206480 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Treatment of data; Image reconstruction Charged particle holography
Method and apparatus for carrying out a time-resolved interferometric measurement
#2System and method for performing nano beam diffraction analysis
#3Interferometer
#4Electron beam device
#5Interferometer having three electron biprisms
#6Electron microscope and combined illumination lens
#7Scanning interference electron microscope