205639 ⎘
Particle spectrometers or separator tubes; Energy spectrometers, e.g. alpha-, beta-spectrometers; Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Sub-classes:INSTRUMENT, INCLUDING AN ELECTROSTATIC LINEAR ION TRAP, FOR ANALYZING IONS
#2ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, REFLECTING IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, AND SPIN VECTOR DISTRIBUTION IMAGING DEVICE
#3Instrument, including an electrostatic linear ion trap, for analyzing ions
#4Instrument, including an electrostatic linear ion trap, for separating ions
#5High resolution electron energy analyzer
#6Electron spectroscopy system
#7ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
#8Accelerator mass spectrometry device for simultaneously measuring isotopes
#9Monolithic collimator and energy analyzer for ion spectrometry
#10Ion sorter
#11Analyser arrangement for particle spectrometer
#12Electron spectrometer and measurement method
#13Method of decoding multiplet containing spectra in open isochronous ion traps
#14Method and device for measuring energy of electrons excited by sunlight
#15Ultra-compact plasma spectrometer
#16Parallel radial mirror analyser with an angled zero-volt equipotential exit grid for scanning electron microscopes
#17Sequential radial mirror analyser
#18Charged particle energy analysers and methods of operating charged particle energy analysers
#19Open trap mass spectrometer
#20Charged particle analyzer
#21Time-of-flight segmented Faraday
#22Electrostatic electron spectrometry apparatus
#23Monochromator and radiation source with monochromator
#24Spherical aberration corrected electrostatic lens, input lens, electron spectrometer, photoemission electron microscope and measuring system
#25Ion composition analyzer with increased dynamic range
#26Field emitter arrangement and method of cleansing an emitting surface of a field emitter
#27Multi-reflecting time-of-flight mass spectrometer with isochronous curved ion interface
#28Ion optics systems
#29Charged particle spectrometer and detector therefor
#30Energy filter image generator for electrically charged particles and the use thereof
#31Gas chromatograph and mass spectrometer
#32Focal plane detector assembly of a mass spectrometer
#33Chemical sensor system
#34Sensing data related to charged particles to predict an anomaly in an environment
#35Spiral electrostatic analyzer
#36Beam combiner
#37Controlling charged particles with inhomogeneous electrostatic fields