H01J37/268 - CPC Classification Index

ClassID:

205249 ⎘

H01J37/268 - CPC Classification

Classification description:

Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Electron or ion microscopes; Electron or ion diffraction tubes; Measurement of magnetic- or electric fields in the object; Lorentzmicroscopy with scanning beams

Recent Application in this class:

20260045445

2026-02-12

CONDUCTIVE FIXATION FOR ELECTRON MICROSCOPY

20250125117

2025-04-17

HIGH VOLTAGE POWER SUPPLIES FOR FAST VOLTAGE CHANGES

20230274907

2023-08-31

CHARGED PARTICLE BEAM DEVICE

20230238212

2023-07-27

Electron Microscope

20230020742

2023-01-19

Automated Sample Alignment For Microscopy

20220068593

2022-03-03

Charged particle beam device

20210090856

2021-03-25

Method for high speed EELS spectrum acquisition

20200373121

2020-11-26

Conductive fixation for electron microscopy

20200312612

2020-10-01

Method of controlling transmission electron microscope and transmission electron microscope

#10

20200105499

2020-04-02

Charged particle beam irradiation apparatus

#11

20190096631

2019-03-28

Electron beam image acquisition apparatus, and electron beam image acquisition method

#12

20180269031

2018-09-20

Scanning transmission electron microscope

#13

20180269030

2018-09-20

Scanning transmission electron microscope with an objective electromagnetic lens and a method of use thereof

#14

20180246166

2018-08-30

Circuit inspection method and sample inspection apparatus

#15

20180174797

2018-06-21

Method and system for weak pattern quantification

#16

20180076005

2018-03-15

Method of determining the deflection of an electron beam resulting from an electric field and/or a magnetic field

#17

20170133196

2017-05-11

Charged particle system and method for measuring deflection fields in a sample

#18

20170125209

2017-05-04

Charged particle microscope with vibration detection / correction

#19

20150348748

2015-12-03

Charged particle beam apparatus

#20

20130009057

2013-01-10

Electron beam irradiation method and scanning electron microscope

#21

20120119085

2012-05-17

Specimen potential measuring method, and charged particle beam device

#22

20110057101

2011-03-10

Charged particle beam system

#23

20100239319

2010-09-23

Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device

#24

20100163727

2010-07-01

Methods of operating a nanoprober to electrically probe a device structure of an integrated circuit

#25

20090189075

2009-07-30

INSPECTION METHOD AND INSPECTION SYSTEM USING CHARGED PARTICLE BEAM

#26

20080270081

2008-10-30

Non-destructive, below-surface defect rendering using image intensity analysis

#27

20080253792

2008-10-16

Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device

#28

20080056746

2008-03-06

Surface-potential distribution measuring apparatus, image carrier, and image forming apparatus

#29

20070221845

2007-09-27

Charged particle beam system

#30

20070217800

2007-09-20

Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device

#31