209415 ⎘
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Redistribution layers [RDL] for bonding areas Shape of the redistribution layers
Sub-classes:SEMICONDUCTOR PACKAGE AND OPERATING METHOD THEREOF
#2BONDED DIE STRUCTURES WITH IMPROVED BONDING AND METHODS OF FORMING THE SAME
#3LOGIC DRIVE WITH BRAIN-LIKE ELASTICITY AND INTEGRALITY BASED ON STANDARD COMMODITY FPGA IC CHIPS USING NON-VOLATILE MEMORY CELLS
#4REDISTRIBUTION LINES WITH PROTECTION LAYERS AND METHOD FORMING SAME
#5SACRIFICIAL TEST PAD
#6MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE THEREOF
#7REDISTRIBUTION LAYER METALLIC STRUCTURE AND METHOD
#8SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#9REDISTRIBUTION SUBSTRATE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
#10SEMICONDUCTOR STRUCTURE
#11BONDING SCHEME TO PROVIDE IMPROVED COPLANARITY AND HIGH JOINT YIELDS WITH REDUCED COSTS AND METHODS FOR FORMING THE SAME
#12SHIFTING CONTACT PAD FOR REDUCING STRESS
#13ELECTRONIC COMPONENT COMPRISING CONNECTION PILLARS
#14SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE WITH REDISTRIBUTION LINE, AND METHOD OF FORMING SEMICONDUCTOR DEVICE
#15SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE WITH REDISTRIBUTION LINE
#16SEMICONDUCTOR DEVICES INCLUDING RECOGNITION MARKS
#17SEMICONDUCTOR PACKAGE
#18SEMICONDUCTOR STRUCTURE, SEMICONDUCTOR CHIP INCLUDING SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE
#19SACRIFICIAL TEST PAD
#20SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#21Semiconductor Devices and Methods of Manufacturing
#22LEADING POINT OF DISCHARGE STRUCTURES FOR ELECTROSTATIC DISCHARGE PROTECTION AND METHODS OF FORMING THE SAME
#23SEMICONDUCTOR STRUCTURE AND METHOD FOR WAFER SCALE CHIP PACKAGE
#24INTEGRATED CIRCUIT FEATURES WITH OBTUSE ANGLES AND METHOD OF FORMING SAME
#25SEMICONDUCTOR STRUCTURE
#26REDISTRIBUTION LINES WITH PROTECTION LAYERS AND METHOD FORMING SAME
#27REDISTRIBUTION LAYERS AND METHODS OF FABRICATING THE SAME IN SEMICONDUCTOR DEVICES
#28POLYIMIDE LAYER DEPRESSIONS BETWEEN METAL PILLARS
#29PACKAGE COMPONENT WITH STEPPED PASSIVATION LAYER
#30PROFILE CONTROL FOR STRESS RELAXATION
#31Integrated circuit structure
#32SEMICONDUCTOR STRUCTURE
#33REDISTRIBUTION LAYER METALLIC STRUCTURE AND METHOD
#34SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
#35MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE THEREOF
#36Redistribution lines with protection layers and method forming same
#37Multi-Bump Connection to Interconnect Structure and Manufacturing Method Thereof
#38Shifting Contact Pad for Reducing Stress
#39Bump-on-Trace Design for Enlarge Bump-to-Trace Distance
#40SEMICONDUCTOR PACKAGE
#41Semiconductor structure and method of manufacturing same
#42Redistribution layers and methods of fabricating the same in semiconductor devices
#43REDISTRIBUTION SUBSTRATE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
#44Integrated circuit features with obtuse angles and method of forming same
#45SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#46DISPLAY DEVICE
#47Semiconductor redistribution structure with integrated test pad and method for preparing the same
#48Semiconductor devices including recognition marks
#49Semiconductor devices and methods of manufacturing
#50Semiconductor device having a dual material redistribution line
#51Package component with stepped passivation layer
#52Redistribution lines with protection layers and method forming same
#53Logic drive with brain-like elasticity and integrality based on standard commodity FPGA IC chips using non-volatile memory cells
#54Silicon photonic interposer with two metal redistribution layers
#55DISPLAY DEVICE
#56SEMICONDUCTOR DEVICE HAVING A REDISTRIBUTION LINE
#57Integrated circuit structure and fabrication method thereof
#58Barrier structures between external electrical connectors
#59Multi-bump connection to interconnect structure and manufacturing method thereof
#60Devices including coax-like electrical connections and methods for manufacturing thereof
#61Semiconductor package
#62Semiconductor device
#63Semiconductor devices and methods of manufacturing
#64Post passivation interconnect
#65Package component with stepped passivation layer
#66Redistribution lines with protection layers and method forming same
#67Integrated circuit packages having stress-relieving features
#68THROUGH-SUBSTRATE CONDUCTOR SUPPORT
#69Semiconductor package
#70Semiconductor device including redistribution layer and method for fabricating the same
#71Semiconductor device
#72Semiconductor device package and method for packaging the same
#73Redistribution layers and methods of fabricating the same in semiconductor devices
#74Distribution layer structure and manufacturing method thereof, and bond pad structure
#75Integrated circuit features with obtuse angles and method of forming same
#76Integrated circuit structures and methods of forming an opening in a material
#77Method of forming semiconductor device having a dual material redistribution line and semiconductor device
