ClassID:

207191

H01L21/2233 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AB compounds with or without impurities, e.g. doping materials; Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a gaseous phase Diffusion into or out of AB compounds

Recent Application in this class:
#1
20250301689
2025-09-25

HIGH-ELECTRON-MOBILITY TRANSISTOR AND METHOD OF MANUFACTURING

#2
20250194188
2025-06-12

GALLIUM NITRIDE DRAIN STRUCTURES AND METHODS OF FORMING THE SAME

#3
20250149338
2025-05-08

METHODS OF FORMING SEMICONDUCTOR DEVICES INCLUDING SELF-ALIGNED P-TYPE AND N-TYPE DOPED REGIONS

#4
20240282841
2024-08-22

GAN DEVICE WITH N2 PRE-TREATMENT AND METHOD OF PERFORMING N2 PRE-TREATMENT

#5
20230387282
2023-11-30

HIGH-ELECTRON-MOBILITY TRANSISTOR AND METHOD OF MANUFACTURING

#6
20230387203
2023-11-30

Gallium nitride drain structures and methods of forming the same

#7
20230015133
2023-01-19

SEMI-CONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

#8
20220102544
2022-03-31

Semiconductor device, method for manufacturing the same, power circuit, and computer

#9
20210351288
2021-11-11

Semiconductor structure having both enhancement mode group III-N high electron mobility transistors and depletion mode group III-N high electron mobility transistors

#10
20210351037
2021-11-11

Method for producing a semiconductor component comprising performing a plasma treatment, and semiconductor component

#11
20200357642
2020-11-12

Method for manufacturing semiconductor device

#12
20200328296
2020-10-15

Semiconductor structure having both enhancement mode group III-N high electron mobility transistors and depletion mode group III-N high electron mobility transistors

#13
20200227547
2020-07-16

Semiconductor devices with doped regions functioning as enhanced resistivity regions or diffusion barriers, and methods of fabrication therefor

#14
20200152454
2020-05-14

Multi-state device based on ion trapping

#15
20200105917
2020-04-02

Nitride semiconductor device and method for manufacturing same

#16
20190280112
2019-09-12

Semiconductor device, method for manufacturing the same, power circuit, and computer

#17
20190280111
2019-09-12

Semiconductor device, semiconductor device manufacturing method, power supply circuit, and computer

#18
20190198623
2019-06-27

Semiconductor devices with doped regions functioning as enhanced resistivity regions or diffusion barriers, and methods of fabrication therefor

#19
20190164750
2019-05-30

Multi-state device based on ion trapping

#20
20190157448
2019-05-23

Manufacturing method of vertical GaN-based semiconductor device and vertical GaN-based semiconductor device

#21
20180261698
2018-09-13

Surface treatment process performed on devices for TFT applications

#22
20180254373
2018-09-06

Process of forming light-receiving device

#23
20180218909
2018-08-02

PLASMA SHALLOW DOPING AND WET REMOVAL OF DEPTH CONTROL CAP

#24
20180218908
2018-08-02

PLASMA SHALLOW DOPING AND WET REMOVAL OF DEPTH CONTROL CAP

#25
20180218907
2018-08-02

Plasma shallow doping and wet removal of depth control cap

#26
20170373149
2017-12-28

III-V extension by high temperature plasma doping

#27
20170162391
2017-06-08

Semiconductor device and method for producing same

#28
20170133497
2017-05-11

Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation

#29
20170062221
2017-03-02

Liquid immersion doping

#30
20160260817
2016-09-08

Surface treatment of semiconductor substrate using free radical state fluorine particles

#31
20150318375
2015-11-05

Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation

#32
20150279678
2015-10-01

IIIA-VA group semiconductor single crystal substrate and method for preparing same

#33
20150255549
2015-09-10

Controlling GaAsP/SiGe interfaces

#34
20150098481
2015-04-09

Optical signal amplification

#35
20150072498
2015-03-12

Non-planar III-V field effect transistors with conformal metal gate electrode and nitrogen doping of gate dielectric interface

#36
20140093996
2014-04-03

Method and apparatus for diffusion into semiconductor materials

#37
20140091308
2014-04-03

Self-aligned structures and methods for asymmetric GaN transistors and enhancement mode operation

#38
20140084387
2014-03-27

Non-planar III-V field effect transistors with conformal metal gate electrode and nitrogen doping of gate dielectric interface

#39
20130075748
2013-03-28

Method and system for diffusion and implantation in gallium nitride based devices

#40
20120051378
2012-03-01

Photodetection

#41
20120018702
2012-01-26

Surface and gas phase doping of III-V semiconductors

#42
20110263111
2011-10-27

GROUP III-NITRIDE N-TYPE DOPING

#43
20110133204
2011-06-09

Light emitting diode and manufacturing method thereof

#44
20070272990
2007-11-29

Diffusion tube, dopant source for a diffusion process and diffusion method using the diffusion tube and the dopant source

#45
20070256627
2007-11-08

Method of ultra-shallow junction formation using Si film alloyed with carbon

#46
20070224790
2007-09-27

Zn ion implanting method of nitride semiconductor