MULTIFUNCTIONAL SAMPLE STAGE FOR IN-SITU TESTING WITH TRANSMISSION ELECTRON MICROSCOPE AND ATOM PROBE TOMOGRAPHY

ELECTRON SPECTROSCOPY APPARATUS AND METHODS

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

JUNCTION BETWEEN HEXABORIDE-CONTAINING AND TANTALUM-CONTAINING COMPONENTS

ELECTRICAL AND THERMAL CONNECTION CABLE FOR CHARGED PARTICLE MICROSCOPES

FOCUSED ION BEAM APPARATUS AND CONTROL METHOD THEREOF

SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY

AUTOMATIC GRID FINGER DETECTION

METHOD FOR CREATING DETECTION DATA IN ELECTRON BEAM APPLICATION DEVICE, METHOD FOR SYNTHESIZING IMAGE OF OBJECT BEING IRRADIATED, PROGRAM, RECORDING MEDIUM, AND ELECTRON BEAM APPLICATION DEVICE

IMAGING THOUSANDS OF ELECTRON BEAMS DURING WORKPIECE INSPECTION

Vacuum Processing Device

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE

Processor System, Correction Method, and Correction Program

LUMINESCENCE METHOD FOR THE IN-LINE DETECTION OF ATOMIC SCALE DEFECTS DURING FABRICATION OF 4H-SIC DIODES

Electron gun and electron beam application apparatus

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

Electron Microscope

Cathodoluminescence focal scans to characterize 3D NAND CH profile

Semiconductor charged particle detector for microscopy

ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD

Scanning Electron Microscope

METHOD TO PREPARE A SAMPLE FOR ATOM PROBE TOMOGRAPHY (APT), PREPARATION DEVICE TO PERFORM SUCH METHOD AND METHOD TO INVESTIGATE A REGION OF INTEREST OF A SAMPLE INCLUDING SUCH PERFORMING METHOD

TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR

Multi-beam image acquisition apparatus and multi-beam image acquisition method

Automated tomography field ion microscope

Microscope

Graphene based substrates for imaging

Atom probe tomography specimen preparation

Method for analyzing the 3D structure of biomolecules

System and method for performing three-dimensional compositional analyses

Method of imaging a 2D sample with a multi-beam particle microscope

ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION

Energy beam input to atom probe specimens from multiple angles

Apparatus for transmission electron microscopy cathodoluminescence

Atomic layer deposition of fluoride thin films

Correlation between emission spots utilizing CAD data in combination with emission microscope images

Method for image adjustment and charged particle beam system

DEVICE FOR PROVIDING ELECTRONS AND METHOD FOR MAKING THE SAME

MULTI-COLUMN SCANNING ELECTRON MICROSCOPY SYSTEM

SCANNING ELECTRON MICROSCOPE

Charged particle beam device, objective lens module, electrode device, and method of inspecting a specimen

METHOD FOR CONTROLLING A UNIT OF A PARTICLE BEAM DEVICE AND PARTICLE BEAM DEVICE FOR CARRYING OUT THE METHOD

Charged particle beam apparatus and sample observation method using the same

Atom probe inspection device, field ion microscope, and distortion correction method

CHARGED PARTICLE BEAM APPARATUS

Method of imaging a 3D sample with a multi-beam particle microscope

SEM FOV fingerprint in stochastic EPE and placement measurements in large FOV SEM devices

Apparatus of plural charged particle beams

Atom probe tomography specimen preparation

Systems and methods for using multimodal imaging to determine structure and atomic composition of specimens

Semiconductor charged particle detector for microscopy

Electron energy loss spectroscopy with adjustable energy resolution

Methods for acquiring planar view stem images of device structures

System and method for photocathode illumination inspection

Electron beam device and sample inspection method

Laser processing system and laser processing method

Charged particle beam apparatus and sample observation method using superimposed comparison image display

Method for determining the shape of a sample tip for atom probe tomography

Automated TEM sample preparation

Stage device and charged particle beam device

Method and apparatus for atomic probe tomography

Transmission electron microscope micro-grid and method for making the same

Retractable detector

Miniature device for ultra high sensitivity and stability probing in vacuum

Systems and method for using multimodal imaging to determine structure and atomic composition of specimens

Field ionization source, ion beam apparatus, and beam irradiation method

Point-spread-function measurement device and measurement method, image acquisition apparatus, and image acquisition method

Multi-column scanning electron microscopy system

Detector supplement device for spectroscopy setup

Electron beam generation for transmission electron microscope

Optical-cavity based ponderomotive phase plate for transmission electron microscopy

Radiation Analyzing Apparatus

Multi-column scanning electron microscopy system

Charged particle beam apparatus

Sample chamber device for electron microscope, and electron microscope comprising same

Beam blanker and method for blanking a charged particle beam

Wide field-of-view atom probe

Retractable detector

Atom probe with vacuum differential

Charged-particle microscope with in situ deposition functionality

Ion beam device

CHARGED PARTICLE DETECTOR

Method for evaluating structural change during production process, and analysis program

Quantitative secondary electron detection

Scanning electron microscope

Laminated film and process for manufacturing the same, as well as method for analyzing laminated film

Scanning electron microscope and electron trajectory adjustment method therefor

Automated TEM sample preparation

Multi mode system with a dispersion X-ray detector

Systems and methods for using multimodal imaging to determine structure and atomic composition of specimens

Detection assembly, system and method

TRANSPORT DEVICE, TREATMENT DEVICE, VACUUM DEVICE, AND CHARGED PARTICLE BEAM DEVICE

Method of preparing a plan-view transmission electron microscope sample used in an integrated circuit analysis