#78Logic drive with brain-like elasticity and integrality based on standard commodity FPGA IC chips using non-volatile memory cells
#79Fan-out interconnect structure and method for forming same
#80Forming bonding structures by using template layer as templates
#81Semiconductor device with shielding structure for cross-talk reduction
#82Semiconductor package having multi-level and multi-directional shape narrowing vias
#83Logic drive with brain-like elasticity and integrality based on standard commodity FPGA IC chips using non-volatile memory cells
#84Through-substrate via structures in semiconductor devices
#85Integrated circuit features with obtuse angles and method forming same
#86Semiconductor device having a redistribution line
#87Bump-on-trace design for enlarge bump-to-trace distance
#88Semiconductor package and method of manufacturing the same
#89Redistribution metal and under bump metal interconnect structures and method
#90Multiple band multiple mode transceiver front end flip-chip architecture and circuitry with integrated power amplifiers
#91Semiconductor package
#92Method of using a sacrificial conductive stack to prevent corrosion
#93Post passivation interconnect
#94Post-passivation interconnect structure and method of forming the same
#95Semiconductor structure and method for wafer scale chip package
#96Semiconductor package device and method of manufacturing the same
#97Micro-transfer-printable flip-chip structures and methods
#98Through-substrate conductor support
#99Integrated circuit structures and methods of forming an opening in a material
#100Dual-damascene zero-misalignment-via process for semiconductor packaging
#101Semiconductor device manufacturing method
#102Semiconductor device
#103Barrier structures between external electrical connectors
#104Reliable passivation for integrated circuits
#105Semiconductor package having singular wire bond on bonding pads
#106Semiconductor package device and method of manufacturing the same
#107Semiconductor device and semiconductor package including the same
#108Semiconductor device with shielding structure for cross-talk reduction
#109Logic drive with brain-like elasticity and integrality based on standard commodity FPGA IC chips using non-volatile memory cells
#110Dual-damascene zero-misalignment-via process for semiconductor packaging
#111Semiconductor logic device and system and method of embedded packaging of same
#112Package structures
#113Semiconductor package assembly
#114Redistribution metal and under bump metal interconnect structures and method
#115Micro-transfer-printable flip-chip structures and methods
#116Semiconductor chip including a plurality of pads
#117Semiconductor device
#118Semiconductor device and a corresponding method of manufacturing semiconductor devices
#119Semiconductor device and a corresponding method of manufacturing semiconductor devices
#120Electronic device including redistribution layer pad having a void
#121Fan-out structure and manufacture thereof
#122Post-passivation interconnect structure and method of forming the same
#123Fan-out semiconductor package
#124Fan-out semiconductor package
#125Semiconductor package device and method of manufacturing the same
#126Chip structure having redistribution layer
#127Method of forming semiconductor device having a dual material redistribution line
#128Package structure
#129Semiconductor device
#130Fan-out semiconductor package
#131Forming bonding structures by using template layer as templates
#132Fan-out semiconductor package
#133Semiconductor device manufacturing method
#134SEMICONDUCTOR DEVICE WITH COPPER MIGRATION STOPPING OF A REDISTRIBUTION LAYER
#135Redistribution layer structure and fabrication method therefor
#136Post passivation interconnect and fabrication method therefor
#137Method for manufacturing redistribution layer
#138Semiconductor device and manufacturing method thereof
#139Wafer level package and method
#140Fan-out semiconductor package
#141Semiconductor device
#142Semiconductor device
#143Conductive pad structure for hybrid bonding and methods of forming same
#144Fan-out semiconductor package
#145Fan-out semiconductor package
#146CHIP PACKAGE AND MANUFACTURING METHOD THEREOF
#147Fan-out semiconductor package
#148Fan-out semiconductor package
#149Semiconductor package assembly
#150Multiple band multiple mode transceiver front end flip-chip architecture and circuitry with integrated power amplifiers
#151Fan-out semiconductor package
#152Wafer-level chip-size package with redistribution layer
#153Methods and apparatus of packaging semiconductor devices
#154Barrier structures between external electrical connectors
#155SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
#156Reliable passivation for integrated circuits
#157METHOD FOR MANUFACTURING A PACKAGE-ON-PACKAGE ASSEMBLY
#158Method of forming metal pads with openings in integrated circuits including forming a polymer extending into a metal pad
