optimizing logic core blocks and memory redundancies
#12Real time correction of bit failure in resistive memory
#13Memory cell with redundant carbon nanotube
#14Various methods and apparatuses for effective yield enhancement of good chip dies having memories per wafer
#15Method and apparatus for SRAM macro sparing in computer chips
#16Yield calculation method
#17Redundancy repaired yield calculation method