205248 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Electron or ion microscopes; Electron or ion diffraction tubes Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy
Sub-classes:SYSTEMS AND METHODS FOR CHARGED PARTICLE FLOODING TO ENHANCE VOLTAGE CONTRAST DEFECT SIGNAL
#2Systems and methods for charged particle flooding to enhance voltage contrast defect signal
#3Plasma impedance tomography for plasma parameter imaging
#4System and method of preparing integrated circuits for backside probing using charged particle beams
#5Magnetic material observation method, and magnetic material observation apparatus
#6Electron microscope for magnetic field measurement and magnetic field measurement method
#7System and method of preparing integrated circuits for backside probing using charged particle beams
#8Apparatuses including test segment circuits having latch circuits for testing a semiconductor die
#9Compact deflecting magnet
#10Systems and methods for charged particle flooding to enhance voltage contrast defect signal
#11Apparatuses including test segment circuits having latch circuits for testing a semiconductor die
#12Compact deflecting magnet
#13Optical-cavity based ponderomotive phase plate for transmission electron microscopy
#14Installation location noise floor evaluation device
#15Time-of-flight mass spectrometer
#16Systems and methods for measuring magnetic fields produced within microscopes
#17Charged Particle Beam System With Receptacle Chamber For Cleaning Sample and Sample Stage
#18Charged particle beam apparatus
#19Charged particle beam apparatus sample holder with magnetic field generating element and sample holding element
#20Inspection system by charged particle beam and method of manufacturing devices using the system
#21Inspection system by charged particle beam and method of manufacturing devices using the system
#22Electron microscope
#23Electron beam irradiation method and scanning electron microscope
#24Specimen potential measuring method, and charged particle beam device
#25Inspection system by charged particle beam and method of manufacturing devices using the system
#26Magnetic domain imaging system
#27Charged particle beam inspection apparatus and inspection method using charged particle beam
#28Inspection system by charged particle beam and method of manufacturing devices using the system
#29Transmission electron microscope
#30Method of inspecting pattern and inspecting instrument
#31PATTERN INSPECTION AND MEASUREMENT APPARATUS
#32Inspection system by charged particle beam and method of manufacturing devices using the system
#33Method of inspecting pattern and inspecting instrument
#34Corrector transfer optics for Lorentz EM