205256 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Electron or ion microscopes; Electron or ion diffraction tubes; Electron or ion diffraction tubes using scanning ray
Charged particle beam apparatus
#2DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTROMETERS
#3CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
#4METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
#5METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING
#6Charged Particle Gun, Charged Particle Beam System, and Lock Nut
#7Methods and systems for acquiring electron backscatter diffraction patterns
#8Electron diffraction imaging system for determining molecular structure and conformation
#9Method and apparatus for enhancing SE detection in mirror-based light imaging charged particle microscopes
#10Scanning transmission electron microscope
#11Method of determining the deflection of an electron beam resulting from an electric field and/or a magnetic field
#12Method of performing electron diffraction pattern analysis upon a sample
#13LEED for SEM
#14System and process for measuring strain in materials at high spatial resolution
#15Method and system of evaluating distribution of lattice strain on crystal material
#16Method and system of evaluating distribution of lattice strain on crystal material
#17Method of using a direct electron detector for a TEM
#18Methods and devices for high throughput crystal structure analysis by electron diffraction
#19SACP method and particle optical system for performing the method
#20Scanning transmission electron microscope and scanning transmission electron microscopy
#21Method for measuring physical parameters of at least one micrometric or nanometric dimensional phase in a composite system
#22Scanning transmission electron microscope and scanning transmission electron microscopy
#23Method and apparatus for measuring the physical properties of micro region