Apparatus for high-speed imaging sensor data transfer

High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing

Multi-beam particle microscope and method for operating same

Backscatter reduction in thin electron detectors

Backscatter reduction in thin electron detectors

DEVICE AND METHOD FOR CRYSTAL ORIENTATION MEASUREMENT BY MEANS OF AN ION BLOCKING PATTERN AND A FOCUSED ION PROBE

Apparatus and method including a direct bombardment detector and a secondary detector for use in electron microscopy

TDI detecting device, a feed-through equipment, an electron beam apparatus using these device and equipment, and a semiconductor device manufacturing method using the same electron beam apparatus

High-resolution scintillation screen for digital imaging

Scanning interference electron microscope

Method of photothermographic imaging for transmission electron microscopy

Patterned wafer inspection method and apparatus therefor

Electron beam apparatus and a device manufacturing method using the same apparatus

Multi-mode charged particle beam device