Electron source

Charged particle beam device and inspection device

Sample holder and analytical vacuum device

Charged Particle Beam Apparatus

Defect image classification apparatus

Electron spectrometer and measurement method

Method and apparatus for inspection of scattered hot spot areas on a manufactured substrate

Near-field optical transmission electron emission microscope

Sample processing evaluation apparatus

Ion beam device and emitter tip adjustment method

Method for the correction of electron proximity effects

Method and Apparatus for Reviewing Defects

Sample holder and charged particle device

Electron microscope

Electron microscope

RAPID TEM SAMPLE PREPARATION METHOD WITH BACKSIDE FIB MILLING

Electron microscope and method of operating same

Charged particle microscope with improved spectroscopic functionality

Image creating method and imaging system for performing the same

Method of adjusting a stigmator in a particle beam apparatus and a Particle beam system

Source for selectively providing positively or negatively charged particles for a focusing column

Device and method of detecting and generating combined modulated particle wave-fronts

Method for studying a zone of an object so as to determine a mass-thickness and a composition thereof by using an electron beam and measurements of X-ray radiation intensity

Electron microscope with plural X-ray detectors for acquiring elemental spectrum

Method and compound system for inspecting and reviewing defects

INTERFACE, A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENVIRONMENT AND A SCANNING ELECTRON MICROSCOPE

Charged particle beam apparatus and inspection method using the same

Quantitative secondary electron detection

Automated TEM sample preparation

Image evaluation method and charged particle beam device

E-beam inspection apparatus and method of using the same on various integrated circuit chips

Composite charged particle beam apparatus

Semiconductor inspection system and methods of inspecting a semiconductor device using the same

Electron detection system

Spectroscopy in a transmission charged-particle microscope

Scanning electron microscope and methods of inspecting and reviewing samples

Electron microscope and sample observation method

Radiation Sensor, and its Application in a Charged-Particle Microscope

Pattern shape evaluation method, semiconductor device manufacturing method, and pattern shape evaluation device

Computational scanning microscopy with improved resolution

Charged particle beam apparatus

Characterization method for a reservoir micro pore structure and a system thereof

System and method for simultaneous detection of secondary electrons and light in a charged particle beam system

Inspection apparatus

Method and apparatus for sample extraction and handling

Semiconductor inspection device including a counter electrode with adjustable potentials used to obtain images for detection of defects, and inspection method using charged particle beam

Method for manufacturing electron source

Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses

Charged particle beam apparatus

Charged particle beam apparatus

Method of detecting electrons, an electron-detector and an inspection system

Electron emitter device with integrated multi-pole electrode structure

Inspection system and inspection image data generation method

Device and method for electron emission and device including such an electron emission system

Metal hexaboride cold field emitter, method of fabricating same, and electron gun

Method of using a phase plate in a transmission electron microscope

Inspection apparatus

Inspection system, inspection image data generation method, inspection display unit, defect determination method, and storage medium on which inspection display program is recorded

Radiation detector, radiation detection apparatus, and X-ray analyzer

Electron microscope and method of operating the same

Systems and methods for investigating a characteristic of a material using electron microscopy

Isotope ion microscope methods and systems

Inductively coupled plasma source as an electron beam source for spectroscopic analysis

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCOPE, OPTICAL AXIS ADJUSTMENT METHOD AND SPECIMEN OBSERVATION METHOD

Vector Potential Photoelectron Microscope

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

System and method for localization of large numbers of fluorescent markers in biological samples

Method and apparatus for inspection of scattered hot spot areas on a manufactured substrate

INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGRAPHIC ANALYSIS

Laser Atom Probe and Laser Atom Probe Analysis Methods

Sample surface inspection apparatus and method

Method and system for 4D tomography and ultrafast scanning electron microscopy

ATOM PROBE PULSE ENERGY

Device for generating wide spectral band laser pulses, particularly for a tomographic atom probe

Isotope ion microscope methods and systems

Gas charge container, atom probe apparatus, and method for analyzing hydrogen position in material

Electron beam inspection method and electron beam inspection apparatus

ELECTRON IMAGING APPARATUS WITH IMAGE PROCESSING

Magnetic lens, method for focusing charged particles and charged particle energy analyzer

AMBIENT PRESSURE PHOTOELECTRON MICROSCOPE

Method and apparatus for sample extraction and handling

LASER ATOM PROBES

ATOM PROBE DATA AND ASSOCIATED SYSTEMS AND METHODS

METHODS AND APPARATUSES TO ALIGN ENERGY BEAM TO ATOM PROBE SPECIMEN

ATOM PROBE DATA PROCESSES AND ASSOCIATED SYSTEMS

High resolution gas field ion column

Atom probe

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

Method for preparing specimens for atom probe analysis and specimen assemblies made thereby

Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method

ATOM PROBE ELECTRODE TREATMENTS

Atomically sharp iridium tip

Scanning probe microscopy cantilever, corresponding manufacturing method, scanning probe microscope, and scanning method

Electron beam inspection method and electron beam inspection apparatus

Atom Probe Evaporation Processes

Sample surface inspection apparatus and method

Charged particle spin polarimeter, microscope, and photoelectron spectroscope

Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system

Laser atom probe

Method to determine 3-d elemental composition and structure of biological and organic materials via atom probe microscopy

Short duration variable amplitude high voltage pulse generator

Detecting apparatus and device manufacturing method

Charged particle beam apparatus and method for operating the same

High resolution atom probe

Sample surface inspection apparatus and method

Photoemission electron microscopy and measuring method using the microscopy

Laser stimulated atom probe characterization of semiconductor and dielectric structures

Electrode and filament coupled by adapter

Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy

E-beam inspection apparatus and method of using the same on various integrated circuit chips

Virtual ground for target substrate using floodgun and feedback control

Mirror pulse compressor for electron beam apparatus