205416 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Gas-filled discharge tubes operating with cathodic sputtering; Testing and control Detecting or avoiding eroding through
FILM FORMING APPARATUS AND FILM FORMING METHOD
#2SUPPORT UNIT, APPARATUS FOR TREATING SUBSTRATE WITH THE SAME AND METHOD FOR TREATING SUBSTRATE WITH THE SAME
#3Film forming apparatus and film forming method
#4System and method for detecting abnormality of thin-film deposition process
#5Film forming method, film forming apparatus, and program
#6Interchangeable magnet pack
#7Rotary magnetron magnet bar and apparatus containing the same for high target utilization
#8Sputtering apparatus
#9Interchangeable magnet pack
#10Backing plate for a sputter target, sputter target, and sputter device
#11Sputtering target with reverse erosion profile surface and sputtering system and method using the same
#12Rotary magnetron magnet bar and apparatus containing the same for high target utilization
#13Sputtering apparatus
#14Method for predicting and compensating erosion in a magnetron sputtering target
#15PVD target with end of service life detection capability
#16PVD TARGET WITH END OF SERVICE LIFE DETECTION CAPABILITY
#17MAGNETIC FIELD GENERATION CONTROL UNIT AND MAGNETRON SPUTTERING APPARATUS AND METHOD USING THE SAME
#18Prediction and compensation of erosion in a magnetron sputtering target
#19Sputtering apparatus
#20PVD target with end of service life detection capability
#21PVD target with end of service life detection capability
#22METHOD OF USING A TARGET HAVING END OF SERVICE LIFE DETECTION CAPABILITY
#23System and apparatus for real-time monitoring and control of sputter target erosion
#24Plasma processing apparatus and components thereof, and method for detecting life span of the components
#25Apparatus, method and system for monitoring chamber parameters associated with a deposition process
#26Sputter target monitoring system
#27Method and system for target lifetime
#28Device for measuring the profile of a metal film sputter deposition target, and system and method employing same