ClassID:

207545

H01L21/8256 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof; Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using technologies not covered by one of groups, , , and

Recent Application in this class:
#1
20250056817
2025-02-13

RESISTOR GEOMETRY

#2
20240421151
2024-12-19

VERTICAL JUNCTION FIELD-EFFECT TRANSISTORS WITH SOURCE-DRAIN DIODE CELLS INTEGRATED AT DIE LEVEL

#3
20240387711
2024-11-21

Devices Having a Semiconductor Material That Is Semimetal in Bulk and Methods of Forming the Same

#4
20240379832
2024-11-14

CMOS FABRICATION METHODS FOR BACK-GATE TRANSISTOR

#5
20240304622
2024-09-12

SEMICONDUCTOR DEVICE INCLUDING TWO-DIMENSIONAL MATERIAL AND METHOD OF MANUFACTURING THE SAME

#6
20240222506
2024-07-04

FIELD EFFECT TRANSISTOR COMPRISING TRANSITION METAL DICHALCOGENIDE (TMD) AND FERROELECTRIC MATERIAL

#7
20240120336
2024-04-11

3D NANOSHEET STACK WITH DUAL SELECTIVE CHANNEL REMOVAL OF HIGH MOBILITY CHANNELS

#8
20240055429
2024-02-15

2D-MATERIAL GATE-ALL-AROUND COMPLEMENTARY FET INTEGRATION

#9
20230378334
2023-11-23

CMOS Fabrication Methods for Back-Gate Transistor

#10
20230261098
2023-08-17

Semiconductor device having channel structure with 2D material

#11
20230260999
2023-08-17

3D selective material transformation to integrate 2D material elements

#12
20230098467
2023-03-30

THIN FILM TRANSISTORS HAVING A SPIN-ON 2D CHANNEL MATERIAL

#13
20220344330
2022-10-27

Field-Effect Transistors Having Transition Metal Dichalcogenide Channels and Methods of Manufacture

#14
20220293591
2022-09-15

ELECTRONIC CIRCUITS AND CIRCUIT ELEMENTS

#15
20220293308
2022-09-15

Resistor geometry

#16
20220238704
2022-07-28

Devices having a semiconductor material that is semimetal in bulk and methods of forming the same

#17
20220231153
2022-07-21

CMOS Fabrication Methods for Back-Gate Transistor

#18
20220199812
2022-06-23

Transistors with monocrystalline metal chalcogenide channel materials

#19
20210043756
2021-02-11

Devices having a semiconductor material that is semimetal in bulk and methods of forming the same

#20
20200006535
2020-01-02

Devices having a semiconductor material that is semimetal in bulk and methods of forming the same

#21
20200006337
2020-01-02

Field-effect transistors having transition metal dichalcogenide channels and methods of manufacture

#22
20190393249
2019-12-26

Stacked thin film transistors

#23
20190157463
2019-05-23

TFT structure based on flexible multi-layer graphene quantum carbon substrate material and method for manufacturing same

#24
20190123133
2019-04-25

MIM capacitor and method of forming the same

#25
20190103496
2019-04-04

2-D material transistor with vertical structure

#26
20190088722
2019-03-21

Method for making three dimensional complementary metal oxide semiconductor carbon nanotube thin film transistor circuit

#27
20180350806
2018-12-06

Field-effect transistors having transition metal dichalcogenide channels and methods of manufacture

#28
20180240714
2018-08-23

Dual channel FinFETs having uniform fin heights

#29
20180240713
2018-08-23

Dual channel FinFETs having uniform fin heights

#30
20180190799
2018-07-05

Devices having a semiconductor material that is semimetal in bulk and methods of forming the same

#31
20180175213
2018-06-21

2-D material transistor with vertical structure

#32
20180166561
2018-06-14

Contact structure and extension formation for III-V nFET

#33
20180108750
2018-04-19

Techniques for forming transistors on the same die with varied channel materials

#34
20180097035
2018-04-05

Complementary thin film transistor and manufacturing method thereof

#35
20180061968
2018-03-01

Contact structure and extension formation for III-V nFET

#36
20170213820
2017-07-27

Decoupling capacitor on strain relaxation buffer layer

#37
20170207299
2017-07-20

MIM capacitor and method of forming the same

#38
20170125554
2017-05-04

Devices having a semiconductor material that is semimetal in bulk and methods of forming the same

#39
20170117360
2017-04-27

Stacked strained and strain-relaxed hexagonal nanowires

#40
20170098717
2017-04-06

Devices having transition metal dichalcogenide layers with different thicknesses and methods of manufacture

#41
20170062592
2017-03-02

Contact structure and extension formation for III-V nFET

#42
20170062215
2017-03-02

Contact structure and extension formation for III-V nFET

#43
20170040322
2017-02-09

Semiconductor devices and methods of manufacturing the same

#44
20170012117
2017-01-12

Transition metal dichalcogenide semiconductor assemblies

#45
20160343705
2016-11-24

Contact structure and extension formation for III-V nFET

#46
20160276343
2016-09-22

Field-effect transistors having transition metal dichalcogenide channels and methods of manufacture

#47
20160247724
2016-08-25

Method, apparatus and system for advanced channel CMOS integration

#48
20160155668
2016-06-02

Germanium FinFETs with metal gates and stressors

#49
20160093619
2016-03-31

III-V FinFET CMOS with III-V and germanium-containing channel closely spaced

#50
20160047059
2016-02-18

Two-dimensional large-area growth method for chalcogen compound, method for manufacturing CMOS-type structure, film of chalcogen compound, electronic device comprising film of chalcogen compound, and CMOS-type structure

#51
20120295423
2012-11-22

Graphene based three-dimensional integrated circuit device

#52
20120286261
2012-11-15

Semiconductor device and manufacturing method thereof

#53
20110215300
2011-09-08

Graphene based three-dimensional integrated circuit device

#54
20110068407
2011-03-24

Germanium FinFETs with metal gates and stressors

#55
15185007
2017-05-30

Method of forming semiconductor device

#56
14963740
2016-11-15

Tall strained high percentage silicon germanium fins for CMOS

#57
14948737
2017-02-14

Field effect transistor including strained germanium fins