206448 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Seal mechanisms Vacuum seals
MULTI-BEAM PARTICLE MICROSCOPE WITH A QUICKLY REPLACEABLE PARTICLE SOURCE, AND METHOD FOR QUICKLY REPLACING A PARTICLE SOURCE IN THE MULTI-BEAM PARTICLE MICROSCOPE
#2BETA TILT SAMPLE HOLDER
#3SUBSTRATE PROCESSING APPARATUS
#4PLASMA PROCESSING DEVICE AND RETRACTABLE SEALING PART THEREOF
#5Charged particle beam system
#6Sample protection device for scanning electron microscopy
#7Vacuum processing apparatus and method for controlling vacuum processing apparatus
#8Replaceable module for a charged particle apparatus
#9Portable vacuum antioxidant bag
#10Scanning electron microscope
#11Charged particle beam system, opto-electro simultaneous detection system and method
#12Sample stage
#13Scanning electron microscope
#14Vacuum processing apparatus and mass spectrometer
#15Method for optimizing fluid flow across a sample within an electron microscope sample holder
#16Integrated circuit analysis systems and methods with localized evacuated volume for e-beam operation
#17Sample Stage
#18Diaphragm mounting member and charged particle beam device
#19Charged particle beam device and filter member
#20Method for optimizing fluid flow across a sample within an electron microscope sample holder
#21User interface for an electron microscope
#22Sample base, charged particle beam device and sample observation method
#23Sample storage container, charged particle beam apparatus, and image acquiring method
#24MEMBER FOR CHARGED PARTICLE BEAM DEVICE, CHARGED PARTICLE BEAM DEVICE AND DIAPHRAGM MEMBER
#25Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope
#26Target positioning device, method for driving a target positioning device, and a lithography system comprising such a target positioning device
#27HEAT LIP SEAL FOR CRYOGENIC PROCESSING
#28Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope
#29Scanning electron microscope
#30Stage device
#31Compact scanning electron microscope
#32Ion implantation apparatus and a method
#33Slider bearing for use with an apparatus comprising a vacuum chamber
#34Compact Scanning Electron Microscope
#35Beam device system comprising a particle beam device and an optical microscope
#36User interface for an electron microscope
#37Compact scanning electron microscope
#38Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope
#39Compound sliding seal unit suitable for atmosphere to vacuum applications
#40Sample enclosure for inspection and methods of use thereof
#41Methods for SEM inspection of fluid containing samples
#42APPARATUS FOR REACTIVE SPUTTERING
#43Sample enclosure for a scanning electron microscope and methods of use thereof
#44Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations
#45Plasma resistant seal assembly with replaceable barrier shield
#46Moving vacuum chamber stage with air bearing and differentially pumped grooves
#47Workpiece support structure for an ion beam implanter featuring spherical sliding seal vacuum feedthrough
#48Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope
#49Methods for SEM inspection of fluid containing samples