205226 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Details; Vessels; Containers Means associated with the vessel for preventing the generation of or for shielding unwanted radiation, e.g. X-rays
SPECTROSCOPY-BASED SAFETY SYSTEM FOR NUCLEAR REACTION DETECTION IN AN ION IMPLANTATION SYSTEM
#2BLACK BODY SURFACE GENERATION USING LASER MATERIAL PROCESSING
#3ELECTRICALLY CONDUCTIVE CERAMIC ELECTRIC FIELD BLOCKING PLATE
#4SEMICONDUCTOR RADIOACTIVE WAFER DECAY SAFETY AND OPERATION SYSTEM
#5ION IMPLANTER
#6SHIELDING FOR IMMERSED PLASMA SOURCE
#7Electronic Cleaning Device
#8CHARGED PARTICLE BEAM DEVICES AND MEMBRANE ASSEMBLIES USEFUL THEREIN
#9Concentrated Solar Irradiation of Targets in Plasmas
#10Ion Source Cathode
#11Microwave driven plasma ion source
#12Vacuum compatible X-ray shield
#13Faraday shield and apparatus for treating substrate
#14REDUCED SUBSTRATE PROCESS CHAMBER CAVITY VOLUME
#15Time-of-flight mass spectrometer
#16Mass spectrometer
#17Pulsed CFE electron source with fast blanker for ultrafast TEM applications
#18X-ray and particle shield for improved vacuum conductivity
#19Nozzle-type electron beam irradiation device, and electron beam sterilization equipment equipped with same
#20Method for proactive mitigation of coronal discharge and flash-over events within high voltage x-ray generators used in borehole logging
#21XRF analyzer with separate source and detector heat sinks
#22XRF analyzer with a hand shield
#23Shielded, transmission-target, x-ray tube
#24Sterilization machine and method for sterilizing packaging containers
#25Plasma processing apparatus
#26Conductive interface system between vacuum chambers in a charged particle beam device
#27Capacitively coupled plasma source for abating compounds produced in semiconductor processes
#28XRF analyzer
#29Hall effect enhanced capacitively coupled plasma source
#30Top opening-closing mechanism and inspection apparatus
#31Rotating-anode X-ray tube assembly with cooling system
#32Observation and analysis unit
#33CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VACUUM IN A VACUUM CHAMBER
#34DC only tool cell with a charged particle beam system
#35Removing byproducts of physical and chemical reactions in an ion implanter