#159Contact pad for semiconductor devices
#160Semiconductor device and semiconductor package including the same
#161Redistribution layer structure, semiconductor substrate structure, semiconductor package structure, chip structure, and method of manufacturing the same
#162Semiconductor structure and manufacturing method thereof
#163Interconnect structures for fine pitch assembly of semiconductor structures and related techniques
#164Semiconductor chip including a plurality of pads
#165Semiconductor device
#166Semiconductor chip, semiconductor package including the same, and method of fabricating the same
#167Method of fabricating chip package with laser
#168Method of packaging semiconductor devices
#169Semiconductor device and its manufacturing method
#170Packaging devices and methods of manufacture thereof
#171Method of forming a semiconductor device with bump stop structure
#172Semiconductor device and manufacturing method thereof
#173Semiconductor device and method of manufacturing the same
#174Multiple band multiple mode transceiver front end flip-chip architecture and circuitry with integrated power amplifiers
#175Packaging devices and methods of manufacture thereof
#176Conductive pad structure for hybrid bonding and methods of forming same
#177Fan-out interconnect structure and method for forming same
#178Method of forming redistribution layer
#179Packaging devices and methods of manufacture thereof
#180Integrated circuit die with corner IO pads
#181Image sensor packages and methods of fabricating the same
#182Chip module and method for forming the same
#183Chip package and method for forming the same
#184Bump-on-trace design for enlarge bump-to-trace distance
#185Method of forming metal pads with openings in integrated circuits including forming a polymer plug extending into a metal pad
#186Semiconductor structure with oval shaped conductor
#187Contact pad for semiconductor devices
#188Substrate structure and method of manufacturing the same
#189Semiconductor device and method of forming double-sided fan-out wafer level package
#190SEMICONDUCTOR DEVICE
#191Semiconductor device
#192Semiconductor device redistribution layer with narrow trace width relative to passivation layer opening
#1933D interconnect structure comprising through-silicon vias combined with fine pitch backside metal redistribution lines fabricated using a dual damascene type approach
#194Method for building up a fan-out RDL structure with fine pitch line-width and line-spacing
#195Semiconductor device
#196Chip package and method for forming the same
#197SEMICONDUCTOR DEVICE
#198Stacked chip package including substrate with recess adjoining side edge of substrate and method for forming the same
#199Chip package and method thereof
#200Methods and apparatus of packaging semiconductor devices
#201Packaging devices and methods of manufacture thereof
#202Copper post structure for wafer level chip scale package
#203Conductive pad structure for hybrid bonding and methods of forming same
#204Packaging devices and methods of manufacture thereof
#205ESD protection device
#206Chip package
#207Chip package and method for forming the same
#208Multiple band multiple mode transceiver front end flip-chip architecture and circuitry with integrated power amplifiers
#209Fan-out interconnect structure and method for forming same
#210Chip package and method for forming the same
#211Packaging devices and methods of manufacture thereof
#212Fabrication method of wiring structure for improving crown-like defect
#213Post-passivation interconnect structure and method of forming the same
#214Electrical connection for chip scale packaging
#215Semiconductor package with improved redistribution layer design and fabricating method thereof
#216Metal pads with openings in integrated circuits
#217Wire-based methodology of widening the pitch of semiconductor chip terminals
#218WSP DIE WITH OFFSET REDISTRIBUTION LAYER CAPTURE PAD
#219Electronic components assembly
#220Integrated circuit and method of manufacturing the same
#221Integrated circuit chip using top post-passivation technology and bottom structure technology
#222ESD protection device
#223Methods and apparatus of under bump metallization in packaging semiconductor devices
#224Semiconductor device and method
#225Composite layered chip package
#226Forming wafer-level chip scale package structures with reduced number of seed layers
#227Layered chip package and method of manufacturing same
#228Layered chip package and method of manufacturing same
#229Electrical connection for chip scale packaging
#230Semiconductor device having a trace comprises a beveled edge
#231Solder bump interconnect
#232Semiconductor device and method for manufacturing the same
#233DEVICE MOUNTING BOARD AND METHOD OF MANUFACTURING THE SAME, SEMICONDUCTOR MODULE, AND MOBILE DEVICE
#234Interconnection structure
#235Wiring structure for improving crown-like defect and fabrication method thereof
