206468 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Modifying objects while observing Mechanical constraints
HYBRID VACUUM ELECTROSTATIC CHUCK IN DEDICATED CHAMBER FOR HIGH WARPAGE WAFERS
#2HYBRID VACUUM ELECTROSTATIC CHUCK IN VACUUM CHAMBER FOR HIGH WARPAGE WAFERS
#3TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE
#4Device for observing permeation and diffusion path of observation target gas, observation target gas measuring method, point-defect location detecting device, point-defect location detecting method, and observation samples
#5Testing assembly including a multiple degree of freedom stage
#6Testing assembly including a multiple degree of freedom stage
#7Stage device and charged particle beam device
#8Testing assembly including a multiple degree of freedom stage
#9Testing assembly including a multiple degree of freedom stage
#10Sensor for quantitative measurement of electromechanical properties and microstructure of nano-materials and method for making the same
#11Sample preparing device and sample posture shifting method
#12Mesh and method of observing rubber slice technical field
#13Strain detection for automated nano-manipulation