ClassID:

206482

H01J2237/24405 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Detection characterized by the detecting means Faraday cages

Recent Application in this class:
#1
20260066217
2026-03-05

METHOD FOR SUBSTRATE PROCESSING

#2
20250292994
2025-09-18

GRID-LESS ION ENERGY DETECTOR

#3
20250291076
2025-09-18

GRID-LESS ION ANGLE DETECTOR

#4
20240290588
2024-08-29

ION COLLECTOR FOR USE IN PLASMA SYSTEMS

#5
20240194444
2024-06-13

ION BEAM CURRENT MEASUREMENT DEVICE AND ION BEAM IMPLANTATION SYSTEM

#6
20240071719
2024-02-29

Closed loop faraday correction of a horizontal beam current profile for uniform current tuning

#7
20230386785
2023-11-30

Systems and methods for optimizing full horizontal scanned beam distance

#8
20230197424
2023-06-22

Ion collector for use in plasma systems

#9
20220196482
2022-06-23

Device and method for measuring electron beam

#10
20200111651
2020-04-09

Ion collector for use in plasma systems

#11
20200027698
2020-01-23

APPARATUS AND TECHNIQUES FOR BEAM MAPPING IN ION BEAM SYSTEM

#12
20190244785
2019-08-08

Ion implantation apparatus and measurement device

#13
20190139740
2019-05-09

Apparatus and techniques for beam mapping in ion beam system

#14
20180308657
2018-10-25

Assessment and calibration of a high energy beam

#15
20170271127
2017-09-21

Ion implantation apparatus and measurement device

#16
20170178859
2017-06-22

Systems for controlling a high power ion beam

#17
20170062285
2017-03-02

Ion implantation apparatus and semiconductor manufacturing method

#18
20160314932
2016-10-27

Measurement of the electric current profile of particle clusters in gases and in a vacuum

#19
20160189928
2016-06-30

System and method to improve productivity of hybrid scan ion beam implanters

#20
20160189927
2016-06-30

Method of measuring vertical beam profile in an ion implantation system having a vertical beam angle device

#21
20160141145
2016-05-19

Micro machined two dimensional faraday collector grid

#22
20160124026
2016-05-05

Assessment and calibration of a high energy beam

#23
20160042915
2016-02-11

Ion implanter, ion implantation method, and beam measurement apparatus

#24
20150129774
2015-05-14

Beam imaging sensor and method for using same

#25
20150064814
2015-03-05

Mechanisms for monitoring ion beam in ion implanter system

#26
20150001418
2015-01-01

Ion beam measuring device and method of measuring ion beam

#27
20150001416
2015-01-01

Electron beam diagnostic system using computed tomography and an annular sensor

#28
20140322831
2014-10-30

Lithography apparatus, lithography method, and method of manufacturing article

#29
20140306119
2014-10-16

Beam monitoring device, method, and system

#30
20130299700
2013-11-14

Beam imaging sensor

#31
20130153779
2013-06-20

Dose measurement device for plasma-immersion ion implantation

#32
20130146760
2013-06-13

System and method for ion implantation with improved productivity and uniformity

#33
20130075624
2013-03-28

Beam monitoring device, method, and system

#34
20120138812
2012-06-07

DEVICE AND METHOD FOR ANALYZING THE DENSITY OF A BEAM OF CHARGED PARTICLES

#35
20120126137
2012-05-24

ION IMPLANTATION METHOD AND ION IMPLANTER

#36
20120068081
2012-03-22

Ion beam tuning

#37
20110297842
2011-12-08

Ion beam irradiation system and ion beam irradiation method

#38
20110121180
2011-05-26

Electron beam diagnostic system using computed tomography and an annular sensor

#39
20110031388
2011-02-10

Faraday cup array integrated with a readout IC and method for manufacture thereof

#40
20100224789
2010-09-09

Charged particle beam writing apparatus and optical axis deviation correcting method for charged particle beam

#41
20100207601
2010-08-19

Method and apparatus for monitoring leakage current of a faraday cup

#42
20100141236
2010-06-10

Integrated optical element and Faraday cup

#43
20100085033
2010-04-08

Ion current measurement device

#44
20100072392
2010-03-25

Charged particle beam profile measurement

#45
20100032562
2010-02-11

Slit disk for modified faraday cup diagnostic for determining power density of electron and ion beams

#46
20090272918
2009-11-05

System and method of performing uniform dose implantation under adverse conditions

#47
20090166565
2009-07-02

Ion implanters

#48
20090121122
2009-05-14

TECHNIQUES FOR MEASURING AND CONTROLLING ION BEAM ANGLE AND DENSITY UNIFORMITY

#49
20080283778
2008-11-20

Apparatus for ion beam fabrication

#50
20080265866
2008-10-30

Method and system for ion beam profiling

#51
20080251737
2008-10-16

Ion implantation apparatus

#52
20080142727
2008-06-19

Ion beam diagnostics

#53
20080135776
2008-06-12

Magnetic monitoring of a Faraday cup for an ion implanter

#54
20080088295
2008-04-17

Miniature modified Faraday cup for micro electron beams

#55
20080087846
2008-04-17

Sensor for ion implanter

#56
20080073584
2008-03-27

Ion beam current uniformity monitor, ion implanter and related method

#57
20080073581
2008-03-27

Ion beam irradiating apparatus and method of adjusting uniformity of a beam

#58
20080073579
2008-03-27

Ion beam measuring method and ion implanting apparatus

#59
20080073553
2008-03-27

ION BEAM PROFILER

#60
20080073551
2008-03-27

Automated faraday sensor test system

#61
20080017811
2008-01-24

Beam stop for an ion implanter

#62
20070221871
2007-09-27

Determining ion beam parallelism using refraction method

#63
20070216767
2007-09-20

Electron beam displacement measuring method, electron beam displacement measuring device, and electron beam recording apparatus

#64
20070187615
2007-08-16

Wafer charge monitoring

#65
20070100567
2007-05-03

Faraday system integrity determination

#66
20070085037
2007-04-19

Method, system, and apparatus for improving doping uniformity in high-tilt ion implantation

#67
20070080302
2007-04-12

Faraday cup assembly and method of controlling the same

#68
20070075260
2007-04-05

Faraday system and ion implantation apparatus comprising the faraday system

#69
20070069156
2007-03-29

Ion beam profiler

#70
20070023674
2007-02-01

Ion beam measuring method and ion implanting apparatus

#71
20060219955
2006-10-05

Method of measuring ion beam position

#72
20060192144
2006-08-31

Electron beam welding method and apparatus

#73
20060192134
2006-08-31

Ion beam measurement apparatus and method

#74
20060151695
2006-07-13

Process and device for measuring ions

#75
20060113493
2006-06-01

Irradiation system ion beam and method to enhance accuracy of irradiation

#76
20060113466
2006-06-01

Irradiation system with ion beam

#77
20060113465
2006-06-01

Method to increase low-energy beam current in irradiation system with ion beam

#78
20060038139
2006-02-23

Trigger probe for determining the orientation of the power distribution of an electron beam

#79
20060033041
2006-02-16

Ion implantation monitor system and method thereof

#80
20060022147
2006-02-02

Method and device of monitoring and controlling ion beam energy distribution

#81
20050285047
2005-12-29

Electron beam diagnostic for profiling high power beams

#82
20050223991
2005-10-13

Faraday dose and uniformity monitor for plasma based ion implantation

#83
20050212503
2005-09-29

Fast Faraday cup with high bandwidth

#84
20050178981
2005-08-18

Ion beam neutral detection