ClassID:

206331

H01J2237/036 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Mounting, supporting, spacing or insulating electrodes Spacing

Recent Application in this class:
#1
20250349495
2025-11-13

ISOLATING SPACER FOR ELECTRON-OPTICAL ASSEMBLY

#2
20250210337
2025-06-26

SPACER FOR AN ORIFICE ELEMENT

#3
20250116004
2025-04-10

SUBSTRATE PROCESSING APPARATUS

#4
20250104959
2025-03-27

PROXIMITY-ELECTRODE, CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGING A SAMPLE

#5
20240387148
2024-11-21

TUNABLE PLASMA EXCLUSION ZONE IN SEMICONDUCTOR FABRICATION

#6
20240297024
2024-09-05

ACTIVE GAS GENERATION APPARATUS

#7
20240087835
2024-03-14

CHARGED PARTICLE DEVICE AND METHOD

#8
20230369023
2023-11-16

TUNABLE PLASMA EXCLUSION ZONE IN SEMICONDUCTOR FABRICATION

#9
20220275514
2022-09-01

Substrate processing apparatus

#10
20200328063
2020-10-15

Electrostatic chucking process

#11
20170213686
2017-07-27

Anode, and x-ray generating tube, x-ray generating apparatus, and radiography system using the same

#12
20170213685
2017-07-27

X-ray tube including hybrid electron emission source

#13
20160233046
2016-08-11

X-ray generation device having multiple metal target members

#14
20160076139
2016-03-17

Sustained self-sputtering of lithium for lithium physical vapor deposition

#15
20150279620
2015-10-01

Plasma generator

#16
20150124931
2015-05-07

Cathode filament assembly

#17
20140353518
2014-12-04

Insulation structure and insulation method

#18
20140291543
2014-10-02

Insulation structure of high voltage electrodes for ion implantation apparatus

#19
20140197327
2014-07-17

High-voltage insulation device for charged-particle optical apparatus

#20
20130161511
2013-06-27

Sample observing device and sample observing method

#21
20130037725
2013-02-14

GRID PROVIDING BEAMLET STEERING

#22
20120080609
2012-04-05

Grid providing beamlet steering

#23
20100252746
2010-10-07

End terminations for electrodes used in ion implantation systems

#24
20100044579
2010-02-25

APPARATUS

#25
20070125954
2007-06-07

Beam optical component for charged particle beams