Patents-Review.com
ClassID:

206467 ⎘

H01J2237/206 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated Modifying objects while observing

Sub-classes:
Recent Application in this class:
#1
20260018373
2026-01-15

METHOD OF TIME-RESOLVED CHARGED PARTICLE MICROSCOPY

 #2
20250357076
2025-11-20

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

 #3
20250345945
2025-11-13

SUBSTRATE LOCATION DETECTION AND ADJUSTMENT

 #4
20240038486
2024-02-01

METHOD AND APPARATUS FOR PREPARING SAMPLES FOR IMAGING

 #5
20220126454
2022-04-28

SUBSTRATE LOCATION DETECTION AND ADJUSTMENT

 #6
20190080881
2019-03-14

Examination container and electron microscope

 #7
20190051489
2019-02-14

Specimen observation method

 #8
20190035599
2019-01-31

System and method for performing nano beam diffraction analysis

 #9
20180190470
2018-07-05

System and method for performing nano beam diffraction analysis

 #10
20180097307
2018-04-05

Method for forming an electrical connection to a sample support in an electron microscope holder

 #11
20180053625
2018-02-22

Double-tilt in-situ nanoindentation platform for transmission electron microscope

 #12
20180019095
2018-01-18

Charged particle instruments

 #13
20180005798
2018-01-04

System and method for performing nano beam diffraction analysis

 #14
20170301510
2017-10-19

Double-tilt sample holder for transmission electron microscope

 #15
20170278667
2017-09-28

Sample holder and focused ion beam apparatus

 #16
20170054239
2017-02-23

Method for forming an electrical connection to a sample support in an electron microscope holder

 #17
20160189918
2016-06-30

Sample holding device for studying light-driven reactions and sample analysis method using the same

 #18
20160181059
2016-06-23

Specimen holder for a charged particle microscope

 #19
20150369737
2015-12-24

System and method for simultaneous detection of secondary electrons and light in a charged particle beam system

 #20
20150048815
2015-02-19

Circuit probe for charged particle beam system

 #21
20140312226
2014-10-23

Charged-particle microscope providing depth-resolved imagery

 #22
20140284950
2014-09-25

Micro-nano tools with changeable tips for micro-NANO manipulation

 #23
20140264017
2014-09-18

Transmission electron microscope, and method of observing specimen

 #24
20140138558
2014-05-22

Method for forming an electrical connection to an sample support in an electron microscope holder

 #25
20140131573
2014-05-15

System and method for simultaneous detection of secondary electrons and light in a charged particle beam system

 #26
20140026672
2014-01-30

Sample for electron microscopy and method of manufacturing the same

 #27
20130140459
2013-06-06

SYSTEM AND METHOD FOR SAMPLE ANALYSIS BY THREE DIMENSIONAL CATHODOLUMINESCENCE

 #28
20130099134
2013-04-25

Manipulator carrier for electron microscopes

 #29
20130037706
2013-02-14

Devices and methods for cryo lift-out with in situ probe

 #30
20120305769
2012-12-06

Electron microscope and sample holder

 #31
20120305765
2012-12-06

Particle beam device and method for use in a particle beam device

 #32
20120293791
2012-11-22

Sample Holder with Optical Features for Holding a Sample in an Analytical Device for Research Purposes

 #33
20120292506
2012-11-22

SAMPLE OBSERVATION METHOD USING ELECTRON BEAMS AND ELECTRON MICROSCOPE

 #34
20120223228
2012-09-06

Microtome utilizing a movable knife in a retardation field scanning electron microscope and a retardation field scanning electron microscope including the same

 #35
20120193530
2012-08-02

System and method for localization of large numbers of fluorescent markers in biological samples

 #36
20120145897
2012-06-14

Sample holder with optical features

 #37
20120025103
2012-02-02

In situ holder assembly

 #38
20110226949
2011-09-22

Inspection system

 #39
20110226947
2011-09-22

Composite charged particle beam apparatus and sample processing and observing method

 #40
20110139986
2011-06-16

Electron microscope

 #41
20110073759
2011-03-31

Electromagnetic field application system

 #42
20110057100
2011-03-10

Transmission electron microscope, and method of observing specimen

 #43
20100276277
2010-11-04

Electrochemical liquid cell apparatus

 #44
20100102248
2010-04-29

Transmission electron microscope sample holder with optical features

 #45
20100096549
2010-04-22

Sample inspection apparatus, sample inspection method and sample inspection system

 #46
20100038557
2010-02-18

Addressable transmission electron microscope grid

 #47
20100025580
2010-02-04

GRID HOLDER FOR STEM ANALYSIS IN A CHARGED PARTICLE INSTRUMENT

 #48
20090302234
2009-12-10

Method and apparatus for observing inside structures, and specimen holder

 #49
20090302218
2009-12-10

Electrostatic latent image evaluation device, electrostatic latent image evaluation method, electrophotographic photoreceptor, and image forming device

 #50
20090236521
2009-09-24

Method and system for ultrafast photoelectron microscope

 #51
20090166536
2009-07-02

Sample holder, method for observation and inspection, and apparatus for observation and inspection

 #52
20090159797
2009-06-25

Transmission electron microscope

 #53
20090119807
2009-05-07

Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope

 #54
20090014648
2009-01-15

Particle beam device and method for use in a particle beam device

 #55
20080308731
2008-12-18

Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder

 #56
20080179518
2008-07-31

Microreactor for a transmission electron microscope and heating element and method of manufacture thereof

 #57
20080150557
2008-06-26

Charged particle beam device probe operation

 #58
20080017796
2008-01-24

Method and system for ultrafast photoelectron microscope

 #59
20070252091
2007-11-01

Method and apparatus for observing inside structures, and specimen holder

 #60
20070045537
2007-03-01

Microsystem manipulation apparatus

 #61
20060192116
2006-08-31

Charged particle beam device probe operation

 #62
20060097166
2006-05-11

Charged particle beam apparatus and sample manufacturing method

 #63
20060091325
2006-05-04

Method and apparatus for the automated process of in-situ lift-out

 #64
20060091302
2006-05-04

Apparatus and method of detecting probe tip contact with a surface

 #65
20050253069
2005-11-17

Method and system for ultrafast photoelectron microscope

 #66
20050211922
2005-09-29

Minute three dimensional structure producing apparatus and method

 #67
20050184236
2005-08-25

Probe current imaging

 #68
20050184028
2005-08-25

Probe tip processing

 #69
20050061971
2005-03-24

Method and apparatus for observing inside structures, and specimen holder