206424 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Means for deflecting or directing discharge Magnetic means
Sub-classes:MEASUREMENT DEVICE
#2MAGNETIC MAGNIFICATION CONTROL FOR ELECTRON MICROSCOPES
#3SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR IN A SINGLE-BEAM OR MULTI-BEAM APPARATUS
#4APPARATUS AND METHOD FOR ATOMIC LAYER ETCHING BASED ON CONTROL OF CHARGED PARTICLES
#5SUBSTRATE PROCESSING APPARATUS
#6GAS CLUSTER ION BEAM APPARATUS
#7ELECTRON BEAM DEVICE FOR SURFACE TREATMENT
#8PROTECTING A DETECTOR WHILE DISCHARGING A REGION OF A SAMPLE
#9Aberration Correction Device and Aberration Correction Method
#10ELECTRODE CONFIGURATIONS AND MAGNET CONFIGURATIONS FOR PROCESSING CHAMBERS, AND RELATED METHODS AND APPARATUS, FOR SEMICONDUCTOR MANUFACTURING
#11PERMEANCE MAGNETIC ASSEMBLY
#12RIBBON BEAM ANGLE ADJUSTMENT IN AN ION IMPLANTATION SYSTEM
#13CHARGED PARTICLE OPTICS, CHARGED PARTICLE BEAM APPARATUS, AND METHOD FOR SCANNING A CHARGED PARTICLE BEAM
#14Method and system of image-forming multi-electron beams
#15Permeance magnetic assembly
#16MULTIPLE PARTICLE BEAM SYSTEM WITH A CONTRAST CORRECTION LENS SYSTEM
#17Ion gun and vacuum processing apparatus
#18Ribbon beam angle adjustment in an ion implantation system
#19Permeance magnetic assembly
#20Particle beam device having a deflection unit
#21Charged particle beam device
#22Ion gun and vacuum processing apparatus
#23SYSTEMS AND METHODS FOR COMPENSATING DISPERSION OF A BEAM SEPARATOR IN A SINGLE-BEAM OR MULTI-BEAM APPARATUS
#24Supported X-ray horn for controlling e-beams
#25Apparatus of charged-particle beam such as electron microscope comprising co-condensers for continuous image resolution tuning
#26Particle beam system for azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system
#27Electron beam system for inspection and review of 3D devices
#28Multipactor plasma ignition devices and techniques
#29System combination of a particle beam system and a light-optical system with collinear beam guidance, and use of the system combination
#30Arc source with confined magnetic field
#31ARC source
#32Interchangeable magnet pack
#33Scan and corrector magnet designs for high throughput scanned beam ion implanter
#34Permeance magnetic assembly
#35Charged particle beam device and optical-axis adjusting method thereof
#36Method of ion implantation and an apparatus for the same
#37Scanning magnet design with enhanced efficiency
#38Coil-integrated-type yoke and manufacturing method of the same
#39Methods and systems for plasma deposition and treatment
#40Methods and apparatus for electron beam etching process
#41MULTIPLE ELECTRON BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE ELECTRON BEAM IMAGE ACQUISITION METHOD
#42Ion implantation apparatus and measurement device
#43Magnetic lens and exciting current control method
#44Charged particle beam axial alignment device, charged particle beam irradiation device and charged particle beam axial alignment method
#45Apparatus and method for inspecting a surface of a sample, using a multi-beam charged particle column
#46Signal separator for a multi-beam charged particle inspection apparatus
#47Aberration correcting device for an electron microscope and an electron microscope comprising such a device
#48Plasma processing apparatus
#49Systems and methods for compensating dispersion of a beam separator in a single-beam or multi-beam apparatus
#50Methods and systems for plasma deposition and treatment
#51Particle source for producing a particle beam and particle-optical apparatus
#52Energy filter and charged particle beam system
#53Object preparation device and particle beam device having an object preparation device and method for operating the particle beam device
#54Patterned substrate imaging using multiple electron beams
#55Time-resolved charged particle microscopy
#56Ion implantation method and ion implantation apparatus
#57Multicolumn charged particle beam exposure apparatus
#58Charged particle beam device
#59Multi-beam lens device, charged particle beam device, and method of operating a multi-beam lens device
#60Particle beam apparatus and method for operating a particle beam apparatus
#61Particle beam treatment system with solenoid magnets
#62Charged particle beam device
#63Beam Guidance System, Particle Beam Therapy System and Method
#64Dipole ring magnet assisted microwave radial line slot antenna plasma processing method and apparatus
#65Adjustable mass resolving aperture
#66Adjustable mass resolving aperture
#67Magnetic field fluctuation for beam smoothing
#68SYSTEMS AND METHODS FOR BEAM ANGLE ADJUSTMENT IN ION IMPLANTERS WITH BEAM DECELARATION
#69Device and method for optimizing diffusion section of electron beam
#70Combined multipole magnet and dipole scanning magnet
#71Interchangeable magnet pack
#72ARC-PLASMA FILM FORMATION DEVICE
#73Annular cooling fluid passage for magnets
#74Charged particle beam writing apparatus and charged particle beam writing method
#75Charged particle beam application device
#76Electromagnet support frame
#77Angular scanning using angular energy filter
#78Charged particle beam treatment apparatus and method of adjusting path length of charged particle beam
#79Ion implanter, beam energy measuring device, and method of measuring beam energy
#80High-energy ion implanter, beam collimator, and beam collimation method
#81Method and apparatus for control of coherent synchrotron radiation effects during recirculation with bunch compression
#82Circular accelerator and particle beam therapy apparatus
#83Method for transmitting a broadband ion beam and ion implanter
#84Method for manufacturing patterned layer and method for manufacturing electrochromic device
#85Apparatus for generating a hollow cathode arc discharge plasma
#86Method and arrangement for generating a jet of fluid, method and system for transforming the jet into a plasma, and uses of said system
#87Magnetic deflector for an electron column
#88PLASMA GENERATING APPARATUS AND FILM FORMING APPARATUS USING PLASMA GENERATING APPARATUS
#89Open-ended electromagnetic corrector assembly and method for deflecting, focusing, and controlling the uniformity of a traveling ion beam
#90Plasma ion source mass spectrometer
#91"Iontron" ion beam deposition source and a method for sputter deposition of different layers using this source
#92Broad energy-range ribbon ion beam collimation using a variable-gradient dipole
#93Techniques for confining electrons in an ion implanter
#94Beam line architecture for ion implanter
#95Beam tuning with automatic magnet pole rotation for ion implanters
#96Analyzing electromagnet
#97Electromagnet with active field containment
#98Technique for improving uniformity of a ribbon beam
#99Deflecting electromagnet and ion beam irradiating apparatus
#100Broad energy-range ribbon ion beam collimation using a variable-gradient dipole
#101Thermal compensation in magnetic field influencing of an electron beam
#102Magnet for scanning ion beams
#103Method and fine-control collimator for accurate collimation and precise parallel alignment of scanned ion beams
#104Ion beam slit extraction with mass separation
#105Electromagnetic regulator assembly for adjusting and controlling the current uniformity of continuous ion beams
#106Scan and corrector magnet designs for high throughput scanned beam ion implanter
#107Electron flood lithography
#108Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device
#109System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam device
#110Charged particle beam device, beam deflector device and methods of operating thereof
#111Beam separator device, charged particle beam device and methods of operating thereof