#236Electrical connector between die pad and z-interconnect for stacked die assemblies
#237Chip structure having redistribution layer
#238Crack arrest vias for IC devices
#239Manufacturing method of semiconductor device
#240Chip assembly having via interconnects joined by plating
#241Semiconductor device having metal posts non-overlapping with other devices and layout method of semiconductor device
#242Semiconductor device having pad structure with stress buffer layer
#243Semiconductor device and manufacturing method of semiconductor device
#244SEMICONDUCTOR DEVICE
#245Bump structure with underbump metallization structure and integrated redistribution layer
#246Semiconductor device and method of forming RDL wider than contact pad along first axis and narrower than contact pad along second axis
#247Semiconductor device having a multilayer structure
#248Integrated circuit system with stress redistribution layer and method of manufacture thereof
#249IC die including RDL capture pads with notch having bonding connectors or its UBM pad over the notch
#250Wafer level chip scale package without an encapsulated via
#251Solder bump interconnect
#252Semiconductor device and method for making the same
#253Thin-film capacitor having a connecting part of a lead conductor disposed within an opening in a protective layer
#254Electronic structures including conductive layers comprising copper and having a thickness of at least 0.5 micrometers
#255Under land routing
#256SEMICONDUCTOR CHIP PACKAGE AND METHOD FOR MANUFACTURING THEREOF AND STACK PACKAGE USING THE SAME
#257Semiconductor with Bottom-Side Wrap-Around Flange Contact
#258METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE
#259METHOD FOR MANUFACTURING SEMICONDUCTOR MODULES
#260Integrated circuit chip using top post-passivation technology and bottom structure technology
#261Semiconductor module having semiconductor device mounted on device mounting substrate
#262DEVICE MOUNTING BOARD AND METHOD OF MANUFACTURING THE BOARD, SEMICONDUCTOR MODULE AND METHOD OF MANUFACTURING THE MODULE
#263Semiconductor device and manufacturing method thereof
#264Inter connection structure including copper pad and pad barrier layer, semiconductor device and electronic apparatus including the same
#265Semiconductor device and method of fabricating semiconductor device
#266Methods of making compliant semiconductor chip packages
#267SEMICONDUCTOR MODULE AND SEMICONDUCTOR DEVICE
#268Semiconductor with bottom-side wrap-around flange contact
#269Wafer level edge stacking
#270Bump structure for a semiconductor device and method of manufacture
#271Semiconductor device and manufacturing method of the same
#272RE-DISTRIBUTION CONDUCTIVE LINE STRUCTURE AND THE METHOD OF FORMING THE SAME
#273Electrical connecting structure and bonding structure
#274Device mounting board, and semiconductor module and manufacturing method therefor
#275Method for manufacturing a wafer level package
#276Semiconductor chip with chip selection structure and stacked semiconductor package having the same
#277Methods for fabricating sub-resolution alignment marks on semiconductor structures
#278I/O pad structures for integrated circuit devices
#279Flip chip structure and method of manufacture
#280INTERCONNECT ASSEMBLIES AND METHODS
#281Solder bump interconnect for improved mechanical and thermo-mechanical performance
#282Semiconductor module manufacturing method, semiconductor module, and mobile device
#283BUMP STRUCTURE
#284Semiconductor device and method for manufacturing the same
#285Highly reliable low cost structure for wafer-level ball grid array packaging
#286Semiconductor device including redistribution line structure and method of fabricating the same
#287Thin-film capacitor
#288Wafer level chip scale package, method of manufacturing the same, and semiconductor chip module including the wafer level chip scale package
#289Semiconductor device, mounting structure, electro-optical apparatus, electronic system, and method for manufacturing electronic component
#290Mounting structure, electro-optical device, electronic apparatus, and method of producing the mounting structure
#291Methods of forming electronic structures including conductive shunt layers and related structures
#292Bump structure and method of manufacturing the same, and mounting structure for IC chip and circuit board
#293Wafer level chip scale packaging structure and method of fabricating the same
#294Method for fabricating low resistance, low inductance interconnections in high current semiconductor devices
#295Semiconductor device and method of manufacturing the same
#296Methods of forming electronic structures including conductive shunt layers and related structures
#297Substrate for solder joint
#298Bump structure for a semiconductor device and method of manufacture
#299Method of routing an electrical connection on a semiconductor device and structure therefor
#300Semiconductor device with strain relieving bump design