206470 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Modifying objects while observing Surface alteration
Method and System for Sample Preparation
#2METHOD OF PROCESSING ION BEAM BASED ON OPTICAL MICROSCOPY IMAGING
#3Device with at least one adjustable sample holder and method of changing holder tilt angle and method of preparing a lamella
#4Systems and methods for using multimodal imaging to determine structure and atomic composition of specimens
#5Systems and method for using multimodal imaging to determine structure and atomic composition of specimens
#6Method of analyzing surface modification of a specimen in a charged-particle microscope
#7Method for acquiring image and ion beam apparatus
#8Enhanced FIB-SEM systems for large-volume 3D imaging
#9Method of modifying a sample surface layer from a microscopic sample
#10METHOD FOR PREPARING AND ANALYZING AN OBJECT AS WELL AS PARTICLE BEAM DEVICE FOR PERFORMING THE METHOD
#11Charged particle beam apparatus
#12Charged particle beam microscope
#13Producing images of a specimen
#14Sample decontamination
#15Method of preparing a transmission electron microscope sample and a sample piece for a transmission electron microscope
#16MEMS nanoindenter
#17Method and device for ion beam processing of surfaces
#18Charged particle beam system and its specimen holder
#19INSPECTION INSTRUMENT OF A MAGNETIC SPECIMEN