H01L21/38 - CPC Classification Index

ClassID:

207242 ⎘

H01L21/38 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups, , , and with or without impurities, e.g. doping materials Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions

Sub-classes:

H01L21/383 » using diffusion into or out of a solid from or into a gaseous phase 66
H01L21/385 » using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer 104
H01L21/388 » using diffusion into or out of a solid from or into a liquid phase, e.g. alloy diffusion processes 5

Recent Application in this class:

20250329639

2025-10-23

INTEGRATED CIRCUIT WITH FRONTSIDE AND BACKSIDE CONDUCTIVE LAYERS AND EXPOSED BACKSIDE SUBSTRATE

20240355924

2024-10-24

SEMICONDUCTOR DEVICE HAVING MOS TRANSISTOR FOR EFFICIENT STRESS TRANSFER

20240274591

2024-08-15

SEMICONDUCTOR DEVICE WITH COMMUNICATION RING

20240186241

2024-06-06

INTEGRATED CIRCUIT WITH FRONTSIDE AND BACKSIDE CONDUCTIVE LAYERS AND EXPOSED BACKSIDE SUBSTRATE

20230065663

2023-03-02

Integrated circuit with frontside and backside conductive layers and exposed backside substrate

20220238711

2022-07-28

SEMICONDUCTOR DEVICE HAVING MOS TRANSISTOR FOR EFFICIENT STRESS TRANSFER

20200403104

2020-12-24

Semiconductor device and method for manufacturing semiconductor device

20200313009

2020-10-01

Solar cell and solar cell module

20200075714

2020-03-05

Self-forming spacers using oxidation

#10

20190378716

2019-12-12

Infrared optical sensor and manufacturing method thereof

#11

20190189464

2019-06-20

Methods and apparatus for gettering impurities in semiconductors

#12

20190181274

2019-06-13

Thin film transistor having supporting layer, method for manufacturing the same and display device comprising the same

#13

20190088787

2019-03-21

Low temperature polysilicon thin film transistor and fabricating method thereof and array substrate

#14

20180294334

2018-10-11

Self-forming spacers using oxidation

#15

20180151695

2018-05-31

Fin field effect transistor (finFET) device structure and method for forming the same

#16

20180083094

2018-03-22

Semiconductor device

#17

20170280566

2017-09-28

Wafer-level manufacturing method for embedding passive element in glass substrate

#18

20170263702

2017-09-14

Self-forming spacers using oxidation

#19

20170200889

2017-07-13

Method for manufacturing transistor according to selective printing of dopant

#20

20170133538

2017-05-11

Method of producing differently doped zones in a silicon substrate, in particular for a solar cell

#21

20160043072

2016-02-11

Systems and methods for integrating bootstrap circuit elements in power transistors and other devices

#22

20150108539

2015-04-23

FABRICATION METHOD OF SEMICONDUCTOR DEVICE AND THE SEMICONDUCTOR DEVICE

#23

20140167069

2014-06-19

Systems and methods for integrating bootstrap circuit elements in power transistors and other devices

#24

20140042541

2014-02-13

Creating anisotropically diffused junctions in field effect transistor devices

#25

20120238081

2012-09-20

Printed Material Constrained By Well Structures And Devices Including Same

#26

20120235145

2012-09-20

Printed material constrained by well structures and devices including same

#27

20120119294

2012-05-17

Creating anisotropically diffused junctions in field effect transistor devices

#28

20110095342

2011-04-28

Printed material constrained by well structures

#29

20090065875

2009-03-12

Metal-oxide-semiconductor device with a doped titanate body

#30

20070048909

2007-03-01

Superjunction device with improved ruggedness

#31

20050082570

2005-04-21

Superjunction device with improved ruggedness

#32

16252932

2020-04-28

Localized tunneling enhancement for semiconductor devices

#33

12849782

2016-10-25

Method for forming a superjunction device with improved ruggedness