ClassID:

207119

H01L21/0279 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof; Making masks on semiconductor bodies for further photolithographic processing not provided for in group or comprising organic layers characterised by the treatment of photoresist layers Ionlithographic processes

Recent Application in this class:
#1
20250362603
2025-11-27

PHOTORESIST UNDERLAYER MATERIALS AND ASSOCIATED METHODS

#2
20250348001
2025-11-13

METHOD FOR PRODUCING LAMINATE AND METHOD FOR PRODUCING SEMICONDUCTOR ELEMENT

#3
20250085631
2025-03-13

PHOTORESIST UNDERLAYER MATERIALS AND ASSOCIATED METHODS

#4
20240222073
2024-07-04

ION BEAM LITHOGRAPHY AND NANOENGINEERING

#5
20220181152
2022-06-09

Forming contact holes with controlled local critical dimension uniformity

#6
20220100093
2022-03-31

Fabrication of high-aspect ratio nanostructures by localized nanospalling effect

#7
20210286266
2021-09-16

Material for forming organic film, method for forming organic film, patterning process, and compound

#8
20210240083
2021-08-05

Nonlinear Scattering Lithography

#9
20180374695
2018-12-27

Pattern forming method

#10
20180204719
2018-07-19

Multiple patterning approach using ion implantation

#11
20180047564
2018-02-15

METHOD TO TUNE CONTACT CD AND REDUCE MASK COUNT BY TILTED ION BEAM

#12
20170200584
2017-07-13

Continuous writing of pattern

#13
20160276149
2016-09-22

Spin-on layer for directed self assembly with tunable neutrality

#14
20160225611
2016-08-04

Compounders for enhancing generation of chemical species

#15
20160215385
2016-07-28

Multiple exposure treatment for processing a patterning feature

#16
20150348775
2015-12-03

Projection patterning with exposure mask

#17
20150255298
2015-09-10

Sequential infiltration synthesis for advanced lithography

#18
20140234772
2014-08-21

Photo resist (PR) profile control

#19
20120241411
2012-09-27

Sequential infiltration synthesis for advanced lithography

#20
20110163068
2011-07-07

Multibeam System

#21
20060079067
2006-04-13

Methods for aligning patterns on a substrate based on optical properties of a mask layer and related devices