H01L - CPC Classification

• H01L21/00 » Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof 458
• H01L22/00 » {Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor } 115
• H01L2221/00 » Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by 101
• H01L2223/00 » Details relating to semiconductor or other solid state devices covered by the group 8
• H01L2224/00 » Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by 10
• H01L2225/00 » Details relating to assemblies covered by the group but not provided for in its subgroups 5
• H01L2227/00 » Indexing scheme for devices consisting of a plurality of semiconductor or other solid state components formed in or on a common substrate covered by group 3
• H01L2229/00 » Indexing scheme for semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, for details of semiconductor bodies or of electrodes thereof, or for multistep manufacturing processes therefor 11
• H01L2251/00 » Indexing scheme relating to organic semiconductor devices covered by group 1
• H01L23/00 » Details of semiconductor or other solid state devices 197
• H01L24/00 » {Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto} 397
• H01L25/00 » Assemblies consisting of a plurality of individual semiconductor or other solid state devices {; Multistep manufacturing processes thereof} 345
• H01L27/00 » Devices consisting of a plurality of semiconductor or other solid state components formed in or on a common substrate 101
• H01L28/00 » {Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor } 349
• H01L29/00 » Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; {Multistep manufacturing processes therefor} 97
• H01L2924/00 » Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by 54,2K
• H01L2933/00 » Details relating to devices covered by the group but not provided for in its subgroups 3
• H01L31/00 » Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof 158
• H01L33/00 » Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof 310
• H01L35/00 » Thermo-electric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermo-electric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof 286
• H01L37/00 » Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using Nernst-Ettinghausen effect; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof 128
• H01L39/00 » Devices using superconductivity; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof 32
• H01L41/00 » Piezo-electric devices in general; Electrostrictive devices in general; Magnetostrictive devices in general; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof 82
• H01L43/00 » Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof 59
• H01L45/00 » Solid state devices adapted for rectifying, amplifying, oscillating or switching without a potential-jump barrier or surface barrier, e.g. dielectric triodes; Ovshinsky-effect devices; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof 163
• H01L47/00 » Bulk negative resistance effect devices, e.g. Gunn-effect devices; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof 32
• H01L49/00 » Solid state devices not provided for in groups to and and not provided for in any other subclass; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof 53
• H01L51/00 » Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof 210