205255 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Electron or ion microscopes; Electron or ion diffraction tubes Electron or ion diffraction tubes
Sub-classes:HIGH TEMPERATURE NV CENTER SENSING UP TO 1400K
#2System and Method for Fully Integrated Microcrystal Electron Diffraction (MICROED)
#3DEVICES AND SYSTEMS FOR SPATIAL SUBTRACTION OF ELECTRON BACKSCATTER DIFFRACTION PATTERNS
#4Transmission Electron Microscope
#5METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE
#6System and method for preparation and delivery of biological samples for charged particle analysis
#7SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
#8Method and system for generating a diffraction image
#9Method and system for generating a diffraction image
#10Crystal defect observation method for compound semiconductor
#11Transmission electron microscope and inspection method using transmission electron microscope
#12System and method for preparation and delivery of biological samples for charged particle analysis
#13System and method for preparation and delivery of biological samples for charged particle analysis
#14Method of controlling transmission electron microscope and transmission electron microscope
#15Method and system for zone axis alignment
#16System for electron diffraction analysis
#17Interferometric electron microscope
#18Electron gun and electron beam application device
#19Packaging of semiconductor X-ray detectors
#20Electron diffraction imaging system for determining molecular structure and conformation
#21Holography reconstruction method and program
#22Electron microscope for magnetic field measurement and magnetic field measurement method
#23Particle beam device, observation method, and diffraction grating
#24Method of acquiring holograms by off-axis electron holography in precession mode
#25Charged particle beam device
#26Electron microscope and imaging method
#27Phase contrast transmission electron microscope device
#28Electron microscope and specimen tilt angle adjustment method
#29Packaging of semiconductor X-ray detectors
#30Image capture assembly and method for electron back scatter diffraction
#31Charged particle beam device for moving an aperture having plurality of openings and sample observation method
#32Low energy electron microscopy
#33High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment
#34Electron microscope
#35Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope
#36Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate
#37Method of investigating the wavefront of a charged-particle beam
#38Protein layers and their use in electron microscopy
#39Phase plate and electron microscope
#40Method of preparing and imaging a lamella in a particle-optical apparatus
#41Phase-shifting element and particle beam device having a phase-shifting element
#42Diffraction microscopy
#43Precession diffraction charged particle beam system
#44Method of electron diffraction tomography
#45Physical properties measuring method and apparatus
#46Phase-shifting element and particle beam device having a phase-shifting element
#47Charging of a hole-free thin film phase plate
#48Method and device for measuring electron diffraction of a sample
#49DIFFRACTION PATTERN CAPTURING METHOD AND CHARGED PARTICLE BEAM DEVICE
#50Transmission electron microscope and method for observing specimen image with the same
#51Method, device and system for measuring nanoscale deformations
#52Protein Layers And Their Use In Electron Microscopy
#53Apparatus and method for generating femtosecond electron beam
#54Electron spectroscopy
#55Interferometer
#56Electron beam device
#57Phase plate for electron microscope and method for manufacturing same
#58Charged particle beam equipments, and charged particle beam microscope
#59Electron interferometer or electron microscope
#60Phase-shifting element and particle beam device having a phase-shifting element
#61Interferometer having three electron biprisms
#62Electron microscope and combined illumination lens
#63Protein structure
#64Interferometer
#65Aberration-correcting cathode lens microscopy instrument
#66Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test
#67Method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor
#68Crystallographic metrology and process control
#69Energy filter image generator for electrically charged particles and the use thereof