206492 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Detection characterized by the detecting means Transmitted particle detectors
Charged Particle Beam System and Replacement Method for Charged Particle Source Unit
#2MICROCHIPS FOR USE IN ELECTRON MICROSCOPES AND RELATED METHODS
#3CHARGED PARTICLE BEAM APPARATUS
#4Scanning electron microscope
#5Charged particle beam device
#6System of mobile charged particle detectors and methods of spent nuclear fuel imaging
#7Diffraction pattern detection in a transmission charged particle microscope
#8Apparatus and method for inspecting a sample using a plurality of charged particle beams
#9Studying dynamic specimens in a transmission charged particle microscope
#10Temporal compressive sensing systems
#11Charged particle beam device
#12Temporal compressive sensing systems
#13Method for characterizing two dimensional nanomaterial
#14Compressive scanning spectroscopy
#15Electron microscope and method of aberration measurement
#16Temporal compressive sensing systems
#17Apparatus and method for inspecting a sample using a plurality of charged particle beams
#18TEM phase contrast imaging with image plane phase grating
#19Device for correlative scanning transmission electron microscopy (STEM) and light microscopy
#20Charged particle beam device, image generation method, observation system
#21Compressive transmission microscopy
#22Electron beam masks for compressive sensors
#23Measurement method and electron microscope
#24Electron microscope and method of measuring aberrations
#25Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member
#26High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing
#27System and method for simultaneous detection of secondary electrons and light in a charged particle beam system
#28Sample base, charged particle beam device and sample observation method
#29Charged particle beam device and sample observation method
#30Backscatter reduction in thin electron detectors
#31System and method for simultaneous detection of secondary electrons and light in a charged particle beam system
#32Method of protecting a radiation detector in a charged particle instrument
#33System and method for localization of large numbers of fluorescent markers in biological samples
#34Measurement and endpointing of sample thickness
#35High collection efficiency X-ray spectrometer system with integrated electron beam stop, electron detector and X-ray detector for use on electron-optical beam lines and microscopes
#36Charged particle detectors
#37Detector system for use with transmission electron microscope spectroscopy
#38Composite charged particle beams apparatus
#39Backscatter reduction in thin electron detectors
#40METHOD AND SYSTEM FOR PREPARING A SAMPLE
#41Charged particle beam device
#42Method for discrimination of backscattered from incoming electrons in imaging electron detectors with a thin electron-sensitive layer
#43Dark field detector for use in an electron microscope
#44Particle-beam microscope
#45Method of high-energy particle imaging by computing a difference between sampled pixel voltages
#46Measurement and endpointing of sample thickness
#47Apparatus and method including a direct bombardment detector and a secondary detector for use in electron microscopy
#48Electron microscopy
#49Method and apparatus allowing simultaneous direct observation and electronic capture of scintillation images in an electron microscope
#50Electronic microscope apparatus
#51Method and apparatus for a high-resolution three dimensional confocal scanning transmission electron microscope
#52Method and system for generating and reviewing a thin sample
#53Charged particle beam device
#54Transmission electron microscope provided with electronic spectroscope
#55Scanning Transmission Charged Particle Beam Device
#56Charged particle detector assembly, charged particle beam apparatus and method for generating an image
#57Charged particle beam device
#58Systems and methods for a gas field ion microscope
#59High-resolution scintillation screen for digital imaging
#60Direct collection transmission electron microscopy
#61Detector system for a scanning electron microscope and a scanning electron microscope incorporating said detector system
#62Electron microscope
#63Multi-mode charged particle beam device
#64System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy