207550 ⎘
Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Sub-classes:SEMICONDUCTOR TEST DEVICE AND METHOD OF MANUFACTURING THE SAME
#2SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSIS METHOD
#3PROBE CARD
#4Techniques for controlling precursors in chemical deposition processes
#5INSPECTION APPARATUS AND INSPECTION METHOD FOR SEMICONDUCTOR SUBSTRATE
#6Injection device and inspection and repairing method
#7ON-CHIP HEATER TEMPERATURE CALIBRATION
#8Contact terminal, inspection jig, and inspection apparatus
#9Probe card
#10Semiconductor failure analysis device and semiconductor failure analysis method
#11Semiconductor fault analysis device and semiconductor fault analysis method
#12Semiconductor device and forming method thereof
#13Semiconductor device and manufacturing method thereof
#14Systems and methods for measurement of misregistration and amelioration thereof
#15Method for simulating electricity of wafer chip
#16Monitoring system and method for verifying measurements in patterned structures
#17On-chip heater temperature calibration
#18Random characteristic evaluation of subject maps
#19Image judgment apparatus and image judgment method
#20Injection device, micro light emitting diode inspection and repairing equipment and inspection and repairing method
#21Peak power management of dice in a power network
#22Techniques for controlling precursors in chemical deposition processes
#23Method for converting a floating gate non-volatile memory cell to a read-only memory cell and circuit structure thereof
#24Processing method and plasma processing apparatus
#25Multi-path fault detection
#26Plating system, a plating system control method, and a storage medium containing a program for causing a computer to execute the plating system control method
#27Method for packaging circuits
#28Method for converting a floating gate non-volatile memory cell to a read-only memory cell and circuit structure thereof
#29Method of feature exaction from time-series of spectra to control endpoint of process
#30Verifying planarization performance using electrical measures
#31Method of evaluating carbon concentration of silicon sample, method of evaluating silicon wafer manufacturing process, method of manufacturing silicon wafer, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon wafer
#32Method for detecting thinning of an integrated circuit substrate via its rear face, and corresponding integrated circuit
#33Cutting apparatus and groove detecting method
#34Fault discrimination and calibration of scatterometry overlay targets
#35Plasma health determination in semiconductor substrate processing reactors
#36Method and system for data collection and analysis for semiconductor manufacturing
#37METHOD AND SYSTEM FOR DATA COLLECTION AND ANALYSIS FOR SEMICONDUCTOR MANUFACTURING
#38Method for post chemical mechanical polishing clean
#39Method of dynamic thermal management
#40Method of feature exaction from time-series of spectra to control endpoint of process
#41Apparatus and method for the measurement of pattern placement and size of pattern and computer program therefor
#42Plating system, a plating system control method, and a storage medium containing a program for causing a computer to execute the plating system control method
#43Array substrate, manufacturing method thereof, repairing method thereof, display panel and display device
#44Chemical mechanical polishing automated recipe generation
#45Kernel based cluster fault analysis
#46Pattern inspection apparatus
#47Metrology target, method and apparatus, target design method, computer program and lithographic system
#48System and method for wafer inspection with a noise boundary threshold
#49Apparatus and method for monitoring and predicting reliability of an integrated circuit
#50Continuous light inspection
#51Screening method for electrolytic capacitors
#52Scattering measurement system and method
#53Storage medium, shape calculation device, and shape measurement method
#54Method for packaging circuits
#55Charged particle beam device and inspection device
#56Range-based real-time scanning electron microscope non-visual binner
#57Charge dynamics effect for detection of voltage contrast defect and determination of shorting location
#58Method and system for iterative defect classification
#59Interposer for inspecting semiconductor chip
#60Dimension detection device and cassette
#61Pattern inspection apparatus and pattern inspection method
#62Circuits and methods of testing a device under test using the same
#63Photovoltaic inspection system and photovoltaic inspection method
#64System and method for equipment monitoring using a group candidate baseline and probabilistic model
#65Vision-guided alignment system
#66Imaging apparatus having a plurality of movable beam columns, and method of inspecting a plurality of regions of a substrate intended to be substantially identical
#67Optical acoustic substrate assessment system and method
#68Etching method and bevel etching apparatus
#69Electro-fluidic flow probe
#70Electro-fluidic flow probe
#71Film thickness measuring device and polishing device
#72Radiofrequency adjustment for instability management in semiconductor processing
#73Structure and method for testing stacked CMOS structure
#74Layout content analysis for source mask optimization acceleration
#75Interposer defect coverage metric and method to maximize the same
#76Systems and methods for fabricating semiconductor device structures
#77Bonding method, bonding apparatus and bonding system
#78Method and system for identifying a clean endpoint time for a chamber
#79Radiofrequency adjustment for instability management in semiconductor processing
#80Method of calibrating target values and processing systems configured to calibrate the target values
#81Interconnect solder bumps for die testing
#82Wafer examination device and wafer examination method
#83Test structure placement on a semiconductor wafer
#84Light activated test connections
#85Screening method for electrolytic capacitors
#86Method for packaging circuits
#87Wagering game with elements influenced by symbol array
#88Thermal management of tightly integrated semiconductor device, system and/or package
#89SEMICONDUCTOR CHIP MODULE AND SEMICONDUCTOR PACKAGE HAVING THE SAME
#90Abnormality determination system and abnormality determination method for processing apparatus
#91Array substrate for fringe field switching mode liquid crystal display device
#92Fabrication and testing method for nonvolatile memory devices
#93Graphene epitaxied on SiC, with an open band gap and mobility comparable to standard graphene with zero band gap
#94Plasma tuning rods in microwave resonator plasma sources
#95Pattern inspection apparatus and pattern inspection method
#96Layout content analysis for source mask optimization acceleration
#97Flexible electronic device and method for the fabrication of same
#98Substrate processing method and substrate processing system for performing the same
#99Method for packaging circuits
#100Methods and system for on-chip decoder for array test
#101Epitaxial silicon wafer and fabrication method thereof
#102Layout Content Analysis for Source Mask Optimization Acceleration
#103Method for quality control during ultrasonic
#104Examination method, examination apparatus and examination program
#105Method for packaging circuits
#106Sealing ring assembly and mounting method
#107Method of monitoring a surfactant in a microelectronic process by fluorescence
#108Detection and reduction of dielectric breakdown in semiconductor devices
#109Producing SiC packs on a wafer plane
#110Epitaxial silicon wafer and fabrication method thereof
#111Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chip
#112Method of processing semiconductor substrate responsive to a state of chamber contamination
#113Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chip
#114Sealing ring assembly and mounting method
#115Detection and reduction of dielectric breakdown in semiconductor devices
#116System and method for determining the temperature of a semiconductor wafer
#117IC chip with IC design modification detection
#118Steady-state IC thermal analysis with thermal decay curve characterization
#119Method of fabricating multijunction solar cells for space applications
#120Semiconductor device with authentication code